Device and method for characterization of a light beam to determine the spatial-temporal properties of the light beam using a two dimensional interference pattern

Patent metadata

Field	Value
Publication number	US-10151639-B2
Application number	US-201515319204-A
Country	US
Kind code	B2
Filing date	Jun 15, 2015
Priority date	Jun 16, 2014
Publication date	Dec 11, 2018
Grant date	Dec 11, 2018

Abstract

A method for characterizing a light beam includes separating the light beam by a separator optic into first and second sub-beams; propagating the first and second sub-beams over first and second optics, respectively, said first and second optics being respectively arranged so that the sub-beams on leaving the optics are separated by a time delay τ; recombining the sub-beams so that they spatially interfere and form a two-dimensional interference pattern; measuring the frequency spectrum of at least part of the interference pattern; calculating the Fourier transform in the time domain of at least one spatial point of the frequency spectrum, the Fourier transform in the time domain having a time central peak and first and second time side peaks; calculating the Fourier transform in the frequency domain for one of the side peaks; calculating the spectral amplitude AR(ω) and the spatial-spectral phase φR(x,y,ω) for the Fourier transform in the frequency domain.

First claim

The invention claimed is:

1. A method for characterization of a light beam comprising:
separating the light beam by means of a separator optic into a first sub-beam and a second sub-beam, the first sub-beam taking a first optical path and the second sub-beam taking a second optical path;
propagating the first sub-beam over a first optic and the second sub-beam over a second optic, the first sub-beam having a non-homogeneous electromagnetic field over an entire surface of the first optic, said first sub-beam forming a reference beam upon leaving the first optic and said second sub-beam forming a characterized beam upon leaving the second optic, said first and second optics being, thanks to a controller, respectively arranged in the first and second optical paths so that the reference beam and the characterized beam are separated by a time delay τ;
recombining the reference beam and the characterized beam by means of a recombiner optic in such a way that the reference and characterized beams spatially interfere and form a two-dimensional interference pattern, the two-dimensional interference pattern extending along a first plane;
measuring a frequency spectrum of at least one part of the two-dimensional interference pattern by means of a measuring system, the measuring system comprising a spectrometer having an inlet slit extending along a first spatial direction of the first plane;
calculating the Fourier transform in the time domain of at least one spatial point of the frequency spectrum, said Fourier transform in the time domain having a time central peak and first and second time side peaks;
calculating the Fourier transform in the frequency domain by means of a calculator for one of said first and second time side peaks;
calculating, by means of the calculator, a relative spectral amplitude A R (ω) and a relative spatial-spectral phase φ R (x,y,ω) for said Fourier transform in the frequency domain.

2. The method according to claim 1 , further comprising:
a step i) according to which the electromagnetic field of the reference beam in the first measuring plane is calculated while assuming that the electromagnetic field of the first sub-beam is homogeneous in the second plane of the first optic;
a step ii) according to which a reconstruction of the electromagnetic field of the first sub-beam in the second plane of the first optic is calculated, from the electromagnetic field of the reference beam in the first measuring plane, calculated previously, and a frequency interferogram;
a step iii) according to which the electromagnetic field of the reference beam in the first measuring plane is calculated using the reconstruction of the electromagnetic field of the first sub-beam in the second plane of the first optic, calculated previously.

3. The method according to claim 2 , wherein step ii) and step iii) are iterated until they converge towards a self-consistent solution such that:
the electromagnetic field of the characterized beam is reconstructed, and
the electromagnetic field of the reference beam in the first measuring plane is the result of the expansion of said electromagnetic field of the reference beam by the first optic.

4. The method according to claim 1 , wherein measuring the frequency spectrum of at least one part of the two-dimensional interference pattern comprises the following sub-steps:
arranging the spectrometer of the measuring system so that the inlet slit of the spectrometer is adapted to receive said at least one part of the two-dimensional interference pattern, said at least one part extending along the first spatial dimension of the first plane;
measuring, thanks to the spectrometer, the frequency spectrum of said at least one part of the two-dimensional interference pattern extending along the first spatial dimension of the first plane.

5. The method according to claim 1 , wherein measuring the frequency spectrum of at least one part of the two-dimensional interference pattern comprises the following sub-steps:
the measuring system comprising a plurality of optical fibres, arranging input ends of said plurality of optical fibres in the first plane according to a two-dimensional matrix, so as to be able to sample the two-dimensional interference pattern along a first spatial direction of the first plane and along a second spatial direction of the first plane;
arranging output ends of said plurality of optical fibres on the inlet slit of the spectrometer of the measuring system;
measuring, thanks to the spectrometer of the measuring system, the frequency spectrum of the sampling of the two-dimensional interference pattern along the first and second spatial directions of the first plane.

6. The method according to claim 1 , further comprising:
measuring the spatial phase at a frequency ω 0 of the reference beam φ ref (x,y,ω 0 ), said spatial phase φ ref (x,y,ω 0 ) being characteristic of a curvature of the wave front of the reference beam introduced by the first optic,
then subtracting the spatial-spectral phase

ω

ω
0

⁢

⁢

φ
ref

⁡

(

x
,
y
,

ω
0

)

from the relative spatial-spectral phase   R (x,y,ω), to obtain the corrected relative spatial-spectral phase of the characterized beam.

7. The method according to claim 1 , further comprising:
measuring the spatial-spectral phase of the first sub-beam φ ref (x,y,ω), corresponding to a reference spatial-spectral phase,
then subtracting said reference spatial-spectral phase φ ref (x,y,ω) from the relative spatial-spectral phase   R (x,y,ω), to obtain the absolute spatial-spectral phase of the characterized beam φ abs (x,y,ω).

8. The method according to claim 1 , further comprising:
measuring the spatial phase at a frequency ω 0 of the reference beam φ ref (x,y,ω 0 ), said spatial phase φ ref (x,y,ω 0 ) being characteristic of a curvature of the wave front of the reference beam introduced by the first optic,
measuring the spatial-spectral phase of the first sub-beam φ ref (x,y,ω), corresponding to a reference spatial-spectral phase,
then subtracting said reference spatial-spectral phase φ ref (x,y,ω) and spatial-spectral phase

ω

ω
0

⁢

⁢

φ
ref

⁡

(

x
,
y
,

ω
0

)

from the relative spatial-spectral phase φ R (x,y,ω), to obtain the corrected absolute spatial-spectral phase of the characterized beam.

9. A device for characterization

Assignees

• Commissariat Energie Atomique
• Commissariat Energie Atomique

Inventors

• Quere Fabien
• Gallet Valentin
• Pariente Gustave

Classifications

• G01J9/0215 Primary

  by shearing interferometric methods · CPC title

• G01J3/453

  by correlation of the amplitudes · CPC title

• G01J2003/4538

  Special processing · CPC title

• G01J11/00 Primary

  Measuring the characteristics of individual optical pulses or of optical pulse trains · CPC title