Mismatch detection using replica circuit

Patent metadata

Field	Value
Publication number	US-10184973-B2
Application number	US-201715829761-A
Country	US
Kind code	B2
Filing date	Dec 1, 2017
Priority date	May 7, 2014
Publication date	Jan 22, 2019
Grant date	Jan 22, 2019

Abstract

An apparatus for detecting difference in operating characteristics of a main circuit by using a replica circuit is presented. In one exemplary case, a sensed difference in operating characteristics of the two circuits is used to drive a tuning control loop to minimize the sensed difference. In another exemplary case, several replica circuits of the main circuit are used, where each is isolated from one or more operating variables that affect the operating characteristic of the main circuit. Each replica circuit can be used for sensing a different operating characteristic, or, two replica circuits can be combined to sense a same operating characteristic.

First claim

What is claimed is:

1. A circuital arrangement, comprising:
a sensing circuit;
a first radio frequency (RF) path coupled, through one or more sensing points of the first RF path, to the sensing circuit, the first RF path comprising a first active circuit; and
at least one second RF path coupled, through one or more sensing points of the second RF path in correspondence of the one or more sensing points of the first RF path, to the sensing circuit, the second RF path comprising a second active circuit, the second active circuit being a reduced size replica of the first active circuit,
wherein the sensing circuit is adapted to sense a difference between one or more operating characteristics of the first RF path, sensed at the one or more sensing points of the first RF path, and one or more reference operating characteristics of the second RF path, sensed at corresponding one or more sensing points of the second RF path.

2. The circuital arrangement according to claim 1 , wherein:
the one or more operating characteristics of the first RF path are affected by a set of operating variables, and
the second RF path is configured so that one or more reference operating characteristics of the second RF path are affected by a subset of the operating variables.

3. The circuital arrangement according to claim 2 , wherein the set of operating variables comprises one or more of: a) a load to the first/second RF paths, b) a local temperature at the first/second active circuits, c) hot carrier injection (HCI) effect on devices of the first/second active circuits, d) transient effects on the first/second active circuits, e) floating body effects on devices of the first/second active circuits, f) different operating modes of the first/second RF paths, and g) different frequencies of operation of the first/second RF paths.

4. The circuital arrangement according to claim 2 , wherein the operating characteristics of the first active circuit and the operating characteristics of the second active circuit are related according to a known mapping function over the set of operating variables.

5. The circuital arrangement according to claim 2 , wherein the one or more operating characteristics comprise one or more of: a) a signal modulation characteristic, b) a signal linearity characteristic, c) a signal distortion characteristic, d) a signal magnitude characteristic, e) a signal phase characteristic, f) a transient response characteristic, g) a temperature characteristic, and e) bias conditions, including bias voltages and bias currents.

6. The circuital arrangement according to claim 2 , wherein:
the first RF path is configured to transmit an RF signal at an output node of the first RF path through a matching impedance coupled to the output node of the first RF path, and
the second RF path is configured to terminate an RF signal at an output node of the second RF path through a terminating impedance coupled to the output node of the second RF path.

7. The circuital arrangement according to claim 2 , wherein the sensing circuit senses signals at the one or more sensing points of the first RF path in correspondence of the one or more operating characteristics of the first RF path, and senses signals at the one or more sensing points of the second RF path in correspondence of the one or more reference operating characteristics of the second RF path.

8. The circuital arrangement according to claim 7 , wherein the sensed signals are one or more of: a) a voltage signal, b) a current signal, and c) a power signal.

9. The circuital arrangement according to claim 7 , wherein the first RF path and the second RF path further comprise control inputs configured to receive control signals to affect the one or more operating characteristics.

10. The circuital arrangement according to claim 9 , wherein the control signals are based on the sensed signals.

11. The circuital arrangement according to claim 1 , wherein the reduced size of the second active circuit is about 1/100 th or less a size of the first active circuit, such as a current flow and a power consumption of the second active circuit is about 1/100 th or less of a current flow and a power consumption of the first active circuit.

12. The circuital arrangement according to claim 1 , wherein the first RF path and the second RF path each further comprise an output signal processing circuit coupled to a respective output node of the first active circuit and the second active circuit.

13. The circuital arrangement according to claim 12 , wherein the first RF path and the second RF path each further comprise an input signal processing circuit coupled to a respective input node of the first active circuit and the second active circuit.

14. The circuital arrangement according to claim 13 , wherein the input signal processing circuit and the output signal processing circuit are configured to affect one or more of: a) a signal amplitude, b) a signal phase, and c) an impedance presented to the respective input node and output node.

15. The circuital arrangement according to claim 14 , wherein the input signal processing circuit and the output signal processing circuit each comprise one or more of: a) a tunable match circuit, b) a fixed match, c) a variable attenuator, d) a fixed attenuator, e) a variable phase shifter circuit, and f) a filter.

16. The circuital arrangement according to claim 1 , wherein the first RF path and the second RF path each comprises a biasing circuit configured to bias a respective one of the first active circuit and the second active circuit.

17. The circuital arrangement according to claim 16 , wherein the biasing circuit comprises a DC/DC converter or a low dropout (LDO) regulator configured to provide power to the respective one of the first active circuit and the second active circuit.

18. The circuital arrangement according to claim 1 , wherein the circuital arrangement is monolithically integrated in an integrated circuit either partially or in its entirety, according to a CMOS process comprising one of: a) a silicon-on-insulator (SOI) process, b) a silicon-on-sapphire process (SOS), and c) a bulk-silicon process.

19. The circuital arrangement according to claim 2 , wherein the at least one second RF path comprises a plurality of second RF paths, each configured so that respective one or more reference operating characteristics are affected by a different subset of the operating variables.

20. The circuital arrangement according to claim 1 , wherein the first active circuit comprises one of: a) an amplifier circuit, b) a power amplifier, c) a low noise amplifier (LNA), d) a mixer, e) a voltage controlled oscillator (VCO), f) a modulator, and g) a demodulator.

Assignees

• Psemi Corp

Inventors

• Nobbe Dan William
• Reedy Ronald Eugene
• Bacon Peter
• Cable James S

Classifications

• H03F2203/21142

  Output signals of a plurality of power amplifiers are parallel combined to a common output · CPC title

• H03F1/56 Primary

  Modifications of input or output impedances, not otherwise provided for · CPC title

• H03F3/72

  Gated amplifiers, i.e. amplifiers which are rendered operative or inoperative by means of a control signal · CPC title

• G01R31/28 Primary

  Testing of electronic circuits, e.g. by signal tracer ({EMC, EMP or similar testing of electronic circuits G01R31/002;} testing for short-circuits, discontinuities, leakage or incorrect line connection G01R31/50; checking computers {or computer components} G06F11/00; checking static stores for correct operation G11C29/00 {; testing receivers or transmitters of transmission systems H04B17/00}) · CPC title

• H03F1/0277

  Selecting one or more amplifiers from a plurality of amplifiers · CPC title