Magnetic-disk substrate, magnetic disk, and method for manufacturing magnetic-disk substrate

US10319403B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10319403-B2
Application numberUS-201615545969-A
CountryUS
Kind codeB2
Filing dateMar 31, 2016
Priority dateMar 31, 2015
Publication dateJun 11, 2019
Grant dateJun 11, 2019

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  1. Title

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  2. Abstract

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  5. First independent claim

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Abstract

Official abstract text for this publication.

A magnetic-disk substrate has a pair of main surfaces and arithmetic average roughnesses Ra of the main surfaces are each 0.11 nm or less. Also, in surface unevenness of the main surfaces, an average area of regions occupied by a plurality of protrusions having a height of 0.1 nm or more from an average plane of the surface unevenness is 25 nm2/protrusion or less. The arithmetic average roughness Ra and the surface unevenness are measured using an atomic force microscope with a probe having a probe tip provided with a carbon nanofiber rod-shaped member.

First claim

Opening claim text (preview).

The invention claimed is: 1. A magnetic-disk substrate, comprising: a pair of main surfaces, an arithmetic average roughness Ra of each of the main surfaces being 0.11 nm or less, and the arithmetic average roughness Ra being a value obtained through measurement using an atomic force microscope provided with a probe having a probe tip provided with a carbon nanofiber rod-shaped member. 2. The magnetic-disk substrate according to claim 1 , wherein an average area of regions occupied by a plurality of protrusions having a height of 0.1 nm or more from an average plane of surface unevenness is 20 nm 2 /protrusion or less. 3. The magnetic-disk substrate according to claim 1 , wherein a difference between an average area of regions occupied by a plurality of protrusions having a height of 0.1 nm or more from an average plane of surface unevenness and an average area of regions occupied by a plurality of protrusions having a height of 0.2 nm or more from the average plane of the surface unevenness is 13 nm 2 /protrusion or less. 4. The magnetic-disk substrate according to claim 1 , wherein the carbon nanofiber rod-shaped member provided at the probe tip has a Young's modulus or 100 GPa or less. 5. The magnetic-disk substrate according to claim 1 , wherein the carbon nanofiber rod-shaped member is electrically conductive, and one end of the carbon nanofiber rod-shaped member is connected to earth. 6. The magnetic-disk substrate according to claim 1 , wherein the arithmetic average roughness Ra or surface unevenness of the main surfaces is obtained based on information on a position of the probe that is obtained by changing the position of the probe in accordance with the surface unevenness of the main surfaces such that the probe oscillates at a constant amplitude. 7. The magnetic-disk substrate according to claim 6 , wherein in the measurement performed using the atomic force microscope, the probe is oscillated at a spring constant of 0.1 to 80 N/m and a frequency of 30 to 400 KHz. 8. The magnetic-disk substrate according to claim 1 , wherein the substrate is a magnetic-disk substrate for energy-assisted magnetic recording. 9. A magnetic disk, wherein at least a magnetic film is formed on a surface of the magnetic-disk substrate according to claim 1 . 10. A magnetic-disk substrate, comprising: a pair of main surfaces, in surface unevenness of the main surfaces, an average area of regions occupied by a plurality of protrusions having a height of 0.1 or more from an average plane of the surface unevenness being 25 nm 2 /protrusion or less, and the surface unevenness of the main surfaces being a value obtained through measurement using an atomic force microscope provided with a probe having a probe tip provided with a carbon nanofiber rod-shaped member. 11. The magnetic-disk substrate according to claim 10 , wherein the average area of the regions occupied by the plurality of protrusions having a height of 0.1 nm or more from the average plane of the surface unevenness is 20 nm 2 /protrusion or less. 12. The magnetic-disk substrate according to claim 10 , wherein a difference between the average area of the regions occupied by the plurality of protrusions having a height of 0.1 nm or more from the average plane of the surface unevenness and an average area of regions occupied by a plurality of protrusions having a height of 0.2 nm or more from the average plane of the surface unevenness is 13 nm 2 /protrusion or less. 13. The magnetic-disk substrate according to claim 10 , wherein the carbon nanofiber rod-shaped member provided at the probe tip has a Young's modulus of 100 GPa or less. 14. The magnetic-disk substrate according to claim 10 , wherein the carbon nanofiber rod-shaped member is electrically conductive, and one end of the carbon nanofiber rod-shaped member is connected to earth. 15. The magnetic-disk substrate according to claim 10 , wherein an arithmetic average roughness Ra of each of the main surfaces or the surface unevenness is obtained based on information on a position of the probe that is obtained by changing the position of the probe in accordance with the surface unevenness of the main surfaces such that the probe oscillates at a constant amplitude. 16. The magnetic-disk substrate according to claim 15 , wherein in the measurement performed using the atomic force microscope, the probe is oscillated at a spring constant of 0.1 to 80 N/m and a frequency of 30 to 400 KHz.

Assignees

Inventors

Classifications

  • Manufacture or treatment of nanostructures · CPC title

  • manufacturing base layers · CPC title

  • G11B5/82Primary

    Disk carriers · CPC title

  • Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic · CPC title

  • G11B5/84Primary

    Processes or apparatus specially adapted for manufacturing record carriers · CPC title

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What does patent US10319403B2 cover?
A magnetic-disk substrate has a pair of main surfaces and arithmetic average roughnesses Ra of the main surfaces are each 0.11 nm or less. Also, in surface unevenness of the main surfaces, an average area of regions occupied by a plurality of protrusions having a height of 0.1 nm or more from an average plane of the surface unevenness is 25 nm2/protrusion or less. The arithmetic average roughne…
Who is the assignee on this patent?
Hoya Corp
What technology area does this patent fall under?
Primary CPC classification G11B5/82. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jun 11 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 3 related publications on this page (citations in our corpus or others sharing the same primary CPC).