Method for defect indication detection

US10203290B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10203290-B2
Application numberUS-201415100567-A
CountryUS
Kind codeB2
Filing dateDec 1, 2014
Priority dateDec 12, 2013
Publication dateFeb 12, 2019
Grant dateFeb 12, 2019

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Abstract

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Methods, apparatus and computer-readable media for detecting potential defects in a part are disclosed. A potential defect may be automatically detected in a part, and may be reported to an operator in various ways so that the operator may review the defect and take appropriate action.

First claim

Opening claim text (preview).

The invention claimed is: 1. A volumetric computed tomography (VCT)-based method for providing notification of a potential defect in a composite part, comprising: obtaining ( 102 ) VCT scan data representing a three-dimensional (3D) volume of the composite part; normalizing ( 220 ) the 3D volume against a generated background of the composite part that includes beam hardening and/or scattering artifacts; detecting ( 222 ) an indication of the potential defect in the normalized 3D volume; and outputting ( 112 ) information about the indication. 2. The VCT-based method of claim 1 , wherein the outputting comprises rendering, on a display ( 806 ), a 3D image of the composite part that includes the indication. 3. The VCT-based method of claim 1 , further comprising determining ( 224 ) a boundary of the detected indication based at least in part on a computer-aided design (CAD) model, wherein the information about the indication includes information about the boundary. 4. The VCT-based method of claim 3 , further comprising: identifying ( 222 ) a seed voxel of the indication; and performing ( 620 , 720 ) region growing around the seed voxel. 5. The VCT-based method of claim 4 , wherein the CAD model is a ply model ( 400 ) of the composite part, and growth of the region around the seed voxel is constrained by the ply model. 6. The VCT-based method of claim 1 , further comprising denoising ( 610 ) the normalized 3D volume using an adaptive bilateral filter. 7. The VCT-based method of claim 1 , further comprising denoising ( 606 ) the normalized 3D volume using a non-local means filter. 8. The VCT-based method of claim 1 , further comprising: identifying ( 224 ) a signal area of the indication; and identifying ( 220 ) a background of the indication based on a computer-aided design (CAD) model. 9. The VCT-based method of claim 8 , further comprising calculating ( 226 ) a signal strength of the indication based on the signal area and the background of the indication. 10. The VCT-based method of claim 9 , wherein the normalizing includes generating ( 602 ) a part mask of the composite part. 11. The VCT-based method of claim 10 , further comprising subtracting ( 220 ) the generated background of the composite part from the 3D volume of the composite part. 12. The VCT-based method of claim 1 , wherein the detecting comprises calculating ( 222 ) global and local porosities of the 3D volume.

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Classifications

  • Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light (G01N3/00 - G01N19/00 take precedence) · CPC title

  • using an image reference approach · CPC title

  • Industrial image inspection · CPC title

  • Image analysis · CPC title

  • using tomography, e.g. computed tomography [CT] · CPC title

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What does patent US10203290B2 cover?
Methods, apparatus and computer-readable media for detecting potential defects in a part are disclosed. A potential defect may be automatically detected in a part, and may be reported to an operator in various ways so that the operator may review the defect and take appropriate action.
Who is the assignee on this patent?
Gen Electric
What technology area does this patent fall under?
Primary CPC classification G01N23/18. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Feb 12 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).