Manufacturing method of monocrystalline silicon and monocrystalline silicon

US10233564B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10233564-B2
Application numberUS-201715722051-A
CountryUS
Kind codeB2
Filing dateOct 2, 2017
Priority dateOct 3, 2016
Publication dateMar 19, 2019
Grant dateMar 19, 2019

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A smonocrystalline silicon include a straight body formed without generating a remelt growth area of 200 μm or more in a height in a growth direction. Growth striations, which are formed radially across the straight body, include a growth striation with an outer end interrupted by another growth striation not to reach a peripheral portion of the straight body. The remelt growth area has the growth striation with the interrupted outer end.

First claim

Opening claim text (preview).

What is claimed is: 1. A manufacturing method of a monocrystalline silicon according to a Czochralski process with use of a monocrystal pull-up apparatus, the apparatus comprising: a chamber; a crucible located in the chamber; a heater configured to heat the crucible to produce a dopant-added melt comprising a silicon melt and a dopant added to the silicon melt; and a pull-up unit configured to pull up a seed crystal after bringing the seed crystal into contact with the dopant-added melt, the method comprising forming a straight body of the monocrystalline silicon without generating a remelt growth area of 200 μm or more in a height in a growth direction, the straight body having growth striations formed radially across the straight body, the growth striations comprising a growth striation with an outer end interrupted by another growth striation not to reach a peripheral portion of the straight body, the remelt growth area comprising the growth striation with the interrupted outer end. 2. A manufacturing method of a monocrystalline silicon according to a Czochralski process with use of a monocrystal pull-up apparatus, the apparatus comprising: a chamber; a crucible located in the chamber; a heater configured to heat the crucible to produce a dopant-added melt comprising a silicon melt and red phosphorus or arsenic added as a dopant to the silicon melt; and a pull-up unit configured to pull up a seed crystal after bringing the seed crystal into contact with the dopant-added melt, the method comprising forming a straight body, a target diameter of which is 200 mm or more, of the monocrystalline silicon, wherein: the crucible is rotated at 9 rpm or more at a start of the forming of the straight body, and a rotation speed of the crucible is slowed at a predetermined timing after the start of the forming of the straight body. 3. The manufacturing method according to claim 2 , wherein arsenic is used as the dopant to form the straight body with the target diameter of 300 mm and an electrical resistivity ranging from 1.6 mΩ·cm to 2.8 mΩ·cm. 4. The manufacturing method according to claim 2 , wherein red phosphorus is used as the dopant to form the straight body with the target diameter of 300 mm and an electrical resistivity ranging from 0.7 mΩ·cm to 1.5 mΩ·cm. 5. The manufacturing method according to claim 2 , wherein the monocrystal pull-up apparatus further comprises an electromagnetic coil configured to apply a magnetic field to the dopant-added melt, and the straight body is formed while the magnetic field is applied to the dopant-added melt. 6. A monocrystalline silicon comprising a straight body that comprises arsenic as a dopant, wherein growth striations are formed radially across the straight body, the growth striations comprising a growth striation with an outer end interrupted by another growth striation not to reach a peripheral portion of the straight body, no remelt growth area, which comprises the growth striation with the interrupted outer end, with a height of 200 μm or more in a growth direction exists, a target diameter of the straight body is 200 mm, and an electrical resistivity of the straight body ranges from 1.4 mΩ·cm to 2.4 mΩ·cm. 7. A monocrystalline silicon comprising a straight body that comprises arsenic as a dopant, wherein growth striations are formed radially across the straight body, the growth striations comprising a growth striation with an outer end interrupted by another growth striation not to reach a peripheral portion of the straight body, no remelt growth area, which comprises the growth striation with the interrupted outer end, with a height of 200 Ωm or more in a growth direction exists, a target diameter of the straight body is 300 mm, and an electrical resistivity of the straight body ranges from 1.6 mΩ·cm to 2.8 mΩ·cm. 8. A monocrystalline silicon comprising a straight body that comprises red phosphorus as a dopant, wherein growth striations are formed radially across the straight body, the growth striations comprising a growth striation with an outer end interrupted by another growth striation not to reach a peripheral portion of the straight body, no remelt growth area, which comprises the growth striation with the interrupted outer end, with a height of 200 μm or more in a growth direction exists, a target diameter of the straight body is 200 mm, and an electrical resistivity of the straight body ranges from 0.6 mΩ·cm to 1.2 mΩ·cm. 9. A monocrystalline silicon comprising a straight body that comprises red phosphorus as a dopant, wherein growth striations are formed radially across the straight body, the growth striations comprising a growth striation with an outer end interrupted by another growth striation not to reach a peripheral portion of the straight body, no remelt growth area, which comprises the growth striation with the interrupted outer end, with a height of 200 μm or more in a growth direction exists, a target diameter of the straight body is 300 mm, and an electrical resistivity of the straight body ranges from 0.7 mΩ·cm to 1.5 mΩ·cm.

Assignees

Inventors

Classifications

  • C30B15/22Primary

    Stabilisation or shape controlling of the molten zone near the pulled crystal; Controlling the section of the crystal · CPC title

  • Mechanisms for rotating or moving either the melt or the crystal (flotation methods C30B15/28) · CPC title

  • Silicon · CPC title

  • adding doping materials, e.g. for n-p-junction · CPC title

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What does patent US10233564B2 cover?
A smonocrystalline silicon include a straight body formed without generating a remelt growth area of 200 μm or more in a height in a growth direction. Growth striations, which are formed radially across the straight body, include a growth striation with an outer end interrupted by another growth striation not to reach a peripheral portion of the straight body. The remelt growth area has the gro…
Who is the assignee on this patent?
Sumco Corp
What technology area does this patent fall under?
Primary CPC classification C30B15/22. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Tue Mar 19 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 3 related publications on this page (citations in our corpus or others sharing the same primary CPC).