Apparatus and methods for testing electronic devices

Patent metadata

Field	Value
Publication number	US-10082537-B2
Application number	US-201715669887-A
Country	US
Kind code	B2
Filing date	Aug 4, 2017
Priority date	May 30, 2014
Publication date	Sep 25, 2018
Grant date	Sep 25, 2018

Abstract

Apparatus and methods for testing electronic devices. In some embodiments, a fixture for testing an electronic device can include a support frame including a base and a pair of side supports implemented on respective sides of the base, with at least one of the side supports including a plurality of features for mounting of a test hardware, and the base being configured to support a first test board. The fixture can further include an upper support positioned above the support frame and configured to support a second test board. The fixture can further include a suspension mechanism implemented to couple the upper support to the side supports such that the upper support is movable relative to the support frame to accommodate a misalignment between the upper support and the base.

First claim

What is claimed is:

1. A fixture for testing an electronic device, comprising:
a support frame including a base and a pair of side supports implemented on respective sides of the base, at least one of the side supports including a plurality of features for mounting of a test hardware, the base configured to support a first test board;
an upper support positioned above the support frame and configured to support a second test board; and
a suspension mechanism implemented to couple the upper support to the side supports such that the upper support is movable relative to the support frame to accommodate a misalignment between the upper support and the base.

2. The fixture of claim 1 wherein the respective sides of the base on which the pair of side supports are implemented include opposite sides of the base.

3. The fixture of claim 1 wherein the plurality of features for mounting of a test hardware includes a plurality of mounting holes.

4. The fixture of claim 1 wherein the suspension mechanism includes a plurality of suspension elements implemented between the upper support and the side supports.

5. The fixture of claim 4 wherein the suspension elements include springs.

6. The fixture of claim 5 further comprising a guide post implemented with each spring and configured to allow adjustment of spacing between the upper support and the respective side support at the location of the spring to thereby accommodate the misalignment.

7. The fixture of claim 4 wherein at least some of the suspension elements are compressible along a direction having a component parallel with a vertical axis when the fixture is placed on a horizontal surface.

8. The fixture of claim 4 wherein at least some of the suspension elements are configured to compress when a force is applied to the upper support.

9. The fixture of claim 1 wherein the first test board includes a motherboard, and the second board includes a daughterboard.

10. The fixture of claim 9 wherein the base is configured to support a circular shaped motherboard.

11. The fixture of claim 9 wherein the upper support is configured to support a daughterboard having a device-under-test.

12. The fixture of claim 9 wherein the upper support is configured to support a daughterboard having a socket for receiving a device-under-test.

13. The fixture of claim 12 further comprising a securing plate coupled to the upper support such that the securing plate is positioned above the daughterboard when the daughterboard is mounted to the upper support and the fixture is placed on a horizontal surface.

14. The fixture of claim 13 wherein the securing plate defines an opening dimensioned to allow positioning of the device-under-test on the socket of the daughterboard when the daughterboard is mounted to the upper support and secured by the securing plate.

15. A system for testing electronic devices, comprising:
a test apparatus configured to perform a test on an electronic device;
a fixture for holding the electronic device when the test apparatus performs the test, the fixture having a support frame that includes a base and a pair of side supports implemented on respective sides of the base, at least one of the side supports including a plurality of features for mounting of a hardware to facilitate the test, the base configured to support a first test board, the fixture further including an upper support positioned above the support frame and configured to support a second test board, the fixture further including a suspension mechanism implemented to couple the upper support to the side supports such that the upper support is movable relative to the support frame to accommodate a misalignment between the upper support and the base; and
a user control panel interface configured to facilitate the test of the electronic device.

16. The system of claim 15 further comprising a control arm coupled to the test apparatus and configured to support the fixture.

17. The system of claim 15 further comprising an automated handler device configured to position the electronic device onto the fixture for the test.

18. The system of claim 17 wherein the user control panel interface is further configured to control the automated handler.

19. The system of claim 15 wherein the test apparatus is configured to perform one or more radio-frequency related tests.

20. A method for testing an electronic device, the method comprising:
providing a test apparatus configured to perform a test on the electronic device;
positioning the electronic device on a fixture having a support frame that includes a base and a pair of side supports implemented on respective sides of the base, at least one of the side supports including a plurality of features for mounting of a hardware to facilitate the test, the base configured to support a first test board, the fixture further including an upper support positioned above the support frame and configured to support a second test board;
accommodating a misalignment between the upper support and the base with a suspension mechanism implemented between the upper support and the side supports; and
performing the test on the electronic device.

Assignees

• Skyworks Solutions Inc

Inventors

• Tule Jesus Alejandro
• Carpio Bernard Binuya
• Gamez Jesus Alberto
• Murillo Daniel
• Flores Baca Adrian

Classifications

• G01R31/2889 Primary

  Interfaces, e.g. between probe and tester (G01R31/31905 and G01R1/07364 take precedence) · CPC title