Electronic component handling apparatus, electronic component testing apparatus, and electronic component testing method

US10324127B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10324127-B2
Application numberUS-201715617266-A
CountryUS
Kind codeB2
Filing dateJun 8, 2017
Priority dateJun 8, 2017
Publication dateJun 18, 2019
Grant dateJun 18, 2019

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

An electronic component handling apparatus ( 10 ) is provided which can improve the operation rate. The electronic component handling apparatus ( 10 ) includes: a contact arm ( 300 ) having a holding part ( 380 ) configured to hold a DUT ( 10 A), the contact arm ( 300 ) being configured to press the DUT ( 10 A) against a socket ( 410 ); an alignment device ( 200 ) including a camera ( 221 ) and a operation unit ( 230 ), the camera ( 221 ) being configured to image the DUT ( 10 A) to acquire image information, the operation unit ( 230 ) being configured to adjust a position of the holding part ( 380 ) within a range of a maximum alignment amount (AL max ); and a control device ( 105 ) configured to control the contact arm ( 300 ) and the alignment device ( 200 ). When a predetermined condition is not satisfied, the control device ( 105 ) controls the contact arm ( 300 ) and the alignment device ( 200 ) so as to perform preliminary alignment work at least once. When the predetermined condition is satisfied, the control device ( 105 ) controls the contact arm ( 300 ) and the alignment device ( 200 ) so as to perform main alignment work.

First claim

Opening claim text (preview).

What is claimed is: 1. An electronic component handling apparatus configured to handle a device under test (DUT), the apparatus comprising: a contact arm having a holding part configured to hold the DUT, the contact arm being configured to press the DUT against a socket; an alignment device including an imaging part and a driving part, the imaging part being configured to image the DUT to acquire image information, and the driving part being configured to move the holding part within a maximum moveable amount so as to adjust a position of the holding part; and a control device configured to control the contact arm and the alignment device, wherein, the maximum movable amount is an invariable value, the driving part cannot move the holding part over the maximum movable amount, the control device calculates a correction amount for respectively positioning the holding part with respect to the socket on a basis of the image information, the control device determines whether the correction amount is larger than the maximum movable amount, when the correction amount is larger than the maximum movable amount, the control device controls the driving part to move the holding part by the maximum movable amount, and when the correction amount is not larger than the maximum movable amount, the control device controls the driving part to move the holding part by the correction amount. 2. The electronic component handling apparatus according to claim 1 , wherein when the correction amount is larger than the maximum movable amount, the control device controls the contact arm and the alignment device to perform a preliminary alignment work, when the correction amount is not larger than the maximum movable amount, the control device controls the contact arm and the alignment device to perform main alignment work for relatively positioning the DUT with respect to the socket, the preliminary alignment work includes: a first operation in which the holding part holds the DUT, a second operation in which the driving part moves the holding part by the maximum movable amount, and a third operation in which the holding part places the DUT, and the main alignment work includes: a fourth operation in which the holding part holds the DUT again, and a fifth operation in which the driving part moves the holding part by the correction amount, and the control device controls the contact arm to press the DUT against the socket after the main alignment work. 3. The electronic component handling apparatus according to claim 2 , wherein the socket is provided at a test head or at a tip of the holding part, at least the preliminary alignment work of the preliminary alignment work and main alignment work includes an operation in which the imaging part images the DUT, and the DUT imaged by the imaging part is in a state of being held by the holding part or in a state before being held by the holding part. 4. The electronic component handling apparatus according to claim 1 , wherein the contact arm has a base part, an adjustment unit configured to relatively move and/or rotate the holding part with respect to the base part, and a lock and free unit configured to restrain relative movement and/or rotation of the holding part with respect to the base part, and the driving part includes an operation unit configured to operate the adjustment unit. 5. An electronic component testing apparatus configured to test a DUT, comprising: the electronic component handling apparatus according to claim 1 ; a test head to which the socket is attached; and a tester to which the test head is electrically connected. 6. An electronic component testing method for relatively positioning a device under test (DUT) with respect to a socket using image information of the DUT and testing the DUT, the electronic component testing method being performed using an electronic component handling apparatus, the electronic component handling apparatus comprising: a contact arm having a holding part configured to hold the DUT, the contact arm being configured to press the DUT against a socket; and an alignment device including an imaging part and a driving part, the imaging part being configured to image the DUT to acquire image information, and the driving part being configured to move the holding part within a maximum movable amount so as to adjust a position of the holding part, wherein the maximum alignment amount is an invariable value, and the driving part cannot move the holding part over the maximum movable amount, the method comprises: calculating a correction amount for respectively positioning the holding part with respect to the socket on a basis of the image information, determining whether the correction amount is larger than the maximum movable amount, moving the holding part with the driving part by the maximum movable amount when the correction amount is larger than the maximum movable amount; and moving the holding part with the driving part by the correction amount when the correction is not larger than the maximum movable amount.

Assignees

Inventors

Classifications

  • related to sensing or controlling of force, position, temperature (G01R31/2874 takes precedence; sensing of force G01L; sensing of position G01B, G01D; sensing of temperature G01K; controlling in general G05) · CPC title

  • Sockets for IC's or transistors · CPC title

  • Handling, conveying or loading, e.g. belts, boats, vacuum fingers (G01R31/2867 takes precedence; handling semiconductor devices or wafers during manufacture or treatment H10P72/00) · CPC title

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US10324127B2 cover?
An electronic component handling apparatus ( 10 ) is provided which can improve the operation rate. The electronic component handling apparatus ( 10 ) includes: a contact arm ( 300 ) having a holding part ( 380 ) configured to hold a DUT ( 10 A), the contact arm ( 300 ) being configured to press the DUT ( 10 A) against a socket ( 410 ); an alignment device ( 200 ) including a camera ( 221 ) and…
Who is the assignee on this patent?
Advantest Corp
What technology area does this patent fall under?
Primary CPC classification G01R31/2891. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jun 18 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).