Thin-film ceramic capacitor

US10062516B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10062516-B2
Application numberUS-201715634327-A
CountryUS
Kind codeB2
Filing dateJun 27, 2017
Priority dateNov 23, 2016
Publication dateAug 28, 2018
Grant dateAug 28, 2018

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A thin-film ceramic capacitor includes: a body in which a plurality of dielectric layers and first and second electrode layers are alternately disposed on a substrate; and first and second electrode pads disposed on an external surface of the body. The dielectric layer contains a mixed phase of a perovskite phase having ferroelectric properties and a pyrochlore phase having paraelectric properties, the pyrochlore phase being disposed on interfaces between the dielectric layers and the first and second electrode layers in lower portions of the dielectric layers.

First claim

Opening claim text (preview).

What is claimed is: 1. A thin-film ceramic capacitor comprising: a body in which a plurality of dielectric layers and first and second electrode layers are alternately disposed on a substrate; and first and second electrode pads disposed on an external surface of the body, wherein the dielectric layer contains a mixed phase of a perovskite phase having ferroelectric properties and a pyrochlore phase having paraelectric properties, the pyrochlore phase being disposed on interfaces between the dielectric layers and the first and second electrode layers in lower portions of the dielectric layers with respect to the substrate. 2. The thin-film ceramic capacitor of claim 1 , wherein the pyrochlore phase has a triangular pyramid shape. 3. The thin-film ceramic capacitor of claim 1 , wherein in a single dielectric layer, a volume fraction of the perovskite phase having the ferroelectric properties, based on an overall volume of the single dielectric layer, is 50 to 97 vol %. 4. The thin-film ceramic capacitor of claim 1 , wherein the perovskite phase having the ferroelectric properties has a structure in which the perovskite phase is doped with niobium (Nb). 5. The thin-film ceramic capacitor of claim 1 , wherein the pyrochlore phase is RE 2 Ti 2 O 7 , where RE is a rare earth element. 6. The thin-film ceramic capacitor of claim 1 , wherein a temperature coefficient of capacitance (TCC) of the mixed phase of the perovskite phase having the ferroelectric properties and the pyrochlore phase having the paraelectric properties is within 20% from a temperature range from −55° C. to 125° C. 7. The thin-film ceramic capacitor of claim 1 , wherein among the plurality of vias, a first via connects the first electrode layer and the first electrode pad to each other and penetrates from one surface of the body to a lowermost first electrode layer adjacent to the substrate. 8. The thin-film ceramic capacitor of claim 1 , wherein among the plurality of vias, a second via connects the second electrode layer and the second electrode pad to each other and penetrates from one surface of the body to a lowermost second electrode layer adjacent to the substrate. 9. The thin-film ceramic capacitor of claim 1 , wherein the first via is connected to substantially all of the first electrode layers disposed in the body. 10. The thin-film ceramic capacitor of claim 1 , wherein the second via is connected to substantially all of the second electrode layers disposed in the body. 11. The thin-film ceramic capacitor of claim 1 , wherein an insulating layer is disposed on a second electrode layer exposed in the first via and a first electrode layer exposed in the second via. 12. The thin-film ceramic capacitor of claim 1 , wherein in the plurality of vias, a width of each step is increased in a direction from the substrate to an upper portion of the body.

Assignees

Inventors

Classifications

  • Electrodes · CPC title

  • based on alkaline earth titanates · CPC title

  • H01G4/33Primary

    Thin- or thick-film capacitors {(thin- or thick-film circuits; capacitors without a potential-jump or surface barrier specially adapted for integrated circuits, details thereof, multistep manufacturing processes therefor)} · CPC title

  • leading through the housing, i.e. lead-through · CPC title

  • Terminals · CPC title

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What does patent US10062516B2 cover?
A thin-film ceramic capacitor includes: a body in which a plurality of dielectric layers and first and second electrode layers are alternately disposed on a substrate; and first and second electrode pads disposed on an external surface of the body. The dielectric layer contains a mixed phase of a perovskite phase having ferroelectric properties and a pyrochlore phase having paraelectric propert…
Who is the assignee on this patent?
Samsung Electro Mech
What technology area does this patent fall under?
Primary CPC classification H01G4/33. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Aug 28 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 5 related publications on this page (citations in our corpus or others sharing the same primary CPC).