Underlayer composition and method of manufacturing a semiconductor device
US-2024369932-A1 · Nov 7, 2024 · US
US10197913B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10197913-B2 |
| Application number | US-201515516116-A |
| Country | US |
| Kind code | B2 |
| Filing date | Sep 29, 2015 |
| Priority date | Oct 1, 2014 |
| Publication date | Feb 5, 2019 |
| Grant date | Feb 5, 2019 |
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Provided is a photosensitive resin composition that contains (A) a photobase generator and (B) an alkali-soluble epoxy compound, wherein the photobase generator (A) contains a compound represented by formula (2-1): and the alkali-soluble epoxy compound (B) is an epoxy compound obtained by reacting (c) a polybasic acid anhydride with a product of a reaction between (a) an epoxy compound having two or more epoxy groups in the molecule and (b) a compound having one or more hydroxyl groups and one carboxyl group in the molecule.
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The invention claimed is: 1. A photosensitive resin composition comprising: (A) a photobase generator; and (B) an alkali-soluble epoxy compound, wherein the photobase generator (A) comprises a compound represented by formula (2-1) below: wherein, in formula (2-1), n represents an integer of 1 to 2; R 1 represents at least one substituent selected from the group consisting of an alkyl group having 1 to 18 carbon atoms, an alkenyl group having 2 to 18 carbon atoms, an alkynyl group having 2 to 18 carbon atoms, an aryl group having 6 to 12 carbon atoms, an acyl group having 1to 18 carbon atoms, an aroyl group having 7 to 18 carbon atoms, a nitro group, a cyano group, an alkoxy group having 1 to 18 carbon atoms, an alkylthio group having 1 to 18 carbon atoms, and a halogen atom; R 2 represents a hydrogen atom, an alkyl group having 1 to 18 carbon atoms, an alkynyl group having 2 to 18 carbon atoms, an aryl group having 6 to 12 carbon atoms, an acyl group having 1 to 18 carbon atoms, an aroyl group having 7 to 18 carbon atoms, a nitro group, a cyano group, an alkoxy group having 1 to 18 carbon atoms, an alkylthio group having 1 to 18 carbon atoms, a hydroxyl group, or a halogen atom; and X is a group represented by formula (3-1) below: in which R 3 and R 4 each independently represent a hydrogen atom, an alkyl group having 1 to 12 carbon atoms, a cycloalkyl group having 5 to 10 carbon atoms, an aryl group having 6 to 14carbon atoms, or an arylalkyl group having 7 to 15 carbon atoms, and the alkali-soluble epoxy compound (B) is an epoxy compound obtained by allowing (c) a polybasic acid anhydride to react with a reaction product of (a) an epoxy compound having at least two epoxy groups in one molecule and (b) a compound having at least one hydroxyl group and one carboxyl group in one molecule. 2. The photosensitive resin composition according to claim 1 , wherein the alkali-soluble epoxy compound (B) comprises an epoxy compound represented by formula (5-1): wherein, in formula (5-1), r represents a real number of 1 or more, s represents a real number of 0 or more, provided that the sum of r and s is 30 or less, and D1 and D2 each independently represent any one of divalent bonding groups represented by formulas (6-1) to (6-10) below: 3. The photosensitive resin composition according to claim 1 , further comprising a compound having at least one urethane bond as (C) a base proliferator. 4. The photosensitive resin composition according to claim 3 , wherein the compound having at least one urethane bond is a compound having a base proliferating group represented by formula (7-1) below: 5. A cured product of the photosensitive resin composition according claim 1 . 6. A method for forming a pattern, comprising: applying the photosensitive resin composition according to claim 1 onto a support; drying a photosensitive resin composition layer obtained by the application; exposing the resin composition layer to light in a predetermined pattern after the drying; baking the resin composition layer after the exposure; developing the resin composition layer; and heat-treating the obtained resin pattern to obtain a cured resin pattern. 7. A photosensitive resin composition comprising: (A) a photobase generator; and (B) an alkali-soluble epoxy compound, wherein the photobase generator (A) comprises a compound represented by formula (4-1) below: wherein, R 1 represents at least one substituent selected from the group consisting of an alkyl group having 1 to 18 carbon atoms, an alkenyl group having 2 to 18 carbon atoms, an alkynyl group having 2 to 18 carbon atoms, an aryl group having 6 to 12 carbon atoms, an acyl group having 1 to 18 carbon atoms, an aroyl group having 7 to 18 carbon atoms, a nitro group, a cyano group, an alkoxy group having 1 to 18 carbon atoms, an alkylthio group having 1 to 18 carbon atoms, and a halogen atom, R 2 represents a hydrogen atom, an alkyl group having 1 to 18 carbon atoms, an alkynyl group having 2 to 18 carbon atoms, an aryl group having 6 to 12 carbon atoms, an acyl group having 1 to 18 carbon atoms, an aroyl group having 7 to 18 carbon atoms, a nitro group, a cyano group, an alkoxy group having 1 to 18 carbon atoms, an alkylthio group having 1 to 18 carbon atoms, a hydroxyl group, or a halogen atom, n independently represents an integer of 0 to 4, and p represents an integer of 1 to 6.
Liquid compositions therefor, e.g. developers · CPC title
Coating on a rotating support, e.g. using a whirler or a spinner · CPC title
Macromolecular compounds which are rendered insoluble or differentially wettable (G03F7/075 takes precedence; macromolecular azides G03F7/012; macromolecular diazonium compounds G03F7/021) · CPC title
characterised by the use of a particular light source, e.g. fluorescent lamps or deep UV light · CPC title
with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors · CPC title
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