Semiconductor device having trench capacitor structure integrated therein
US-9608130-B2 · Mar 28, 2017 · US
US10164005B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10164005-B2 |
| Application number | US-201615072906-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 17, 2016 |
| Priority date | Mar 17, 2016 |
| Publication date | Dec 25, 2018 |
| Grant date | Dec 25, 2018 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
The present disclosure provides a semiconductor structure which comprises a semiconductive substrate and a doped region in the semiconductive substrate. The doped region has a conductivity type opposite to the semiconductive substrate. The semiconductor structure also includes a capacitor in the doped region where the capacitor comprises a plurality of electrodes and the plurality of electrodes are insulated with one another. The semiconductor structure further includes a plug in the capacitor and surrounded by the plurality of electrodes.
Opening claim text (preview).
What is claimed is: 1. A semiconductor structure, comprising: a semiconductive substrate; a doped region in the semiconductive substrate, the doped region having a conductivity type opposite to the conductivity type of the semiconductive substrate; a capacitor in the doped region, the capacitor comprising a plurality of electrodes and the plurality of electrodes being insulated from one another; a first dielectric disposed on one of the plurality of electrodes; and a multi-layer structure extending within the capacitor and surrounded by the first dielectric, wherein the multi-layer structure comprises a second dielectric contacting the first dielectric and exposing a portion of the first dielectric. 2. The semiconductor structure of claim 1 , wherein the multi-layer structure further includes a conductive material surrounded by the second dielectric. 3. The semiconductor structure of claim 1 , wherein the multi-layer structure is electrically insulated from the plurality of electrodes. 4. The semiconductor structure of claim 1 , wherein the multi-layer structure is electrically coupled to one of the plurality of electrodes. 5. The semiconductor structure of claim 1 , wherein the multi-layer structure further includes a same material as one of the plurality of electrodes. 6. The semiconductor structure of claim 1 , wherein each of the plurality of electrodes is extending over a portion of a top surface of the semiconductive substrate. 7. The semiconductor structure of claim 1 , wherein the doped region is electrically insulated from one of the plurality of electrodes. 8. The semiconductor structure of claim 1 , further comprising an interconnect structure comprising a plurality of conductive vias electrically coupled to the doped region and each of the plurality of electrodes, respectively. 9. The semiconductor structure of claim 1 , wherein the multi-layer structure further comprises tungsten. 10. The semiconductor structure of claim 1 , wherein the multi-layer structure has an aspect ratio from about 20 to about 80.
Capacitor integral with wiring layers · CPC title
Electricity · mapped topic
Electricity · mapped topic
Resistors, capacitors or inductors · CPC title
having vertical extensions · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.