MEMS structure with graphene component

US10053358B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10053358-B2
Application numberUS-201615252637-A
CountryUS
Kind codeB2
Filing dateAug 31, 2016
Priority dateAug 31, 2016
Publication dateAug 21, 2018
Grant dateAug 21, 2018

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A microelectromechanical systems (MEMS) structure includes a substrate, an epitaxial polysilicon cap located above the substrate, a first cavity portion defined between the substrate and the epitaxial polysilicon cap, and a first graphene component having at least one graphene surface immediately adjacent to the first cavity portion.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method of forming a microelectromechanical systems (MEMS) structure, comprising: providing a substrate; forming a first portion of an epitaxial polysilicon cap above the substrate; forming a first cavity portion above the substrate by vapor release through at least one vent extending through the first portion of the epitaxial polysilicon cap; converting a silicon carbide portion immediately adjacent to the first cavity portion to graphene using a hydrogen bake; and sealing the at least one vent with a second portion of the epitaxial polysilicon cap after converting the silicon carbide portion. 2. The method of claim 1 , wherein: providing the substrate comprises providing a silicon on insulator (SOI) wafer; and the method further comprises, prior to forming the first portion of the epitaxial polysilicon cap: trenching the SOI wafer to expose a silicon portion of the SOI wafer; and conformally depositing the silicon carbide portion on the exposed silicon portion. 3. The method of claim 2 , wherein trenching the SOI wafer comprises: deep reactive ion etching a trench completely through a silicon layer of the SOI wafer, the method further comprising filling the trench with a sacrificial oxide portion after conformally depositing the silicon carbide portion, wherein forming the first cavity portion comprises: using a hydrofluoric acid vapor to expose the silicon carbide portion. 4. The method of claim 3 , wherein: conformally depositing the silicon carbide portion comprises conformally depositing the silicon carbide portion on a scalloped surface of the exposed silicon portion; and converting the silicon carbide portion immediately adjacent to the first cavity portion to graphene using the hydrogen bake further comprises converting the silicon carbide portion to a scalloped graphene portion. 5. The method of claim 2 , wherein: the hydrogen bake is conducted in an epitaxial reactor; and the second portion of the epitaxial polysilicon cap is deposited in the epitaxial reactor. 6. The method of claim 1 , wherein: providing the substrate comprises providing a silicon carbide layer on an insulator layer; and the silicon carbide portion is a portion of the silicon carbide layer. 7. The method of claim 6 , further comprising, prior to forming the first portion of the epitaxial polysilicon cap: deep reactive ion etching a trench completely through the silicon carbide layer to expose the silicon carbide portion; and filling the trench with a sacrificial oxide portion, wherein forming the first cavity portion above the substrate by vapor release through the at least one vent extending through the first portion of the epitaxial polysilicon cap further comprises: using a hydrofluoric acid vapor to re-expose the silicon carbide portion. 8. The method of claim 7 , wherein: converting the silicon carbide portion immediately adjacent to the first cavity portion to graphene using the hydrogen bake further comprises completely converting the silicon carbide layer to graphene. 9. The method of claim 8 wherein forming the first cavity portion further comprises releasing a segment of the silicon carbide layer. 10. The method of claim 8 , wherein: the hydrogen bake is conducted in an epitaxial reactor; and the second portion of the epitaxial polysilicon cap is deposited in the epitaxial reactor.

Assignees

Inventors

Classifications

  • Accelerometers · CPC title

  • Depositing an anti-stiction or passivation coating, e.g. on the elastic or moving parts · CPC title

  • Methods for avoiding stiction when the device is in use not provided for in groups B81C1/00968 - B81C1/00976 · CPC title

  • Growing or depositing of a covering layer · CPC title

  • Processes for functionalising a surface, e.g. provide the surface with specific mechanical, chemical or biological properties · CPC title

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Frequently asked questions

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What does patent US10053358B2 cover?
A microelectromechanical systems (MEMS) structure includes a substrate, an epitaxial polysilicon cap located above the substrate, a first cavity portion defined between the substrate and the epitaxial polysilicon cap, and a first graphene component having at least one graphene surface immediately adjacent to the first cavity portion.
Who is the assignee on this patent?
Bosch Gmbh Robert
What technology area does this patent fall under?
Primary CPC classification B81B3/0005. Mapped technology areas include Operations & Transport.
When was this patent published?
Publication date Tue Aug 21 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 3 related publications on this page (citations in our corpus or others sharing the same primary CPC).