Apparatus and Methodology for Reshaping a Laser Beam
US-2024027781-A1 · Jan 25, 2024 · US
US10295822B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10295822-B2 |
| Application number | US-201415030063-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 17, 2014 |
| Priority date | Oct 18, 2013 |
| Publication date | May 21, 2019 |
| Grant date | May 21, 2019 |
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A method for producing a contrast-amplifying support comprising an absorbing substrate carrying at least one absorbing layer comprises a design step for the support and the following steps: i) choosing an illumination wavelength λ; ii) choosing a material constituting the substrate and exhibiting, at illumination wavelength λ, a complex refractive index N0=n0−jk0 with k0≥0.01; iii) choosing an ambient medium in contact with the layer on the side opposite to the substrate and exhibiting, at illumination wavelength λ, a complex refractive index N3=n3−jk3 with k3≥0; iv) determining a nominal complex refractive index N1=n1−jk1 and a nominal thickness e1 of the layer wherein it behaves in the guize of antireflection layer when illuminated under normal incidence at illumination wavelength λ; and v) choosing a material constituting the layer and exhibiting, at illumination wavelength λ, a complex refractive index whose real and imaginary parts coincide with the nominal complex refractive index.
Opening claim text (preview).
The invention claimed is: 1. A method for producing a contrast-amplifying support comprising an absorbing substrate carrying at least one absorbing layer, said method comprising a design step for said support and a step of hardware production of the support in accordance with said design step, wherein said design step comprises the following steps: i) choosing an illumination wavelength λ; ii) choosing a material constituting said substrate and exhibiting, at said illumination wavelength λ, complex refractive index N3=n3−jk3, where k3≥0.01; iii) choosing an ambient medium in contact with said layer on the side opposite to said substrate and exhibiting, at said illumination wavelength λ, a real refractive index n0; iv) determining a nominal complex refractive index N1=n1−jk1 and a nominal thickness e1 of said layer which are such that it behaves in the guise of antireflection layer when it is illuminated under normal incidence at said illumination wavelength λ; and v) choosing a material constituting said layer and exhibiting, at said illumination wavelength λ, a complex refractive index whose real and imaginary parts coincide with those of said nominal complex refractive index at least by a tolerance of less than or equal to 5%; in which, during said step iv), said nominal complex refractive index and said nominal thickness are chosen satisfying the following conditions: v 1 2 = 1 + κ 1 2 + n 0 n 3 κ 3 2 v 1 κ 1 - n 0 n 3 κ 3 ( n 0 n 3 - 1 ) ; a ) δ 1 = ( n 0 n 3 - 1 ) 2 v 1 κ 1 - n 0 n 3 κ 3 ; b ) κ 1 ≤ v 1 ; and c ) k 1 ≥ 0.15 where :
Optical design, e.g. procedures, algorithms, optimisation routines · CPC title
made of crystals, e.g. rock-salt, semi-conductors (G02B1/08 takes precedence) · CPC title
Light absorbing elements · CPC title
Optics, miscellaneous · CPC title
Mechanical parametric or variational design · CPC title
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