Micro-electro-mechanical device with a movable structure, in particular micromirror, and manufacturing process thereof

Patent metadata

Field	Value
Publication number	US-10197794-B2
Application number	US-201715603614-A
Country	US
Kind code	B2
Filing date	May 24, 2017
Priority date	Dec 28, 2016
Publication date	Feb 5, 2019
Grant date	Feb 5, 2019

Abstract

A micro-electro-mechanical (MEMS) device is formed in a first wafer overlying and bonded to a second wafer. The first wafer includes a fixed part, a movable part, and elastic elements that elastically couple the movable part and the fixed part. The movable part further carries actuation elements configured to control a relative movement, such as a rotation, of the movable part with respect to the fixed part. The second wafer is bonded to the first wafer through projections extending from the first wafer. The projections may, for example, be formed by selectively removing part of a semiconductor layer. A composite wafer formed by the first and second wafers is cut to form many MEMS devices.

First claim

The invention claimed is:

1. A micro-electro-mechanical device, comprising:
a first monolithic body including semiconductor material; and
a second monolithic body including semiconductor material, overlying the first monolithic body;
wherein the first monolithic body comprises a fixed part, a movable part, and elastic elements elastically coupling the movable part and the fixed part, said movable part carrying actuation elements configured to control a relative movement of the movable part with respect to the fixed part; and
wherein the first monolithic body includes projections that extend from the movable part and are bonded to the second monolithic body.

2. The micro-electro-mechanical device according to claim 1 , wherein the movable part and the second monolithic body form an orientable structure rotatable around a rotation axis.

3. The micro-electro-mechanical device according to claim 2 , wherein the second monolithic body carries a reflecting surface.

4. The micro-electro-mechanical device according to claim 1 , further including a sensing structure associated with the fixed part of the first monolithic body.

5. The micro-electro-mechanical device according to claim 1 , wherein the actuation elements are selected from the group consisting of: magnetic actuation elements, electrostatic actuation elements, and piezoelectric actuation elements.

6. A process for manufacturing a micro-electro-mechanical device, comprising:
forming projections extending from a first portion of a first monolithic body comprising semiconductor material;
superimposing a second monolithic body comprising semiconductor material on the first monolithic body;
bonding the projections of the first monolithic body to the second monolithic body and forming a composite body;
forming actuation elements inside or on the first portion of the first monolithic body;
defining the first monolithic body to form a fixed part, a movable part, and elastic elements, the movable part carrying the actuation elements and having the projections, and the elastic elements coupling the movable part to the fixed part.

7. The process according to claim 6 , comprising, after bonding the projections to the second monolithic body, cutting the composite body into a plurality of devices.

8. The process according to claim 6 , comprising, prior to forming projections, bonding the first monolithic body to a first supporting wafer through a first temporary bonding layer.

9. The process according to claim 8 , wherein forming projections comprises selectively removing portions of the first monolithic body.

10. The process according to claim 9 , wherein the first monolithic body comprises a layer stack including a first semiconductor layer, an insulating layer, and a second semiconductor layer;
wherein bonding the first monolithic body to a first supporting wafer comprises bonding the second semiconductor layer to the first supporting wafer and thinning the first semiconductor layer; and
wherein forming projections comprises selectively removing portions of the thinned first semiconductor layer.

11. The process according to claim 8 , further comprising, before or after forming the composite body, forming a cover layer on the first monolithic body and forming structure definition vias and separation vias in the covering layer,
the process further comprising, after forming a composite body:
removing the first supporting wafer;
removing first portions of the first monolithic body underneath the structure definition vias;
removing second portions of the first monolithic body underneath the separation vias; and
cutting the second monolithic body aligned to the separation vias.

12. The process according to claim 8 , further comprising, after forming the composite body:
removing the first supporting wafer;
selectively removing first portions of the first monolithic body to form the movable part, the fixed part, and the elastic elements;
selectively removing second portions of the first monolithic body to form separation vias; and
cutting the second monolithic body aligned to the separation vias.

13. The process according to claim 8 , further comprising, before bonding the first monolithic body to a first supporting wafer and before defining the first monolithic body, forming sensing elements in or on a second portion of the first monolithic body, the second portion forming the fixed part of the first monolithic body, after defining the first monolithic body.

14. The process according to claim 6 , further comprising, prior to bonding the projections to the second monolithic body, bonding the second monolithic body to a second supporting wafer through a second temporary bonding layer.

15. The process according to claim 14 , further comprising, before bonding the second monolithic body to a second supporting wafer, forming reflecting surfaces on a first surface of the second monolithic body, wherein bonding the second monolithic body to a second supporting wafer comprises bonding the first surface of the second monolithic body to the second supporting wafer.

16. The process according to claim 15 , further comprising, after bonding the second monolithic body to a second supporting wafer and before bonding the projections of the first monolithic body to the second monolithic body, thinning the second monolithic body from a second surface of the second monolithic body.

17. The process according to claim 14 , further comprising, after defining the first monolithic body, removing the second supporting wafer and cutting the composite body into a plurality of devices.

18. A micro-electro-mechanical device, comprising:
a first monolithic body including semiconductor material, wherein the first monolithic body includes a fixed part, a movable part forming a frame surrounding the fixed part, and elastic elements configured to elastically couple the movable part and the fixed part to support oscillation of the movable part relative to the fixed part about an oscillation axis;
a plurality of projections extending perpendicularly from a surface of the movable part;
a second monolithic body including semiconductor material, wherein the second monolithic body has a bottom surface mounted to the plurality of projections with the second monolithic body extending over the movable part of the first monolithic body; and
a mirror layer mounted to a top surface of the second monolithic body that is opposite the bottom surface.

19. The micro-electro-mechanical device of claim 18 , wherein said movable part includes actuation elements that are configured to control the oscillation of the movable part relative to the fixed part about the oscillation axis.

20. The micro-electro-mechanical device of claim 19 , wherein the actuation elements are selected from the group consisting of: magnetic actuation elements, electrostatic actuation elements, and piezoelectric actuation elements.

Assignees

• St Microelectronics Srl

Inventors

• Costantini Sonia
• Carminati Marta
• Gatti Daniela Angela Luisa
• Castoldi Laura Maria
• Carminati Roberto

Classifications

• G02B26/0833 Primary

  the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD (G02B26/0825 takes precedence; micromechanical devices in general B81B) · CPC title

• B81C2203/032

  Gluing · CPC title

• B81B2203/058

  Rotation out of a plane parallel to the substrate · CPC title

• B81B2203/0307

  Anchors · CPC title

• B81B2201/042

  Micromirrors, not used as optical switches · CPC title