Modular test fixture

Patent metadata

Field	Value
Publication number	US-9726718-B2
Application number	US-201414291399-A
Country	US
Kind code	B2
Filing date	May 30, 2014
Priority date	May 30, 2014
Publication date	Aug 8, 2017
Grant date	Aug 8, 2017

Abstract

A modular test fixture for testing electronic devices. In some embodiments, such a modular test fixture can include a support frame having a base, and a substrate having a plurality of test components, with the substrate being coupled to the base. The modular test fixture can further include an upper support positioned above the support frame, and a plurality of suspension elements that each extend between the upper support and the support frame. The suspension elements can couple the upper support to the support frame, and the upper support can be movable relative to the support frame. The modular test fixture can further include a daughterboard module coupled to the upper support, and a daughterboard having a test device interface. The daughterboard can be coupled to the daughterboard module and be operatively coupled to the plurality of test components.

First claim

What is claimed is:

1. A modular test fixture for testing an electronic device, comprising:
a support frame including a base and a pair of side supports implemented on opposite sides of the base, at least one of the side supports including a plurality mounting holes to allow mounting of a test hardware;
a motherboard coupled to the base and having a plurality of test components
an upper support positioned above the support frame;
a plurality of suspension elements implemented to couple the upper support to the side supports of the support frame such that the upper support is movable relative to the support frame to accommodate a misalignment between the upper support and the base; and
a daughterboard module supported by the upper support.

2. The modular test fixture of claim 1 further comprising a plurality of guide posts implemented on the pair of side supports such that the upper support is movable along the plurality of guide posts.

3. The modular test fixture of claim 1 wherein the upper support is movable along a single axis.

4. The modular test fixture of claim 1 wherein the suspension elements are springs.

5. The modular test fixture of claim 1 wherein the suspension elements are compressible along a direction having a component parallel with a vertical axis.

6. The modular test fixture of claim 1 wherein the suspension elements are configured to compress when a force is applied to the daughterboard module.

7. The modular test fixture of claim 1 further comprising a securing plate positioned adjacent the daughterboard module and coupled to the upper support.

8. A test fixture, comprising:
a support frame including a base and a pair of side supports implemented on opposite sides of the base, at least one of the side supports including a plurality mounting holes to allow mounting of a test hardware, the base configured to support a motherboard having a plurality of test components;
an upper support positioned above the support frame and configured to support a daughterboard module; and
a plurality of suspension elements implemented between the side supports and the upper support, the suspension elements configured to compress when a force is applied to the upper support to thereby accommodate a misalignment between the base and the upper support.

9. The test fixture of claim 8 wherein the suspension elements include springs.

10. The test fixture of claim 8 wherein the suspension elements are configured to compress along a direction having a component parallel with a vertical axis.

11. The test fixture of claim 8 further comprising a daughterboard module coupled to the upper support.

12. A method for testing an electronic device, the method comprising:
positioning a modular test fixture for placement of an electronic device by an automated device placement system, the modular test fixture including a base and a pair of side supports implemented on opposite sides of the base, a test hardware mounted on at least one of the side supports, and a daughterboard module;
placing the electronic device in the daughterboard module using the automated system;
moving the daughterboard to align with the automated system for placement of the electronic device, a plurality of suspension elements used to accommodate a misalignment of the daughterboard resulting from the moving of the daughterboard; and
performing a testing operation on the electronic device, the testing operation facilitated by the test hardware.

13. The method of claim 12 further comprising the step of removing the electronic device from the daughterboard module with the automated system.

14. The test fixture of claim 8 wherein the support frame further includes a horizontal support that extends between the pair of side supports to add rigidity to the support frame.

15. The test fixture of claim 14 wherein the horizontal support is implemented at or near top portions of the pair of side supports.

16. The test fixture of claim 8 further comprising a plurality of guide posts implemented on the pair of side supports such that the upper support is movable along the plurality of guide posts.

17. The test fixture of claim 8 wherein the upper support includes a plurality of standoff features each configured to support a security plate over the upper support.

18. The test fixture of claim 17 wherein the upper support further includes a positioning element implemented on each of the standoff features, the positioning elements configured to facilitate positioning of an automated handler over the upper support.

19. The test fixture of claim 18 wherein the base of the support frame is configured to be coupled to a control arm, such that the misalignment between the base and the upper support includes a misalignment between the control arm and the automated handler.

Assignees

• Skyworks Solutions Inc

Inventors

• Tule Jesus Alejandro
• Carpio Bernard Binuya
• Gamez Jesus Alberto
• Murillo Daniel
• Flores Baca Adrian

Classifications

• G01R31/2889 Primary

  Interfaces, e.g. between probe and tester (G01R31/31905 and G01R1/07364 take precedence) · CPC title