Clamp-type probe device

Patent metadata

Field	Value
Publication number	US-10215812-B2
Application number	US-201715604602-A
Country	US
Kind code	B2
Filing date	May 24, 2017
Priority date	Jul 11, 2016
Publication date	Feb 26, 2019
Grant date	Feb 26, 2019

Abstract

A clamp-type probe device comprises a first pressed member, a second pressed member and a probe head. The first pressed member comprises a first clamping portion and a first mounted portion connected to each other, and has a first and a second assembly holes. The second pressed member comprises a second clamping portion and a second mounted portion connected to each other. The second and the first mounted portions are connected to each other. The second and the first clamping portions are separated from each other. The probe head comprises a plurality of contacting members. Each contacting member comprises two bending portions. Two ends of each contacting member are respectively disposed through the first and the second assembly holes. The two bending portions are respectively pressed against an inner side surface of the first assembly hole and an inner side surface of the second assembly hole.

First claim

What is claimed is:

1. A clamp-type probe device, comprising:
a first pressed member comprising a first clamping portion and a first mounted portion connected to each other, and the first pressed member having a first assembly hole and a second assembly hole;
a second pressed member comprising a second clamping portion and a second mounted portion connected to each other, the second mounted portion and the first mounted portion connected to each other, and the second clamping portion and the first clamping portion separated from each other; and
a probe head comprising a plurality of contacting members, each of the plurality of contacting members comprising two bending portions connected to each other, two ends of each of the plurality of contacting members, which are opposite to each other, respectively disposed through the first assembly hole and the second assembly hole, and the two bending portions of each of the plurality of contacting members respectively pressed against an inner side surface of the first assembly hole and an inner side surface of the second assembly hole.

2. The clamp-type probe device according to claim 1 , further comprising:
a base;
a first pushing member movably disposed on the base, and the first pushing member having a first edge; and
a second pushing member movably disposed on the base, and the second pushing member having a second edge;
wherein, the first pushing member and the second pushing member are movable relative to each other, the first pushing member is able to push the first pressed member with the first edge, and the second pushing member is able to push the second pressed member with the second edge; when the first pressed member and the second pressed member are respectively pushed by the first pushing member and the second pushing member, the probe head and the second clamping portion are moved close to each other.

3. The clamp-type probe device according to claim 2 , wherein the base comprises a carrier and an electrically insulating member, the electrically insulating member is fixed to the carrier, and the first pressed member and the second pressed member are fixed to the carrier through the electrically insulating member.

4. The clamp-type probe device according to claim 2 , wherein the first pushing member is movable in a first direction to push the first pressed member, and the second pushing member is movable in a second direction, which is opposite from the first direction, to push the second pressed member.

5. The clamp-type probe device according to claim 2 , wherein the first pushing member has a first through hole, the second pushing member has a second through hole, the first edge is located in the first through hole, the second edge is located in the second through hole, and the first pressed member and the second pressed member are disposed through the first through hole and the second through hole.

6. The clamp-type probe device according to claim 2 , further comprising a power source disposed on the base, wherein the first pushing member and the second pushing member are connected to the power source, and the power source is able to move the first pushing member and the second pushing member.

7. The clamp-type probe device according to claim 2 , further comprising two guiding grooves disposed on the base, and the first pushing member and the second pushing member respectively disposed in the two guiding grooves.

8. The clamp-type probe device according to claim 1 , wherein each of the first assembly hole and the second assembly hole has a plurality of engagement recesses located on the inner side surface thereof, and the plurality of contacting members are partially disposed in the plurality of engagement recesses, respectively.

9. The clamp-type probe device according to claim 1 , further comprising:
a base; and
a pushing member movably disposed on the base, the pushing member being movable to push at least one of the first pressed member and the second pressed member, so as to move the probe head and the second clamping portion close to each other.

10. The clamp-type probe device according to claim 9 , wherein the pushing member has a through hole, the first pressed member and the second pressed member are disposed through the through hole; when the pushing member is moved, two sides of the through hole, which are opposite to each other, respectively push the first pressed member and the second pressed member.

Assignees

• Chroma Ate Inc

Inventors

• Chen peng-fei
• Liu Mao-Sheng

Classifications

• G01R1/06788

  Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments (end pieces terminating in a probe H01R11/18) · CPC title

• G01R1/02 Primary

  General constructional details · CPC title

• G01R31/3644 Primary

  Constructional arrangements · CPC title

• G01R1/067

  Measuring probes · CPC title

• G01R31/36

  Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC] · CPC title