Calibration apparatus and calibration method

US10071458B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10071458-B2
Application numberUS-201615353913-A
CountryUS
Kind codeB2
Filing dateNov 17, 2016
Priority dateNov 27, 2015
Publication dateSep 11, 2018
Grant dateSep 11, 2018

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

An object of the invention is to provide a calibration apparatus which enables the pressing force of the polishing pad to be adjusted by a simple method without the need of removing a stage on which a substrate can be placed. One embodiment of the invention provides a calibration apparatus for a bevel polishing system for polishing a bevel portion of a substrate, comprising: a load measuring device capable of measuring a pressing load from a polishing pad of the bevel polishing system; and a base plate capable of having the load measuring device placed thereon, wherein the base plate is capable of being fixed on a vacuum suction table which is capable of having a substrate placed thereon.

First claim

Opening claim text (preview).

What is claimed is: 1. A calibration apparatus for use in a bevel polishing apparatus, the bevel polishing apparatus being configured to polish a bevel portion of a substrate, said calibration apparatus comprising: a load measuring device configured to measure a pressing load from a polishing pad of the bevel polishing apparatus; and a base plate configured to be fixed on a vacuum suction table configured to hold the substrate placed thereon, the base plate having the load measuring device placed thereon. 2. The calibration apparatus according to claim 1 , wherein the load measuring device includes a force gauge having a measuring shaft. 3. The calibration apparatus according to claim 2 , wherein the load measuring device includes a load bearing member configured to be fixed to the measuring shaft of the force gauge, the load bearing member including a load bearing surface configured to receive the pressing load. 4. The calibration apparatus according to claim 3 , further comprising a spacer configured to adjust a position of the load bearing surface relative to the vacuum suction table. 5. The calibration apparatus according to claim 3 , wherein the load bearing member includes a bracket. 6. The calibration apparatus according to claim 5 , wherein the load bearing member includes a pad formed by a resin and adapted to be fixed to the bracket. 7. The calibration apparatus according to claim 1 , wherein the load measuring device includes a mounting plate, the mounting plate being configured to be fixed to the base plate. 8. The calibration apparatus according to claim 7 , wherein the mounting plate includes an adjustment screw configured to adjust a position of the mounting plate relative to the base plate. 9. A bevel polishing apparatus configured to polish a bevel portion of a substrate, the bevel polishing apparatus comprising: a vacuum suction table configured to hold a substrate placed thereon; a plurality of polishing heads arranged along an outer periphery of the vacuum suction table, each polishing head of the plurality of polishing heads including a polishing pad adapted to be pressed toward a bevel portion of the substrate; and a calibration apparatus, the calibration apparatus including: a load measuring device configured to measure a pressing load from a polishing pad of the bevel polishing apparatus; and a base plate configured to be fixed on a vacuum suction table configured to hold the substrate placed thereon, the base plate having the load measuring device placed thereon. 10. The bevel polishing apparatus according to claim 9 , wherein the load measuring device includes a force gauge having a measuring shaft. 11. The bevel polishing apparatus according to claim 10 , wherein the load measuring device includes a load bearing member configured to be fixed to the measuring shaft of the force gauge, the load bearing member including a load bearing surface configured to receive the pressing load. 12. The bevel polishing apparatus according to claim 11 , wherein the calibration apparatus further comprises a spacer configured to adjust a position of the load bearing surface relative to the vacuum suction table. 13. The bevel polishing apparatus according to claim 11 , wherein the load bearing member includes a bracket. 14. The bevel polishing apparatus according to claim 13 , wherein the load bearing member includes a pad formed by a resin and adapted to be fixed to the bracket. 15. The bevel polishing apparatus according to claim 9 , wherein the load measuring device includes a mounting plate configured to be fixed to the base plate. 16. The bevel polishing apparatus according to claim 15 , wherein the mounting plate includes an adjustment screw configured to adjust a position of the mounting plate relative to the base plate. 17. A calibration method for a bevel polishing apparatus, comprising the steps of: providing a bevel polishing apparatus configured to polish a bevel portion of a substrate, the bevel polishing apparatus including: a vacuum suction table configured to hold the substrate placed thereon; and a plurality of polishing heads arranged along an outer periphery of the vacuum suction table, each polishing head of the plurality of polishing heads including a polishing pad adapted to be pressed toward the bevel portion of the substrate; sucking a base plate onto the vacuum suction table, the base plate being configured to have a load measuring device placed thereon; fixing the load measuring device to the base plate; rotating the vacuum suction table so as to position the load measuring device relative to the polishing head; applying a pressing force from the polishing pad to a load bearing surface of the load measuring device; and obtaining a correlation between a measured value of the load measuring device when the pressing force is applied and a set load of the polishing head. 18. The calibration method according to claim 17 , wherein the step of fixing the load measuring device to the base plate includes a step of providing a spacer between the load bearing surface of the load measuring device and the base plate, to thereby adjust a position of the load bearing surface relative to the vacuum suction table. 19. The calibration method according to claim 18 , wherein the step of sucking the base plate onto the vacuum suction table includes temporarily fixing a mounting plate of the load measuring device to the base plate.

Assignees

Inventors

Classifications

  • Frames; Beds; Carriages · CPC title

  • Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation (B24B33/06, B24B37/005 take precedence; if applicable to other machine tools, B23Q15/00 - B23Q17/00 take precedence) · CPC title

  • B24B37/005Primary

    Control means for lapping machines or devices · CPC title

  • of thin, brittle parts, e.g. semiconductors, wafers · CPC title

  • B24B21/006Primary

    for special purposes, e.g. for television tubes, car bumpers · CPC title

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What does patent US10071458B2 cover?
An object of the invention is to provide a calibration apparatus which enables the pressing force of the polishing pad to be adjusted by a simple method without the need of removing a stage on which a substrate can be placed. One embodiment of the invention provides a calibration apparatus for a bevel polishing system for polishing a bevel portion of a substrate, comprising: a load measuring de…
Who is the assignee on this patent?
Ebara Corp
What technology area does this patent fall under?
Primary CPC classification B24B37/005. Mapped technology areas include Operations & Transport.
When was this patent published?
Publication date Tue Sep 11 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).