Thermal atomic layer etching processes

Patent metadata

Field	Value
Publication number	US-10273584-B2
Application number	US-201715835212-A
Country	US
Kind code	B2
Filing date	Dec 7, 2017
Priority date	Dec 9, 2016
Publication date	Apr 30, 2019
Grant date	Apr 30, 2019

Abstract

Thermal atomic layer etching processes are disclosed. In some embodiments, the methods comprise at least one etch cycle in which the substrate is alternately and sequentially exposed to a first vapor phase halide reactant and a second vapor halide reactant. In some embodiments, the first reactant may comprise an organic halide compound. During the thermal ALE cycle, the substrate is not contacted with a plasma reactant.

First claim

What is claimed is:

1. A method of etching a film on the surface of a substrate in a reaction chamber by chemical atomic layer etching, the method comprising one or more etching cycles, each cycle comprising:
exposing the substrate to a first vapor-phase halide reactant comprising a first halide ligand to form adsorbed species on the substrate surface, wherein the first vapor-phase halide reactant does not comprise hydrogen; and
subsequently exposing the substrate to a second vapor-phase halide reactant comprising a second halide ligand that converts the adsorbed species into volatile species such that at least some material is removed from the film, wherein the second vapor-phase halide reactant does not comprise hydrogen; and
wherein the substrate is not contacted with a plasma reactant during the etching cycle.

2. The method of claim 1 , wherein the film comprises W, TiN, TiO 2 , TaN, SiN, AlO 2 , Al 2 O 3 , ZrO 2 , WO 3 , SiOCN, SiOC, SiCN, AlN or HfO 2.

3. The method of claim 1 , wherein the first vapor-phase halide reactant comprise a metal halide.

4. The method of claim 3 , wherein the metal halide comprises a metal selected from Nb, Ta, Mo, Sn, V, Re, Te, W, and group 5 and 6 transition metals.

5. The method of claim 1 , wherein the first vapor-phase halide reactant does not comprise a metal.

6. The method of claim 1 , wherein the first vapor-phase halide reactant comprises an organic halide compound.

7. The method of claim 1 , wherein the first vapor-phase halide reactant comprises an alkyl halide, an acyl halide, a sulfonyl halide, a sulfenyl halide, a selenyl halide, or a boron halide comprising an organic ligand.

8. The method of claim 1 , wherein the first vapor-phase halide reactant comprises fluorosulfonic acid, trifluoromethanesulfonic acid, trifluoromethyl trifluoromethanesulfonate, sulfur tetrafluoride sulfur chloride pentafluoride or sulfur hexafluoride, or 1-chloro 2-(pentafluorosulfuranyloxy)ethane.

9. The method of claim 1 , wherein the first vapor-phase halide reactant comprises chlorosulfonyl isocyanate or N,N-dimethylsulfamoyl chloride.

10. The method of claim 1 , wherein the first vapor-phase halide reactant comprises boron, hydrogen, and a halide.

11. The method of claim 1 , wherein the first vapor-phase halide reactant comprises phosphorus, oxygen, and a halide.

12. The method of claim 1 , wherein the first vapor-phase halide reactant comprises antimony and a halide.

13. The method of claim 1 , wherein the first vapor-phase halide reactant comprises one or more —CF 3 groups.

14. The method of claim 1 , further comprising repeating the etching cycle two or more times sequentially.

15. The method of claim 1 , wherein the first and second halide ligands are Cl.

16. The method of claim 1 , wherein the second vapor-phase halide reactant does not comprise metal.

17. The method of claim 1 , wherein the second vapor-phase halide reactant is a carbon based halide.

18. The method of claim 17 , wherein the second vapor phase halide reactant comprises CCl 4 or CBr 4.

19. The method of claim 1 , wherein the temperature of the substrate during the etching cycle is 300° C. to 500° C.

20. A method of etching a film on the surface of a substrate in a reaction chamber by chemical atomic layer etching, the method comprising one or more etching cycles, each cycle comprising:
exposing the substrate to a first vapor-phase reactant such that the first vapor-phase reactant reacts with a molecule on the substrate surface to form reactant species on the substrate surface; and
subsequently exposing the substrate to a second vapor-phase reactant such that the reactant species are converted into volatile reaction products and a portion of the film is removed from the substrate surface, wherein the substrate is not contacted with a plasma reactant during the etching cycle, wherein the first vapor-phase reactant comprises CSe 2.

