Current-actuated-display backplane tester and method

Patent metadata

Field	Value
Publication number	US-10186179-B2
Application number	US-40821909-A
Country	US
Kind code	B2
Filing date	Mar 20, 2009
Priority date	Mar 20, 2009
Publication date	Jan 22, 2019
Grant date	Jan 22, 2019

Abstract

A backplane test system is provided that uses a pressed or deposited resistive film and infra-red (IR) imaging to visualize and quantify the current drive of pixels. In one form, the system is used for measuring organic light-emitting-diode (OLED) backplanes or other current-actuated-display (CAD) backplanes.

First claim

What is claimed is:

1. A system for testing a current actuated display backplane having circuit elements disposed thereon, the system comprising:
conductive connections to the circuit elements;
a drive circuit to selectively drive the circuit elements through the conductive connections;
a resistive layer pressed on the backplane to cover the circuit elements, the resistive layer being provided with an element to drive voltage to a certain level and having resistivity compatible with the circuit elements; and,
an infrared camera to generate an infrared image of the resistive layer while the circuit elements are being driven to observe heating in the resistive layer.

2. The system as set forth in claim 1 wherein the conductive connections comprise contact pads connected to circuit elements via bus lines.

3. The system as set forth in claim 2 wherein the conductive connections comprise conductive tape elements.

4. The system as set forth in claim 1 wherein the resistive layer is comprised of one of indium tin oxide (ITO), PEDOT, tungsten, titanium and carbon.

5. The system as set forth in claim 1 wherein the resistive layer is a rubber material.

6. The system as set forth in claim 1 wherein the resistive layer is transparent.

7. The system as set forth in claim 1 wherein the backplane is used for organic light emitting diode (OLED) applications.

8. The system as set forth in claim 1 wherein the infrared imager comprises one of a CCD, CMOS and InSb-QW imagers.

9. A method for testing current actuated display backplanes having circuit elements disposed thereon, the method comprising:
pressing a resistive layer on the backplane to cover the circuit elements , the resistive layer being provided with an element to drive voltage to a certain level and having resistivity compatible with the circuit elements;
selectively actuating the circuit elements; and,
generating an infrared image of the resistive layer during the selective actuation to observe heating in the resistive layer.

10. The method as set forth in claim 9 wherein the resistive layer is one of indium tin oxide (ITO), PEDOT, tungsten, titanium and carbon.

11. The method as set forth in claim 9 wherein the resistive layer is a rubber material.

12. The method as set forth in claim 9 wherein the resistive layer is transparent.

13. The method as set forth in claim 9 wherein the backplane is implemented in an organic light emitting diode application.

14. The method as set forth in claim 9 wherein the infrared image generating is accomplished by one of a CCD, CMOS or InSb-QW device.

Assignees

• Apte Raj B
• Lu Jeng Ping
• Ho Jackson H
• Palo Alto Res Ct Inc

Inventors

• Apte Raj B
• Lu Jeng Ping
• Ho Jackson H

Classifications

• G09G2360/147

  the originated light output being determined for each pixel · CPC title

• G09G3/3208

  organic, e.g. using organic light-emitting diodes [OLED] · CPC title

• G01R31/308

  using non-ionising electromagnetic radiation, e.g. optical radiation {(investigating or analysing materials by the use of optical means G01N21/00; image analysis G06T7/00)} · CPC title

• G09G3/006 Primary

  Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays (testing individual LED's G01R31/2635; testing lamps G01R31/44; testing of optical features of LCD displays G02F1/1309) · CPC title