Device and method for characterization of a light beam to determine space time couplings in the light beam using a two-dimensional interference pattern formed by the light beam and a fourier transform

Patent metadata

Field	Value
Publication number	US-10107692-B2
Application number	US-201515319267-A
Country	US
Kind code	B2
Filing date	Jun 15, 2015
Priority date	Jun 16, 2014
Publication date	Oct 23, 2018
Grant date	Oct 23, 2018

Abstract

A characterization method of a light beam includes separating the light beam into first and second sub-beams; propagating the first and second sub-beams over first and second optics respectively; the first sub-beam, which forms a reference beam, and the second sub-beam, which forms a characterized beam, being separated by a time delay τ; recombining the reference and characterized beams so that they spatially interfere and form a two-dimensional interference pattern; measuring the pattern to obtain a temporal interferogram; calculating the Fourier transform in the frequency domain of a spatial point of the interferogram, the Fourier transform having a frequency central peak and first and second frequency side peaks; calculating the Fourier transform in the frequency domain for the first or second time side peaks calculating the spectral amplitude and the spatial-spectral phase for the first or second frequency side peak of the Fourier transform in the frequency domain.

First claim

The invention claimed is:

1. A method for characterization a light beam, comprising:
separating the light beam by means of a separator optic into a first sub-beam and a second sub-beam, the first sub-beam taking a first optical path and the second sub-beam taking a second optical path;
propagating the first sub-beam over a first optic and the second sub-beam over a second optic, the first sub-beam having an inhomogeneous electromagnetic field over the entire surface of the first optic, said inhomogeneous electromagnetic field resulting from an intensity or phase spatio-temporal coupling in the first sub-beam, said first and second optics being, thanks to a control system, respectively arranged in the first and second optical paths so that the first sub-beam on leaving the first optic, forming a reference beam, and the second sub-beam on leaving the second optic, forming a characterized beam, are separated by a time delay τ sweeping a time interval T 1 with a step P 1 ;
recombining the reference beam and the characterized beam by means of a recombiner optic in such a way that the reference and the characterized beams spatially interfere and form a two-dimensional interference pattern;
measuring said two-dimensional interference pattern by means of a measurement system, as a function of the time delay τ sweeping the time interval T 1 with the step P 1 between the reference beam and the characterized beam, in order to obtain a temporal interferogram;
calculating, by means of a calculator, a Fourier transform in the frequency domain of at least one spatial point of the temporal interferogram, said Fourier transform in the frequency domain having a frequency central peak and first and second frequency side peaks;
calculating, by means of a calculator, a spectral amplitude A R (ω) and a relative spatial-spectral phase φ R (x,y,ω) for one of said first and second frequency side peaks of said Fourier transform in the frequency domain.

2. The method according to claim 1 , further comprising:
a step i) according to which the electromagnetic field of the reference beam in a first measuring plane is calculated in assuming that the electromagnetic field of the first sub-beam is homogeneous in a second plane of the first optic, the two-dimensional interference pattern being measured in said first measuring plane;
a step ii) according to which a reconstruction of the electromagnetic field of the first sub-beam in the second plane of the first optic is calculated, from the electromagnetic field of the reference beam in the first measuring plane, calculated beforehand, and the temporal interferogram;
a step iii) according to which the electromagnetic field of the reference beam in the first measuring plane is calculated using the reconstruction of the electromagnetic field of the first sub-beam in the second plane of the first optic, calculated beforehand.

3. The method according to claim 2 , wherein step ii) and step iii) are iterated until step ii) and step iii) converge towards a self-consistent solution such that:
the electromagnetic field of the characterized beam is reconstructed, and
the electromagnetic field of the reference beam in the first measuring plane is the result of an expansion of said electromagnetic field of the reference beam by the first optic.

4. The method according to claim 1 , further comprising, for at least one time delay τ sweeping the time interval T 1 with the step P 1 , a step of calculation by the calculator of the intensity and of a spatial distribution of the intensity of the characterized beam.

5. The method according to claim 4 , further comprising, for each time delay τ sweeping the time interval T 1 with the step P 1 , said step of calculation by the calculator of the intensity and the spatial distribution of the intensity of the characterized beam.

6. The method according to claim 1 , further comprising:
a step of measuring a spatial phase at a frequency ω 0 of the reference beam φ ref (x,y,ω 0 ), said spatial phase φ ref (x,y,ω 0 ) being characteristic of a curvature of a wave front of the reference beam introduced by the first optic,
then a step of subtracting the spatial-spectral phase

ω

ω
0

⁢

φ
ref

⁡

(

x
,
y
,

ω
0

)

from the relative spatial-spectral phase φ R (x,y,ω), to obtain the corrected relative spatial-spectral phase of the characterized beam.

7. The method according to claim 1 , further comprising:
a step of measuring reference spatial-spectral phase of the first sub-beam φ ref (x,y,ω),
then a step of subtracting said reference spatial-spectral phase φ ref (x,y,ω) from the relative spatial-spectral phase φ R (x,y,ω), to obtain the absolute spatial-spectral phase of the characterized beam φ abs (x,y,ω).

8. The method according to claim 1 , further comprising:
a step of measuring a spatial phase at a frequency ω 0 of the reference beam φ ref (x,y,ω 0 ), said spatial phase φ ref (x,y,ω 0 ) being characteristic of the curvature of the wave front of the reference beam introduced by the first optic,
a step of measuring a reference spatial-spectral phase of the first sub-beam φ ref (x,y,ω 0 ),
then a step of subtracting said reference spatial-spectral phase φ ref (x,y,ω) and spatial-spectral phase

ω

ω
0

⁢

φ
ref

⁡

(

x
,
y
,

ω
0

)

from the relative spatial-spectral phase φ R (x,y,ω), to obtain the corrected absolute spatial-spectral phase of the characterized beam.

9. The device according to claim 1 , wherein the separator optic and the recombiner optic form a single and same optic ensuring the separation of the light beam on the one hand, and the recombination of the reference beam and the characterized beam on the other hand.

10. A device for characterization of a light beam, the device comprising:
a separator optic for the separation of the light beam into a first sub-beam and a second sub-beam, the separator optic defining a first optical path for the first sub-beam and a second optical path for the second sub-beam;
a first optic arranged in the first optical path, the first optic having a first radius of curvature in such a way that the first sub-beam leaving the first optic, forming a reference beam has wave fronts of a first type, the first sub-beam having an inhomogeneous electromagnetic field over the entire surface of the first optic, said inhomogeneous electromagnetic field resulting from an intensity or phase spatio-temporal coupling in the first sub-beam;
a second

Assignees

• Commissariat Energie Atomique
• Commissariat Energie Atomique

Inventors

• Quere Fabien
• Gallet Valentin
• Pariente Gustave

Classifications

• G01J9/0215 Primary

  by shearing interferometric methods · CPC title

• G01J11/00 Primary

  Measuring the characteristics of individual optical pulses or of optical pulse trains · CPC title

• G01J2003/4538

  Special processing · CPC title

• G01J3/453

  by correlation of the amplitudes · CPC title