MEMS Device and Method for Manufacturing the MEMS Device
US-2015381078-A1 · Dec 31, 2015 · US
US10053358B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10053358-B2 |
| Application number | US-201615252637-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 31, 2016 |
| Priority date | Aug 31, 2016 |
| Publication date | Aug 21, 2018 |
| Grant date | Aug 21, 2018 |
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A microelectromechanical systems (MEMS) structure includes a substrate, an epitaxial polysilicon cap located above the substrate, a first cavity portion defined between the substrate and the epitaxial polysilicon cap, and a first graphene component having at least one graphene surface immediately adjacent to the first cavity portion.
Opening claim text (preview).
The invention claimed is: 1. A method of forming a microelectromechanical systems (MEMS) structure, comprising: providing a substrate; forming a first portion of an epitaxial polysilicon cap above the substrate; forming a first cavity portion above the substrate by vapor release through at least one vent extending through the first portion of the epitaxial polysilicon cap; converting a silicon carbide portion immediately adjacent to the first cavity portion to graphene using a hydrogen bake; and sealing the at least one vent with a second portion of the epitaxial polysilicon cap after converting the silicon carbide portion. 2. The method of claim 1 , wherein: providing the substrate comprises providing a silicon on insulator (SOI) wafer; and the method further comprises, prior to forming the first portion of the epitaxial polysilicon cap: trenching the SOI wafer to expose a silicon portion of the SOI wafer; and conformally depositing the silicon carbide portion on the exposed silicon portion. 3. The method of claim 2 , wherein trenching the SOI wafer comprises: deep reactive ion etching a trench completely through a silicon layer of the SOI wafer, the method further comprising filling the trench with a sacrificial oxide portion after conformally depositing the silicon carbide portion, wherein forming the first cavity portion comprises: using a hydrofluoric acid vapor to expose the silicon carbide portion. 4. The method of claim 3 , wherein: conformally depositing the silicon carbide portion comprises conformally depositing the silicon carbide portion on a scalloped surface of the exposed silicon portion; and converting the silicon carbide portion immediately adjacent to the first cavity portion to graphene using the hydrogen bake further comprises converting the silicon carbide portion to a scalloped graphene portion. 5. The method of claim 2 , wherein: the hydrogen bake is conducted in an epitaxial reactor; and the second portion of the epitaxial polysilicon cap is deposited in the epitaxial reactor. 6. The method of claim 1 , wherein: providing the substrate comprises providing a silicon carbide layer on an insulator layer; and the silicon carbide portion is a portion of the silicon carbide layer. 7. The method of claim 6 , further comprising, prior to forming the first portion of the epitaxial polysilicon cap: deep reactive ion etching a trench completely through the silicon carbide layer to expose the silicon carbide portion; and filling the trench with a sacrificial oxide portion, wherein forming the first cavity portion above the substrate by vapor release through the at least one vent extending through the first portion of the epitaxial polysilicon cap further comprises: using a hydrofluoric acid vapor to re-expose the silicon carbide portion. 8. The method of claim 7 , wherein: converting the silicon carbide portion immediately adjacent to the first cavity portion to graphene using the hydrogen bake further comprises completely converting the silicon carbide layer to graphene. 9. The method of claim 8 wherein forming the first cavity portion further comprises releasing a segment of the silicon carbide layer. 10. The method of claim 8 , wherein: the hydrogen bake is conducted in an epitaxial reactor; and the second portion of the epitaxial polysilicon cap is deposited in the epitaxial reactor.
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