COG Dielectric Composition For Use With Nickel Electrodes
US-2017200557-A1 · Jul 13, 2017 · US
US10065894B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10065894-B2 |
| Application number | US-201615310155-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jun 29, 2016 |
| Priority date | Aug 5, 2015 |
| Publication date | Sep 4, 2018 |
| Grant date | Sep 4, 2018 |
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Electronic devices are produced from dielectric compositions comprising a mixture of precursor materials that, upon firing, forms a dielectric material comprising a barium-strontium-titanium-tungsten-silicon oxide.
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The invention claimed is: 1. A composition comprising a mixture that, upon firing, forms a dielectric material comprising: from about 20.0 wt % to about 45.0 wt % BaO; from about 10.0 wt % to about 38.0 wt % SrO; from about 21.0 wt % to about 47.0 wt % TiO 2 ; from about 0.1 wt % to about 25.0 wt % WO 3 ; and from about 0.01 wt % to about 9.0 wt % SiO 2 . 2. The composition according to claim 1 , wherein the dielectric material further comprises at least one selected from the group consisting of: from about 0.1 to about 15.0 wt % ZnO; from about 0.1 to about 4.0 wt % B 2 O 3 ; from about 0.01 to about 2.0 wt % LiF; from about 0.01 to about 2.0 wt % CuO; and from about 0.01 to about 2.0 wt % of at least one selected from the group consisting of MnO 2 , Mn 2 O 3 , and MnO. 3. The composition according to claim 2 , wherein the dielectric material comprises: from about 20.0 wt % to about 45.0 wt % BaO; from about 10.0 wt % to about 38.0 wt % SrO; from about 21.0 wt % to about 47.0 wt % TiO 2 ; from about 0.1 wt % to about 25.0 wt % WO 3 ; from about 0.01 wt % to about 9.0 wt % SiO 2 ; from about 0.1 to about 15.0 wt % ZnO; from about 0.1 to about 4.0 wt % B 2 O 3 ; from about 0.01 to about 2.0 wt % LiF; from about 0.01 to about 2.0 wt % CuO; and from about 0.01 to about 2.0 wt % of at least one selected from the group consisting of MnO 2 , Mn 2 O 3 , and MnO. 4. A method of forming an electronic component comprising: applying the composition of claim 3 to a substrate; and firing the substrate at a temperature sufficient to sinter the composition. 5. The method of claim 4 , wherein the firing is conducted at a temperature of from about 800° C. to about 1000° C. 6. An electric or electronic component comprising, prior to firing, the composition of claim 2 , together with a conductive paste comprising: 60-90 wt % Ag+Pd+Pt+Au, 1-10 wt % of an additive selected from the group consisting of silicides, carbides, nitrides, and borides of transition metals, 0.5-10 wt % of at least one glass frit, and 10-40 wt % of an organic portion. 7. A method of forming an electronic component comprising: applying the composition of claim 2 to a substrate; and firing the substrate at a temperature sufficient to sinter the composition. 8. The method of claim 7 , wherein the firing is conducted at a temperature of from about 800° C. to about 1000° C. 9. An electric or electronic component comprising, prior to firing, the dielectric paste of claim 3 , together with a conductive paste comprising: 60-90 wt % Ag+Pd+Pt+Au, 1-10 wt % of an additive selected from the group consisting of silicides, carbides, nitrides, and borides of transition metals, 0.5-10 wt % of at least one glass frit, and 10-40 wt % of an organic portion. 10. A method of forming an electronic component comprising: applying the composition of claim 1 to a substrate; and firing the substrate at a temperature sufficient to sinter the composition. 11. The method of claim 10 , wherein the firing is conducted at a temperature of from about 800° C. to about 1000° C. 12. The composition according to claim 1 , wherein the mixture comprises at least one selected from the group consisting of: from about 0.1 to about 17.0 wt % BaCO 3 ; from about 0.1 to about 15.0 wt % ZnO; from about 0.1 to about 6.0 wt % H 3 BO 3 ; from about 0.01 to about 2.0 wt % LiF; from about 0.01 to about 2.0 wt % CuO; and from about 0.01 to about 2.0 wt % of at least one selected from the group consisting of MnO 2 , Mn 2 O 3 , and MnO. 13. The composition according to claim 12 , comprising: from about 20.0 wt % to about 45.0 wt % BaO; from about 10.0 wt % to about 38.0 wt % SrO; from about 21.0 wt % to about 47.0 wt % TiO 2 ; from about 0.1 wt % to about 25.0 wt % WO 3 ; from about 0.01 wt % to about 9.0 wt % SiO 2 ; from about 0.1 to about 17.0 wt % BaCO 3 ; from about 0.1 to about 15.0 wt % ZnO; from about 0.1 to about 6.0 wt % H 3 BO 3 ; from about 0.01 to about 2.0 wt % LiF; from about 0.01 to about 2.0 wt % CUD; and from about 0.01 to about 2.0 wt % of at least one selected from the group consisting of MnO 2 , Mn 2 O 3 , and MnO. 14. A method of forming an electronic component comprising: applying the composition of claim 13 to a substrate; and firing the substrate at a temperature sufficient to sinter the composition. 15. A method of forming an electronic component comprising: applying the composition of claim 12 to a substrate; and firing the substrate at a temperature sufficient to sinter the composition. 16. The method of claim 15 , wherein the firing is conducted at a temperature of from about 800° C. to about 1000° C. 17. An electric or electronic component comprising, prior to firing, the composition of claim 1 , together with a conductive paste comprising: 60-90 wt % Ag+Pd+Pt+Au, 1-10 wt % of an additive selected from the group consisting of silicides, carbides, nitrides, and borides of transition metals, 0.5-10 wt % of at least one glass frit, and 10-40 wt % of an organic portion. 18. The composition according to claim 1 , wherein the mixture comprises at least one of oxides, carbonates, nitrates, sulfates, and phosphates. 19. A lead-free and cadmium-free dielectric paste comprising a solids portion, wherein the solids portion comprises: from about 20.0 wt % to about 45.0 wt % BaO; from about 10.0 wt % to about 38.0 wt % SrO; from about 21.0 wt % to about 47.0 wt % TiO 2 ; from about 0.1 wt % to about 25.0 wt % WO 3 ; from about 0.01 wt % to about 9.0 wt % SiO 2 ; from about 0.1 to about 17.0 wt % BaCO 3 ; from about 0.1 to about 15.0 wt % ZnO; from about 0.1 to about 6.0 wt % H 3 BO 3 ; from about 0.01 to about 2.0 wt % LiF; from about 0.01 to about 2.0 wt % CUD; and from about 0.01 to about 2.0 wt % of at least one selected from the group consisting of MnO 2 , Mn 2 O 3 , and MnO. 20. A method of forming an electronic component comprising: applying the dielectric paste of claim 19 to a substrate; and firing the substrate at a temperature sufficient to sinter the dielectric paste. 21. The method of claim 20 , wherein the firing is conducted at a temperature of from about 800° C. to about 1000° C.
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