Pulsed electron beam current probe and methods of operating the same

Patent metadata

Field	Value
Publication number	US-10114065-B2
Application number	US-201615266273-A
Country	US
Kind code	B2
Filing date	Sep 15, 2016
Priority date	Dec 18, 2015
Publication date	Oct 30, 2018
Grant date	Oct 30, 2018

Abstract

An electron beam absorbed current measurement method includes connecting a conductive probe to a conductive structure of a sample, irradiating a pulsed electron beam along the conductive structure to generate an alternating current in the conductive probe, and determining a presence of a high resistance defect in the conductive structure based on at least one of a delay of a rising edge of the alternating current waveform and a decrease in amplitude of the alternating current waveform.

First claim

What is claimed is:

1. An electron beam absorbed current measurement method, comprising:
connecting a conductive probe to a conductive structure of a sample;
irradiating a pulsed electron beam at least once along the conductive structure to generate an alternating current in the conductive probe; and
determining a presence of a high resistance defect in the conductive structure based on a delay of a rising edge of the alternating current waveform;
wherein irradiating the pulsed electron beam at least once comprises irradiating the pulsed electron beam a plurality of times to perform plural scans along the conductive structure, wherein each of the plural scans uses a respective external capacitance electrically connected between ground and an input node of an amplifier electrically connected to the conductive probe, the respective external capacitance being different from external capacitances for other scans among the plural scans, and the differences among the external capacitances among the plural scans being provided by increase or decrease of the capacitance between ground and the input node of the amplifier.

2. An electron beam absorbed current measurement method, comprising:
connecting a conductive probe to a conductive structure of a sample;
irradiating a pulsed electron beam at least once along the conductive structure to generate an alternating current in the conductive probe; and
determining a presence of a high resistance defect in the conductive structure based on a delay of a rising edge of the alternating current waveform;
wherein the conductive structure comprises a conductive interconnect embedded in a dielectric matrix located over a substrate;
wherein the interconnect is electrically connected to semiconductor device located over the substrate; and
wherein irradiating the pulsed electron beam at least once comprises irradiating the pulsed electron beam a plurality of times to perform plural scans, wherein the conductive structure is tilted relative to the pulsed electron beam in at least one of the plural scans to determine a location of the high resistivity defect in a conductive via portion of the conductive interconnect as a function of height of the conductive via.

3. An electron beam absorbed current measurement method, comprising:
connecting a conductive probe to a conductive structure of a sample;
irradiating a pulsed electron beam at least once along the conductive structure to generate an alternating current in the conductive probe; and
determining a presence of a high resistance defect in the conductive structure based on a delay of a rising edge of the alternating current waveform;
wherein:
irradiating the pulsed electron beam at least once comprises irradiating the pulsed electron beam a plurality of times to perform plural scans;
the delay of the rising edge of the alternating current waveform is determined, for each of the plural scans, by measuring a signal rise time of the alternating current waveform; and
the signal rise time is measured, for each of the plural scans, by fitting the rising edge of the alternating current waveform to an exponential function and calculating, by running an automated program on a processor coupled with a memory, a time constant of a fitted curve that provides a best fit to the rising edge of the alternating current waveform.

Assignees

• Sandisk Technologies Llc

Inventors

• Toshima Norio

Classifications

• G01R31/2653 Primary

  using electron beams · CPC title

• G01R27/02

  Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant (by measuring phase angle only G01R25/00) · CPC title