Photosensitive resin composition and method for forming quantum dot pattern using the same

US10108089B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10108089-B2
Application numberUS-201414437047-A
CountryUS
Kind codeB2
Filing dateJun 23, 2014
Priority dateDec 30, 2013
Publication dateOct 23, 2018
Grant dateOct 23, 2018

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  5. First independent claim

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Abstract

Official abstract text for this publication.

The present disclosure provides a photosensitive resin composition and a method for forming a quantum dot pattern using the same. The photosensitive resin composition includes quantum dots which are dispersed in the photosensitive resin composition and each has a modification layer. The method for forming a quantum dot pattern includes coating, exposing and developing a photoresist to obtain the quantum dot pattern, wherein the photoresist is the above-mentioned photosensitive resin composition.

First claim

Opening claim text (preview).

What is claimed is: 1. A photosensitive resin composition, comprising quantum dots which are dispersed in the photosensitive resin composition and each has a modification layer, wherein the modification layer is an organic ligand layer, an inorganic compound layer or a polymer layer, the organic ligand is sodium dithiocarbamate proline, cysteamine, glutathione, cysteine or L-cysteine salt, the inorganic compound is sodium citrate, the polymer is polyacrylic acid or polyethylene glycol, and wherein the photosensitive resin composition comprises: 5 wt % to 45 wt % of alkali soluble resin, 0.5 wt % to 18 wt % of a photosensitive resin or monomer containing vinyl unsaturated double-bond, 3 wt % to 15 wt % of the quantum dots having the modification layer, 0.1 wt % to 3 wt % of a photoinitiator, 40 wt % to 85 wt % of a solvent, 0.1 wt % to 7 wt % of a silane coupling agent, and 0.1 wt % to 1 wt % of an additive. 2. The photosensitive resin composition according to claim 1 , wherein the quantum dots consist of semiconductor material A(II)B(VI) from Group II-VI or semiconductor material C(III)D(V) from Group III-V, the semiconductor material A(II)B(VI) includes compounds formed with elements Zn, Cd, Hg in Group II and elements S, Se and Te in Group VI, the semiconductor material C(III)D(V) includes compounds formed with elements B, Al, Ga and In in Group III and elements N, P, As and Sb in Group V. 3. The photosensitive resin composition according to claim 1 , wherein the quantum dots have a size of 1 nm to 10 nm and consist of semiconductor material A(II)B(VI) from Group II-VI or semiconductor material C(III)D(V) from Group III-V, the semiconductor material A(II)B(VI) includes compounds formed with elements Zn, Cd, Hg in Group II and elements S, Se and Te in Group VI, the semiconductor material C(III)D(V) includes compounds formed with elements B, Al, Ga and In in Group III and elements N, P, As and Sb in Group V. 4. The photosensitive resin composition according to claim 1 , wherein the photosensitive resin or monomer containing vinyl unsaturated double-bond is at least two selected from the group consisting of 1,6-hexanediol diacrylate, tripropanediol diacrylate, tetrapropanediol diacrylate, trimethylolpropane triacrylate, trimethylolpropane ethoxylate triacrylate, pentaerythritol tetraacrylate, tritrimethylolpropane tetraacrylate and dipentaerythritol pentaacrylate. 5. The photosensitive resin composition according to claim 1 , wherein the alkali soluble resin is aromatic (meth) acrylic acid half ester or a copolymer of styrene-maleic anhydride. 6. The photosensitive resin composition according to claim 1 , wherein the photoinitiator is at least one selected from the group consisting of: benzoyl, benzoyl methylether, benzoyl ethylether, benzoyl isopropyl ether, benzoyl butyl ether, (2,4,6-trimethylbenzoyl)diphenyl phosphine oxide, 2,2′-bis(2-dichlorophenyl)-4,4′,5,5′-tetraphenyl-1,2′-biimidazole, 2-ethyl anthraquinone, dibenzoyl, camphorquinone, methyl benzoylformate, 4-hydroxyphenyl dimethylsulfonium p-toluenesulfonate, triphenylsulfonium hexafluoroantimonate, dipenyliodonium hexafluoroantimonate, benzoyl toluenesulfonate, 2-hydroxy-2-methyl-1-phenylpropyl-1-ketone, diethoxy acetophenol, 2-methyl -2-morpholino-1-(4-methyl thiophenyl), 2-hydroxy-2-methyl-1-[4-(methylethylene)phenyl]propyl-1-ketone, 2,4-bis(trichloromethane)-6-(4-methoxyphenyl)-1,3,5-triazine, 2,4-bis(trichloromethyl)-6-piperonyl-1,3,5-triazine, 2,4-bis(trichloromethane)-6-[2-(5-methylfuran)-vinyl]-1,3,5-triazine and 2-phenyl benzyl-2-dimethylamine-1-(4-morpholine benzyl phenyl)butanone. 