Opto electrical test measurement system for integrated photonic devices and circuits

Patent metadata

Field	Value
Publication number	US-10180373-B2
Application number	US-201715489127-A
Country	US
Kind code	B2
Filing date	Apr 17, 2017
Priority date	Apr 20, 2016
Publication date	Jan 15, 2019
Grant date	Jan 15, 2019

Abstract

An optical testing circuit on a wafer includes an optical input configured to receive an optical test signal and photodetectors configured to generate corresponding electrical signals in response to optical processing of the optical test signal through the optical testing circuit. The electrical signals are simultaneously sensed by a probe circuit and then processed. In one process, test data from the electrical signals is simultaneously generated at each step of a sweep in wavelength of the optical test signal and output in response to a step change. In another process, the electrical signals are sequentially selected and the sweep in wavelength of the optical test signal is performed for each selected electrical signal to generate the test data.

First claim

The invention claimed is:

1. A method for testing an optical testing circuit on a wafer, wherein said optical testing circuit includes: an optical input configured to receive an optical test signal and a plurality of photodetectors configured to generate a corresponding plurality of electrical signals in response to optical processing of said optical test signal through the optical testing circuit, said method comprising:
applying the optical test signal to the optical input with a sweep in wavelength including a plurality of steps;
simultaneously sensing the plurality of electrical signals at each step of the sweep in wavelength;
generating test data for the simultaneously sensed plurality of electrical signals at each step of the sweep in wavelength;
storing the test data at each step of the sweep in wavelength;
sensing a change in wavelength of the optical test signal; and
in response to the sensed change in wavelength of the optical test signal, outputting the stored test data.

2. The method of claim 1 , wherein generating test data comprises, for each individual electrical signal of the plurality of electrical signals that is simultaneously sensed, converting the individual electrical signal to a digital signal.

3. The method of claim 2 , wherein storing the test data comprises, for each individual electrical signal of the plurality of electrical signals that is simultaneously sensed, storing the digital signal in a memory.

4. The method of claim 3 , wherein outputting comprises reading the stored digital signal from each memory.

5. The method of claim 4 , further comprising generating a trigger signal in response to the sensed change in wavelength, and wherein reading is performed in response to said trigger signal.

6. The method of claim 1 , wherein optical processing of said optical test signal through the optical testing circuit comprises passing a signal derived from said optical test signal through at least one optical device under test (DUT) circuit.

7. The method of claim 1 , further comprising generating a trigger signal in response to the sensed change in wavelength, and wherein outputting is performed in response to said trigger signal.

8. The method of claim 1 , further comprising controlling a gain of each electrical signal of the plurality of electrical signals at each step of the sweep in wavelength.

9. The method of claim 1 , wherein outputting further comprises providing, with each output of stored test data, an identification of the step in the sweep in wavelength of the optical test signal that corresponds to the simultaneously sensed plurality of electrical signals from which the stored test data is generated.

10. The method of claim 9 , wherein the identification of the step is an identification of the wavelength for that step.

11. A method for testing an optical testing circuit on a wafer, wherein said optical testing circuit includes: an optical input configured to receive an optical test signal and a plurality of photodetectors configured to generate a corresponding plurality of electrical signals in response to optical processing of said optical test signal through the optical testing circuit, said method comprising:
sequentially selecting an electrical signal from the plurality of electrical signals; and
for each selected electrical signal, performing a process as follows:
sweeping the wavelength of the optical test signal;
sensing the selected electrical signal;
generating test data from the selected electrical signal over the sweep in wavelength of the optical test signal;
determining whether all electrical signals of the plurality of electrical signals have been selected; and
if not, then changing the selected electrical signal and repeating the process.

12. A method for testing, comprising:
applying an optical test signal to an optical input with a sweep in wavelength including a plurality of steps;
passing a signal derived from said optical test signal through at least one optical device under test (DUT) circuit;
photodetecting the optical test signal and a signal output from the DUT circuit to generate a corresponding plurality of electrical signals; and
for each step of the sweep in wavelength:
simultaneously sensing the plurality of electrical signals;
generating test data for the simultaneously sensed plurality of electrical signals;
storing the test data;
detecting a change in the step of the sweep in wavelength; and
outputting the stored test data.

13. The method of claim 12 , wherein generating test data comprises converting each electrical signal of said plurality of electrical signals to a digital signal.

14. The method of claim 13 , wherein storing the test data comprises storing the digital signal in a memory.

15. The method of claim 14 , wherein outputting comprises reading the stored digital signal from the memory.

16. The method of claim 12 , further comprising controlling a gain of each electrical signal of the plurality of electrical signals at each step of the sweep in wavelength.

17. The method of claim 12 , wherein outputting further comprises providing, with each output of stored test data, an identification of the step in the sweep in wavelength of the optical test signal that corresponds to the simultaneously sensed plurality of electrical signals from which the stored test data is generated.

18. The method of claim 17 , wherein the identification of the step is an identification of the wavelength for that step.

19. A method for testing, comprising:
applying an optical test signal to an optical input;
passing a signal derived from said optical test signal through at least one optical device under test (DUT) circuit;
photodetecting the optical test signal and a signal output from the DUT circuit to generate a corresponding plurality of electrical signals;
sequentially selecting an electrical signal from the plurality of electrical signals; and
for each selected electrical signal, performing a process as follows:
sweeping the wavelength of the optical test signal in a plurality of steps;
sensing the selected electrical signal;
generating test data from the selected electrical signal over the sweep in wavelength of the optical test signal;
determining whether all electrical signals of the plurality of electrical signals have been selected; and
if not, then changing the selected electrical signal and repeating the process.

Assignees

• St Microelectronics Crolles 2 Sas

Inventors

• Grosse Philippe
• Le Maitre Patrick
• Carpentier Jean-Francois

Classifications

• G02B6/34

  utilising prism or grating {(G02B6/293 takes precedence)} · CPC title

• G01R31/2656

  using non-ionising electromagnetic radiation, e.g. optical radiation · CPC title

• G02B6/12004

  Combinations of two or more optical elements · CPC title

• G01R35/00

  Testing or calibrating of apparatus covered by the other groups of this subclass · CPC title

• G01R31/303

  of integrated circuits (G01R31/305 - G01R31/315 take precedence) · CPC title