Light emitting diode and fabrication method thereof
US-10043944-B2 · Aug 7, 2018 · US
US10193021B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10193021-B2 |
| Application number | US-201615561028-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 18, 2016 |
| Priority date | Mar 23, 2015 |
| Publication date | Jan 29, 2019 |
| Grant date | Jan 29, 2019 |
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A light-emitting layer includes: a base layer with a plurality of base segments that have a composition subject to stress strain from a first semiconductor layer and are formed in a random net shape; and a quantum well structure layer including at least one quantum well layer and at least one barrier layer that are formed on the base layer. The base layer includes: a first sub-base layer; a trench that partitions the first sub-base layer for each of the plurality of base segments; and a second sub-base layer formed to bury the first sub-base layer.
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The invention claimed is: 1. A semiconductor light-emitting element comprising: a first semiconductor layer of a first conductivity type and having a composition of GaN; a light-emitting functional layer including a light-emitting layer formed on the first semiconductor layer; and a second semiconductor layer that is of a conductivity type opposite to the conductivity type of the first semiconductor layer and is formed on the light-emitting functional layer, wherein: the light-emitting layer includes a base layer with a plurality of base segments that have a composition subject to stress from the first semiconductor layer and are formed in a random net shape, and a quantum well structure layer including at least one quantum well layer each having a composition of InGaN and at least one barrier layer that are formed on the base layer, and the base layer includes a first sub-base layer, a trench that partitions the first sub-base layer for each of the plurality of base segments, and a second sub-base layer formed to bury the first sub-base layer, the first sub-base layer having a composition of AlGaN, and the second sub-base layer being formed from AlGaN that has an Al composition that is greater than an Al composition of the first sub-base layer. 2. The semiconductor light-emitting element according to claim 1 , wherein the trench is formed to have a depth so as to extend from a surface of the first sub-base layer to an inside of the first semiconductor layer. 3. The semiconductor light-emitting element according to claim 1 , wherein: the base layer further includes a third sub-base layer formed between the first semiconductor layer and the first sub-base layer; and the trench is formed to have a depth so as to extend from a surface of the first sub-base layer to an inside of the third sub-base layer. 4. The semiconductor light-emitting element according to claim 3 , wherein the light-emitting functional layer has a structure in which a plurality of the light-emitting layers are stacked. 5. The semiconductor light-emitting element according to claim 4 , wherein each of the base layers of the plurality of the light-emitting layers has a different composition. 6. A method of manufacturing a semiconductor light-emitting element, the method comprising: forming, on a substrate, a first semiconductor layer having a first conductivity type and having a composition of GaN; forming, on the first semiconductor layer, a first sub-base layer with a groove that is formed in a random net shape, the first sub-base layer having a composition of AlGaN subject to stress from the first semiconductor layer; forming a trench for removing the groove; forming a second sub-base layer to bury the first sub-base layer, the second sub-base layer being formed from AlGaN that has an Al composition that is greater than an Al composition of the first sub-base layer; forming, on the second sub-base layer, a quantum well structure layer including at least one quantum well layer each having a composition of InGaN and at least one barrier layer; and forming, on the quantum well structure layer, a second semiconductor layer having a second conductivity type opposite to the first conductivity type. 7. The method of manufacturing a semiconductor light-emitting element according to claim 6 , wherein: forming the trench comprises etching the first sub-base layer using H 2 gas.
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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