Workpiece cutting method using dummy wafer to determine condition of cutting blade
US-9627260-B2 · Apr 18, 2017 · US
US10150198B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10150198-B2 |
| Application number | US-201615077469-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 22, 2016 |
| Priority date | Mar 23, 2015 |
| Publication date | Dec 11, 2018 |
| Grant date | Dec 11, 2018 |
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A method of inspecting a cutting blade having a cutting edge formed of abrasive grains of selected abrasive grain diameters which are bound by a bonding material, includes a cutting step of moving the chuck table and the cutting blade, which is being rotated at a high speed, relatively to each other along a direction perpendicular to an axis of rotation of a spindle, thereby forming a cut groove in the workpiece, and an inspecting step of capturing an image of the cut groove formed in the workpiece by image capturing means, and inspecting the state of the cut groove. The inspecting step examines whether or not the selected abrasive grain diameters are proper on the basis of any of the elements representing the size of an average chip, the number of chips, and the area of chips on both sides of the cut groove per unit length.
Opening claim text (preview).
What is claimed is: 1. A method of inspecting a cutting blade having a cutting edge formed of abrasive grains of selected abrasive grain diameters which are bound by a bonding material, the method comprising: a holding step of holding a workpiece on a chuck table; an installing step of installing the cutting blade on a tip end of a spindle having an axis of rotation along a first direction; a cutting step of moving the chuck table and the cutting blade, which is being rotated at a high speed, relatively to each other along a second direction perpendicular to the first direction, thereby forming a cut groove in the workpiece; and an inspecting step of capturing an image of the cut groove formed in the workpiece by image capturing means, and inspecting the state of the cut groove; wherein the inspecting step examines whether or not the selected abrasive grain diameters are proper on the basis of at least one of the following: size of an average chip, number of chips, and area of chips on both sides of the cut groove per unit length, from the captured image of the cut groove. 2. The method of inspecting a cutting blade according to claim 1 , further comprising: a basic data generating step of generating basic data based on at least one of the following: the size of an average chip, the number of chips, and the area of chips on both sides of the cut groove per unit length, which has been formed in the workpiece by the cutting blade having the cutting edge formed of the abrasive grains of the selected abrasive grain diameters, and whose state has been examined during the inspecting step; wherein the inspecting step examines whether or not the selected abrasive grain diameters are proper by comparing the state of the cut groove formed by the cutting step and the basic data with each other. 3. The method of inspecting a cutting blade according to claim 1 , wherein the cutting edge of the cutting blade includes an electroformed grinding stone formed of abrasive grains of diamond bound by nickel plating as a bonding material.
Cutting or separating of wafers, substrates or parts of devices · CPC title
Grinding, lapping or polishing of wafers, substrates or parts of devices · CPC title
using image analysis, e.g. for radar, infrared or array camera images · CPC title
of tools · CPC title
Detection of broken tools · CPC title
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