Integrated measuring system for the spectral measuring technique

Patent metadata

Field	Value
Publication number	US-10217890-B2
Application number	US-201515311746-A
Country	US
Kind code	B2
Filing date	May 15, 2015
Priority date	May 16, 2014
Publication date	Feb 26, 2019
Grant date	Feb 26, 2019

Abstract

A measuring system comprises a substrate (IO), which has a quantum dot layer, which is arranged on the substrate and which comprises an emission segment having a first plurality of quantum dots, which first plurality has an average first energy gap, wherein the first plurality can emit radiation corresponding to the average first energy gap, wherein the quantum dot layer comprises at least one absorption segment having a laterally located second plurality of quantum dots and the second plurality has an average second energy gap that is less than the average first energy gap so that radiation emitted by the emission segment can be absorbed by the at least one absorption segment.

First claim

The invention claimed is:

1. A measuring system, comprising:
a substrate with a quantum dot layer which is arranged on the substrate and which comprises an emission segment with a first multitude of quantum dots, and the first multitude has an average first energy gap, wherein the first multitude is configured to emit a radiation corresponding to the average first energy gap, wherein
the quantum dot layer comprises at least one separate and distinct absorption segment with a second multitude of quantum dots, the second multitude of quantum dots of the absorption segment laterally displaced from the first multitude of quantum dots of the emission segment within the same plane, in a plan view looking toward the substrate from above, and the second multitude has an average second energy gap which is smaller than the average first energy gap, so that radiation emitted by the emission segment toward a separate external object via a first side with respect to the substrate, after interaction with the external object, able to be received via the first side and absorbed by the laterally displaced absorption segment.

2. The measuring system according to claim 1 , wherein an optically isolating layer is present between the emission segment and the absorption segment, so that radiation which is emitted by the emission segment cannot be emitted directly into the absorption segment.

3. The measuring system according to claim 1 , wherein the emission segment and the absorption segment are spatially separated from one another.

4. The measuring system according to claim 1 , wherein the quantum dot layer comprises a matrix of organic or inorganic, conducting or semiconducting material, into which the quantum dots are embedded.

5. The measuring system according to claim 1 , wherein at least one charge transport layer is present, and the quantum dot layer is integrated into the charge transport layer.

6. The measuring system according to claim 1 , wherein the quantum dot layer is arranged between two charge transport layers.

7. The measuring system according to claim 1 , wherein a hole injection layer and/or a hole blocking layer is present.

8. The measuring system according to claim 1 , wherein a cathode and an anode are present, and at least one of the cathode and/or anode is structured such that the emission segment and the absorption segment are electrically controllable separately from one another.

9. The measuring system according to claim 1 , wherein the quantum dots of the emission segment and of the absorption segment are constructed of an equal material or an equal material composition, and the emission segment has a size distribution of quantum dots which is different to the absorption segment.

10. The measuring system according to claim 1 , wherein the quantum dots of the emission segment are constructed of a first material and the quantum dots of the absorption segment are constructed of a second material.

11. The measuring system according to claim 1 , wherein the quantum dot layer comprises at least one further emission segment with an average third energy gap, and the average third energy gap is larger than the average second energy gap of the absorption segment, so that radiation emitted by the at least one further emission segment is able to be absorbed by the absorption segment.

12. The measuring system according to claim 11 , wherein the average first energy gap is different to the average third energy gap.

13. The measuring system according to claim 1 , wherein the quantum dot layer comprises a further absorption segment with an average fourth energy gap, and the average fourth energy gap is smaller than or equal to the average second energy gap.

14. The measuring system according to claim 1 , wherein the substrate and/or an anode and/or a cathode is optically transparent in the region of the emitted radiation.

15. The measuring system according to claim 1 , wherein the substrate is flexible and/or foldable.

16. The measuring system according to claim 1 , comprising an emission segment anode located between the emission segment and the substrate.

17. The measuring system according to claim 1 , comprising an absorption segment anode located between the absorption segment and the substrate.

18. The measuring system according to claim 1 , comprising an emission segment anode that is electrically isolated from an absorption segment anode.

19. The measuring system according to claim 1 , comprising an optically isolating region extending through multiple layers of stack structure to the substrate, the optically isolating region located between an emissions segment and an absorption segment.

20. The measuring system according to claim 1 , comprising an optically isolating region laterally surrounding at least one of an emissions segment or an absorption segment.

Assignees

• Fraunhofer Ges Forschung

Inventors

• Gessner Thomas
• Otto Thomas
• Martin Jörg
• Weiss Alexander

Classifications

• Y02E10/549

  Organic PV cells · CPC title

• H01L27/3227

  Electricity · mapped topic

• H01L31/16

  Electricity · mapped topic

• H01L31/035218

  Electricity · mapped topic

• H01L31/173 Primary

  Electricity · mapped topic