Connector terminal and material for connector terminal
US-2015280339-A1 · Oct 1, 2015 · US
US10177479B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10177479-B2 |
| Application number | US-201515301309-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 25, 2015 |
| Priority date | Apr 3, 2014 |
| Publication date | Jan 8, 2019 |
| Grant date | Jan 8, 2019 |
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A terminal pair including a first terminal provided with a first contact portion and a second terminal provided with a second contact portion. The first contact portion includes a composite covering layer having a Sn—Pd based alloy phase and a Sn phase, and has a surface including the Sn—Pd based alloy phase and the Sn phase. The second contact portion includes a Cu—Sn alloy layer and a Sn layer covering part of the Cu—Sn alloy layer, and has a surface including a Cu—Sn alloy region corresponding to an exposed portion of the Cu—Sn alloy layer and a Sn region corresponding to an exposed portion of the Sn layer. A coefficient of friction for sliding movement between the first contact portion and the second contact portion is lower than a coefficient of friction for sliding movement between the two first contact portions and between the two second contact portions.
Opening claim text (preview).
The invention claimed is: 1. A terminal pair comprising a first terminal provided with a first contact portion and a second terminal provided with a second contact portion, and being configured to be used by bringing the first contact portion and the second contact portion into contact with each other, wherein the first contact portion comprises a composite covering layer formed over a first base material made of a metal, the composite covering layer comprising two phases that are a Sn—Pd based alloy phase and a Sn phase, one of the two phases being dispersed in the other of the two phases, the first contact portion has a surface including the Sn—Pd based alloy phase and the Sn phase, the second contact portion comprises a Cu—Sn alloy layer formed over a second base material made of a metal and a Sn layer covering part of the Cu—Sn alloy layer, the second contact portion has a surface including a Cu—Sn alloy region and a Sn region, the Cu—Sn alloy region corresponding to an exposed portion of the Cu—Sn alloy layer, the Sn region corresponding to an exposed portion of the Sn layer, and a coefficient of friction for sliding movement between the first contact portion and the second contact portion is lower than a coefficient of friction for sliding movement between two first contact portions slidingly moved against each other and between two second contact portions slidingly moved against each other. 2. The terminal pair according to claim 1 , wherein the Sn—Pd based alloy phase is dispersed in the Sn phase. 3. The terminal pair according to claim 1 , wherein a Pd content in the composite covering layer is equal to or less than 7 atomic %. 4. The terminal pair according to claim 1 , wherein a volume fraction of the Sn—Pd based alloy phase in the composite covering layer ranges from 1.0 to 95.0 vol. %. 5. The terminal pair according to claim 1 , wherein an area fraction of the Sn—Pd based alloy phase exposed in a surface of the composite covering layer ranges from 1.0 to 95%. 6. The terminal pair according to claim 1 , wherein a glossiness of a surface of the composite covering layer ranges from 10 to 300%. 7. The terminal pair according to claim 1 , wherein the Cu—Sn alloy region is scattered in the Sn region in the surface of the second contact portion. 8. The terminal pair according to claim 1 , wherein a glossiness of the second contact portion ranges from 50 to 1000%. 9. The terminal pair according to claim 1 , wherein a glossiness of the Cu—Sn alloy layer ranges from 10 to 80% as measured after dissolving and removing only the Sn layer. 10. The terminal pair according to claim 1 , wherein the first terminal is a connector pin, and the second terminal is a female terminal. 11. A connector pair comprising the terminal pair according to claim 1 , wherein the connector pair is configured to be used by fitting a first connector comprising the first terminal and a second connector comprising the second terminal to each other. 12. The terminal pair according to claim 2 , wherein a Pd content in the composite covering layer is equal to or less than 7 atomic %. 13. The terminal pair according to claim 12 , wherein a volume fraction of the Sn—Pd based alloy phase in the composite covering layer ranges from 1.0 to 95.0 vol. %. 14. The terminal pair according to claim 13 , wherein an area fraction of the Sn—Pd based alloy phase exposed in a surface of the composite covering layer ranges from 1.0 to 95.0 vol. %. 15. The terminal pair according to claim 14 , wherein a glossiness of the surface of the composite covering layer ranges from 10 to 300%. 16. The terminal pair according to claim 15 , wherein the Cu—Sn alloy region is scattered in the Sn region in the surface of the second contact portion. 17. The terminal pair according to claim 16 , wherein a glossiness of the second contact portion ranges from 50 to 1000%. 18. The terminal pair according to claim 17 , wherein a glossiness of the Cu—Sn alloy layer ranges from 10 to 80% as measured after dissolving and removing only the Sn layer. 19. The terminal pair according to claim 18 , wherein the first terminal is a connector pin, and the second terminal is a female terminal. 20. A connector pair comprising the terminal pair according to claim 19 , wherein the connector pair is configured to be used by fitting a first connector comprising the first terminal and a second connector comprising the second terminal to each other.
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