7. The photosensitive resin composition according to claim 1 , wherein the solvent is at least one selected from the group consisting of: formic acid, acetic acid, chloroform, acetone, butanone, fatty alcohol and ethylene glycol monomethyl ether, ethylene glycol monoethyl ether, ethylene glycol monopropyl ether, ethylene glycol monobutyl ether, diethylene glycol diethyl ether acetic acetate, methyl ethyl ketone, methyl isobutyl ketone, monomethyl ether glycol ester, gamma-butyrolactone, methylacetic-3-ethyl ether, butyl carbitol, butyl carbitol acetate, propanediol monomethyl ether, propanediol monomethyl ether acetate, cyclohexane, xylene and isopropyl alcohol. 8. The photosensitive resin composition according to claim 1 , wherein the additive is a dispersant or a flatting agent. 9. The photosensitive resin composition according to claim 1 , wherein the quantum dots are red quantum dots, yellow quantum dots, orange quantum dots, green quantum dots, blue quantum dots or a combination thereof. 10. A method for forming a quantum dot pattern, comprising: coating, exposing and developing a photoresist to obtain the quantum dot pattern, wherein the photoresist is the photosensitive resin composition according to claim 1 . 11. A photosensitive resin composition, comprising quantum dots which are dispersed in the photosensitive resin composition and each has a modification layer, wherein the modification layer is an inorganic compound layer and the inorganic compound layer is sodium citrate, and the quantum dots have a size of 1 nm to 10 nm and consist of semiconductor material C(III)D(V) formed with elements B, Al, Ga and In in Group III and element N in Group V. 12. A method for forming a quantum dot pattern, comprising: coating, exposing and developing a photoresist to obtain the quantum dot pattern, wherein the photoresist is the photosensitive resin composition according to claim 11 . 13. A photosensitive resin composition, comprising quantum dots which are dispersed in the photosensitive resin composition and each has a modification layer, wherein the modification layer is an organic ligand layer, an inorganic compound layer or a polymer layer, the organic ligand is sodium dithiocarbamate proline, cysteamine, glutathione, cysteine, L-cysteine salt or 3-mercapto-1,2-propanediol, the quantum dots have a size of 1 nm to 10 nm and consist of semiconductor material A(II)B(VI) from Group II-VI or semiconductor material C(III)D(V) from Group III-V, the semiconductor material A(II)B(VI) includes compounds formed with elements Zn, Cd, Hg in Group II and elements S, Se and Te in Group VI, the semiconductor material C(III)D(V) includes compounds formed with elements B, Al, Ga and In in Group III and elements P, As and Sb in Group V; wherein the photosensitive resin composition comprises: 5 wt % to 45 wt % of alkali soluble resin, 0.5 wt % to 18 wt % of a photosensitive resin or monomer containing vinyl unsaturated double-bond, 3 wt % to 15 wt % of the quantum dots having the modification layer, 0.1 wt % to 3 wt % of a photoinitiator, 40 wt % to 85 wt % of a solvent, 0.1 wt % to 7 wt % of a silane coupling agent, and 0.1 wt % to 1 wt % of an additive. 14. The photosensitive resin composition according to claim 13 , wherein the photosensitive resin or monomer containing vinyl unsaturated double-bond is at least two selected from the group consisting of 1,6-hexanediol diacrylate, tripropanediol diacrylate, tetrapropanediol diacrylate, trimethylolpropane triacrylate, trimethylolpropane ethoxylate triacrylate, pentaerythritol tetraacrylate, tritrimethylolpropane tetraacrylate and dipentaerythritol pentaacrylate. 15. The photosensitive resin composition according to claim 13 , wherein the alkali soluble resin is aromatic (meth) acrylic acid half ester or a copolymer of styrene-maleic anhydride. 16. The photosensitive resin composition according to claim 13 , wherein the photoinitiator is at least one selected from the group consisting of: benzoyl, benzoyl methylether, benzoyl ethylether,

Assignees

Inventors

Classifications

  • Exposure; Apparatus therefor (photographic printing apparatus for making copies G03B27/00) · CPC title

  • characterised by the solvents or agents facilitating spreading, e.g. tensio-active agents · CPC title

  • Imagewise removal using liquid means · CPC title

  • G03F7/031Primary

    Organic compounds not covered by group G03F7/029 · CPC title

  • with binders · CPC title

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What does patent US10108089B2 cover?
The present disclosure provides a photosensitive resin composition and a method for forming a quantum dot pattern using the same. The photosensitive resin composition includes quantum dots which are dispersed in the photosensitive resin composition and each has a modification layer. The method for forming a quantum dot pattern includes coating, exposing and developing a photoresist to obtain th…
Who is the assignee on this patent?
Boe Technology Group Co Ltd
What technology area does this patent fall under?
Primary CPC classification G03F7/031. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Oct 23 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).