Resist composition and patterning process
US-9709890-B2 · Jul 18, 2017 · US
US10241403B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10241403-B2 |
| Application number | US-201615546132-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 25, 2016 |
| Priority date | Mar 26, 2015 |
| Publication date | Mar 26, 2019 |
| Grant date | Mar 26, 2019 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
A negative photosensitive composition including an epoxy group-containing resin; and a cationic polymerization initiator containing one or more types of the following cationic polymerization initiators: a compound represented by formula (b0-1) and a compound represented by formula (b0-2), and a cationic polymerization initiator which generates an acid having a pKa of −3 or more. In the formulae, R b01 to R b04 are each independently a fluorine atom or an aryl group which may have a substituent, R b05 is a fluorine atom or a fluorinated alkyl group which may have a substituent, a plurality of R b05 's may be the same as or different from each other, q is an integer of 1 or more, and Q q+ 's are each independently a q-valent organic cation.
Opening claim text (preview).
The invention claimed is: 1. A negative photosensitive composition comprising: an epoxy group-containing resin (A); and a cationic polymerization initiator (B) which comprises at least one cationic polymerization initiator (B0) selected from the group consisting of compounds represented by general formula (b0-1) and compounds represented by general formula (b0-2), and a cationic polymerization initiator (B1) which generates an acid having a pKa of −3 or more, wherein a ratio between the cationic polymerization initiator (B0) and the cationic polymerization initiator (B1) is 5 to 200 as a mass ratio represented by component (B0)/component (B1), and the cationic polymerization initiator (B1) comprises at least one compound selected from the group consisting of compounds represented by general formula (b1-1′) and compounds represented by general formula (b1-2′): wherein R b01 to R b04 are each independently a fluorine atom or an aryl group which may have a substituent, R b05 is a fluorine atom or a fluorinated alkyl group which may have a substituent, plural R b05 's may be the same as or different from each other, q is an integer of 1 or more, and Q q+ 's are each independently a q-valent organic cation; and wherein R b11 and R b12 each are a cyclic group which may have a substituent other than a halogen atom, a chain alkyl group which may have a substituent other than a halogen atom, or a chain alkenyl group which may have a substituent other than a halogen atom, R 201 to R 203 each independently represent an aryl group which may have a substituent, a heteroaryl group, an alkyl group, or an alkenyl group, and R 201 to R 203 , may be bonded to each other to form a ring with the sulfur atom in the formula, provided that at least one of R 201 , R 202 , and R 203 is an organic group having 16 or more carbon atoms. 2. The negative photosensitive composition according to claim 1 , wherein the cation moiety of the cationic polymerization initiator (B1) is a cation represented by formula (ca-1-25), (ca-1-26), (ca-1-28), (ca-1-29), (ca-1-30), (ca-1-31), (ca-1-32), (ca-1-33), (ca-1-34), (ca-1-35), (ca-1-38), or (ca-1-46): wherein R′ 211 is an alkyl group and R hal is a hydrogen atom or a halogen atom. 3. The negative photosensitive composition according to claim 1 , wherein the epoxy group-containing resin (A) comprises at least one resin selected from the group consisting of a novolac epoxy resin, a bisphenol A epoxy resin, and a bisphenol F epoxy resin. 4. A pattern formation method comprising: forming a film on a support using the negative photosensitive composition according to claim 1 ; selectively exposing the film; and developing the exposed film to form a negative pattern.
using epoxidised novolak resin · CPC title
Macromolecular compounds which are rendered insoluble or differentially wettable (G03F7/075 takes precedence; macromolecular azides G03F7/012; macromolecular diazonium compounds G03F7/021) · CPC title
with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors · CPC title
Photosensitive materials (G03F7/12, G03F7/14 take precedence) · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.