Low-K dielectric sidewall spacer treatment

Patent metadata

Field	Value
Publication number	US-10158000-B2
Application number	US-201314089879-A
Country	US
Kind code	B2
Filing date	Nov 26, 2013
Priority date	Nov 26, 2013
Publication date	Dec 18, 2018
Grant date	Dec 18, 2018

Abstract

Systems and methods are provided for fabricating a semiconductor structure including sidewall spacers. An example semiconductor structure includes: a gate structure, a first sidewall spacer, and a second sidewall spacer. The gate structure is formed over a substrate. The first sidewall spacer is adjacent to the gate structure, a top part of the first sidewall spacer including a first dielectric material, a bottom part of the first sidewall spacer including a second dielectric material. The second sidewall spacer is adjacent to the first sidewall spacer, the second sidewall spacer including a third dielectric material.

First claim

What is claimed is:

1. A semiconductor structure comprising:
a substrate; and
a transistor device comprising:
a gate structure comprising an interfacial layer, a high-k dielectric layer, and a gate electrode formed over the substrate;
a first sidewall spacer extending from the substrate, having a side part that has an arc-shaped edge and that is arranged at a height lower than the gate structure, and in contact with the gate structure, the first sidewall spacer further having a top part on which a nitridation process is performed; and
a second sidewall spacer arranged adjacent to the first sidewall spacer, extending from the substrate, covering the arc-shaped edge of the first sidewall spacer, including a dielectric material, and having a height greater than the gate structure;

wherein a height of the gate structure ranges from 25 to 50 nm,
wherein a height of the side part of the first sidewall spacer ranges from 15 to 25 nm; and
wherein the height of the side part of the second sidewall spacer ranges from 10 to 30 nm greater than the height of the gate structure.

2. The semiconductor structure of claim 1 , wherein the second sidewall spacer is configured to protect the first sidewall spacer from one or more etching processes.

3. The semiconductor structure of claim 1 , wherein the interfacial layer is formed over the substrate; and the high-k dielectric layer is formed over the interfacial layer, wherein the gate electrode is formed over the high-k dielectric layer.

4. The semiconductor structure of claim 3 , wherein the interfacial layer includes silicon oxide.

5. The semiconductor structure of claim 3 , wherein the high-k dielectric layer includes tantalum oxide, hafnium oxide, zirconium oxide, titanium oxide, aluminum oxide, hafnium silicates, or hafnium dioxide-alumina alloy.

6. The semiconductor structure of claim 3 , wherein the gate electrode includes titanium, titanium nitride, titanium-aluminum, aluminum, aluminum nitride, tantalum, tantalum nitride, tantalum carbide, tantalum carbonitride, tantalum silicon nitride, or tantalum silicide.

7. The semiconductor structure of claim 1 , wherein the top part of the first sidewall spacer includes silicon-carbon-nitride or silicon nitride.

8. The semiconductor structure of claim 1 , wherein the dielectric material of the second sidewall spacer includes silicon-carbon-nitride or silicon nitride.

9. The semiconductor structure of claim 1 , wherein the gate structure includes a dummy polysilicon gate structure.

10. The semiconductor structure of claim 1 , wherein a width of the first sidewall spacer ranges from 2 to 5 nm.

11. The semiconductor structure of claim 1 , further comprising a sacrificial layer disposed over the gate electrode of the gate structure defining a thickness, wherein the thickness of the sacrificial layer ranges from 10 to 30 nm.

12. The semiconductor structure of claim 1 , wherein a height of the second sidewall spacer ranges from 35 to 80 nm.

13. The semiconductor structure of claim 1 , further comprising a contact etch stop layer in contact with an outer surface of the second sidewall spacer.

14. A semiconductor structure comprising:
a substrate;
a gate structure comprising an interfacial layer, a high-k dielectric layer, and a gate electrode formed over the substrate;
a first sidewall spacer extending from the substrate, having a side part that has an arc-shaped edge and that is arranged at a height lower than the gate structure and in contact with the gate structure, the bottom part of the first sidewall spacer including a first dielectric material with a dielectric constant lower than 4, the first sidewall spacer further having a top part on which a nitridation is performed; and
a second sidewall spacer laterally arranged over the first sidewall spacer, extending from the substrate, covering the arc-shaped edge of the first sidewall spacer, and having a height greater than the gate structure;
wherein a width of the first sidewall spacer ranges from 2 to 5 nm,
a height of the second sidewall spacer ranges from 35 to 80 nm; and
wherein the height of the side part of the second sidewall spacer ranges from 10 to 30 nm greater than the height of the gate structure.

15. The semiconductor structure of claim 14 ,
wherein the second sidewall spacer is configured to protect the first sidewall spacer from one or more etching processes, and
wherein the first dielectric material of the bottom part of the first sidewall spacer includes silicon-oxygen-carbon-nitride.

16. The semiconductor structure of claim 14 , wherein
a height of the gate electrode ranges from 25 to 50 nm, and
a height of a bottom part of the first sidewall spacer ranges from 15 to 25 nm.

17. The semiconductor structure of claim 14 , further comprising a sacrificial layer disposed over the gate electrode of the gate structure defining a thickness, wherein the thickness of the sacrificial layer ranges from 10 to 30 nm, and a height of the second sidewall spacer ranges from 35 to 80 nm.

18. The semiconductor structure of claim 14 , further comprising a contact etch stop layer in contact with an outer surface of the second sidewall spacer.

Assignees

• Taiwan Semiconductor Mfg Co Ltd

Inventors

• Lee Wei-Yang
• Lan Chia-Chun

Classifications

• H10D64/01354

  passivation or protection of the electrode, e.g. using re-oxidation · CPC title

• H01L29/4966

  Electricity · mapped topic

• H01L29/4983

  Electricity · mapped topic

• H01L29/517

  Electricity · mapped topic

• H01L21/28247

  Electricity · mapped topic