21. A method of etching a film on the surface of a substrate in a reaction chamber by chemical atomic layer etching, the method comprising one or more etching cycles, each cycle comprising:
exposing the substrate to a first vapor-phase reactant such that the first vapor-phase reactant reacts with a molecule on the substrate surface to form reactant species on the substrate surface; and
subsequently exposing the substrate to a second vapor-phase reactant such that the reactant species are converted into volatile reaction products and a portion of the film is removed from the substrate surface, wherein the substrate is not contacted with a plasma reactant during the etching cycle, wherein the first vapor-phase reactant comprises compounds with S═R═S structure in which R can be carbon or any hydrocarbon, such as C2-C8.

22. The method of claim 21 , wherein the first vapor-phase reactant comprises CS 2.

23. A method of etching a film on the surface of a substrate in a reaction chamber by chemical atomic layer etching, the method comprising one or more etching cycles, each cycle comprising:
exposing the substrate to a first vapor-phase reactant such that the first vapor-phase reactant reacts with a molecule on the substrate surface to form reactant species on the substrate surface; and
subsequently exposing the substrate to a second vapor-phase reactant such that the reactant species are converted into volatile reaction products and a portion of the film is removed from the substrate surface, wherein the substrate is not contacted with a plasma reactant during the etching cycle, wherein the second vapor-phase reactant comprises triethylaluminum (TEA) or trimethylaluminum (TMA).

24. A method of etching a film on a substrate in a reaction chamber comprising two or more etching cycles, each cycle comprising:
exposing the substrate to a first vapor-phase halide reactant that does not comprise hydrogen; and
subsequently exposing the substrate to a second, different vapor-phase halide reactant that does not comprise hydrogen; and
exposing the substrate to a third vapor-phase reactant that is different from the first and second vapor-phase reactants,
wherein the substrate is not contacted with a plasma reactant during the etching cycle.

25. The method of claim 24 , wherein the additional vapor phase reactant comprises one or more ofSO 3 , H 2 S, NH 3 , H2O, HCOOH, H2O2, and hydrazine.

26. A method for etching a thin film on a substrate surface comprising:
exposing the substrate surface to a first vapor-phase halide reactant comprising a first halide ligand to form first reactant species on the substrate surface, wherein the first vapor-phase halide reactant does not comprise hydrogen; and
subsequently exposing the substrate to a second vapor-phase halide reactant comprising a second halide ligand such that the second vapor-phase halide reactant converts the first reactant species to vapor phase reaction products, wherein the second vapor-phase halide reactant does not comprise hydrogen, and,
wherein the formation of the first reactant species or the conversion of the second vapor-phase halide reactant to vapor phase reaction products are not self-limiting.

27. The method of claim 26 , wherein the substrate is not contacted with a plasma reactant during the etching cycle.

28. The method of claim 26 , wherein the formation of the first reactant species and the conversion of the second vapor-phase halide reactant to vapor phas

Assignees

• Asm Ip Holding Bv

Inventors

• Blomberg Tom E
• Sharma Varun
• Haukka Suvi
• Tuominen Marko
• Zhu chiyu

Classifications

• H10P50/287

  by chemical means · CPC title

• H10P50/285

  of materials not containing Si, e.g. PZT or Al2O3 · CPC title

• H10P50/283

  by chemical means · CPC title

• H10P50/266

  by vapour etching only · CPC title

• H10P50/242 Primary

  of Group IV materials · CPC title