Semiconductor material and method of production
US-9306111-B2 · Apr 5, 2016 · US
US10079321B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10079321-B2 |
| Application number | US-201615198795-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jun 30, 2016 |
| Priority date | Jun 30, 2016 |
| Publication date | Sep 18, 2018 |
| Grant date | Sep 18, 2018 |
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Techniques for increasing grain size in AZTSSe absorber materials are provided. In one aspect, a method for forming an absorber film on a substrate includes: contacting the substrate with an Ag source, a Zn source, a Sn source, and an S source and/or an Se source under conditions sufficient to form the absorber film on the substrate having a target composition of: Ag X Zn Y Sn(S,Se) Z , wherein 1.7<x<2.2, 0.9<y<1.3, and 3.5<z<4.5, and including an amount of the Ag source that is from about 10% to about 30% greater than is needed to achieve the target composition; annealing the absorber film; and removing excess Ag from the absorber film. A solar cell and method for fabrication thereof are also provided.
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What is claimed is: 1. A method for forming an absorber film on a substrate, comprising: contacting the substrate with an Ag source, a Zn source, a Sn source, and at least one of an S source and an Se source under conditions sufficient to form the absorber film on the substrate having a target composition of: Ag X Zn Y Sn(S,Se) Z , wherein 1.7<x<2.2, 0.9<y<1.3, and 3.5<z<4.5, and including an amount of the Ag source that is from about 10% to about 30% greater than is needed to achieve the target composition; annealing the absorber film; and removing excess Ag, if any, from the absorber film, wherein the excess Ag forms a secondary phase, and wherein the removing is performed after the annealing to remove the secondary phase from grain boundaries of the absorber film. 2. The method of claim 1 , wherein the conditions comprise a temperature, a duration, and a pressure. 3. The method of claim 2 , wherein the temperature is from about 10° C. to about 450° C. 4. The method of claim 2 , wherein the duration is from about 1 minute to about 200 minutes. 5. The method of claim 2 , wherein the pressure is from about 1×10 −5 Torr to about 5×10 −10 Torr. 6. The method of claim 1 , wherein the annealing is performed at a temperature of from about 430° C. to about 550° C. 7. The method of claim 1 , wherein the annealing is performed for a duration of from about 20 seconds to about 10 minutes. 8. The method of claim 1 , wherein the secondary phase is selected from the group consisting of: Ag 2 Se, Ag 6 SnSe 8 , and combinations thereof. 9. The method of claim 1 , wherein the excess Ag is removed using an etchant selected from the group consisting of: potassium cyanide, sodium cyanide, and combinations thereof. 10. The method of claim 1 , wherein the absorber film has an average grain size of from about 0.5 micrometers to about 4 micrometers. 11. The method of claim 1 , further comprising: measuring composition of the absorber film using Particle Induced X-ray Emission (PIXE) techniques. 12. A method of forming a solar cell, comprising: contacting a conducting substrate with an Ag source, a Zn source, a Sn source, and at least one of an S source and an Se source under conditions sufficient to form the absorber film on the conducting substrate having a target composition of: Ag X Zn Y Sn(S,Se) Z , wherein 1.7<x<2.2, 0.9<y<1.3, and 3.5<z<4.5, and including an amount of the Ag source that is from about 10% to about 30% greater than is needed to achieve the target composition; annealing the absorber film; removing excess Ag, if any, from the absorber film, wherein the excess Ag forms a secondary phase, and wherein the removing is performed after the annealing to remove the secondary phase from grain boundaries of the absorber film; forming a buffer layer on the absorber layer; and forming a transparent front contact on the buffer layer. 13. The method of claim 12 , wherein the conditions comprise a temperature of from about 10° C. to about 450° C., a duration of from about 1 minute to about 200, and a pressure of from about 1×10 −5 Torr to about 5×10 −10 Torr. 14. The method of claim 12 , wherein the annealing is performed at a temperature of from about 430° C. to about 550° C., for a duration of from about 20 seconds to about 10 minutes. 15. The method of claim 12 , wherein the secondary phase is selected from the group consisting of: Ag 2 Se, Ag 6 SnSe 8 , and combinations thereof. 16. The method of claim 12 , wherein the excess Ag is removed using an etchant selected from the group consisting of: potassium cyanide, sodium cyanide, and combinations thereof. 17. The method of claim 12 , wherein the absorber film has an average grain size of from about 0.5 micrometers to about 4 micrometers.
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