Area efficient flip-flop with improved scan hold-margin

Patent metadata

Field	Value
Publication number	US-10033359-B2
Application number	US-201514921341-A
Country	US
Kind code	B2
Filing date	Oct 23, 2015
Priority date	Oct 23, 2015
Publication date	Jul 24, 2018
Grant date	Jul 24, 2018

Abstract

A method and an apparatus for wireless communication are provided. The apparatus having a first latch having a first latch input and first latch output and a second latch having a second latch input, a second latch scan output, and a second latch data output. The second latch input is coupled to the first latch output. The apparatus further includes a selection component configured to select between a data input and a scan input based on a shift input. The selection component is coupled to the first latch input. The selection component includes a first NAND-gate, a second NAND-gate, and an OR-gate.

First claim

What is claimed is:

1. An apparatus, comprising:
a first latch having a first latch input and first latch output, the first latch including a first latch transmission gate, a first latch inverter, and a first latch clocked inverter, the first latch transmission gate coupled directly to the first latch inverter;
a second latch having a second latch input, a second latch scan output, and a second latch data output, the second latch input having a direct logical connection to the first latch output, the second latch comprising:
a first transmission gate coupled between the second latch input and a first node,
a first inverter coupled between the first node and a second node,
a second inverter coupled between the second node and the second latch scan output, and
a second transmission gate coupled between the second latch scan output and the first node;

a selection component configured to select between a data input and a scan input based on a shift input, the selection component comprising:
a first NAND-gate having a first-NAND-gate first input, a first-NAND-gate second input, and a first-NAND-gate output, the first-NAND-gate output being configured to be coupled to the first latch input, the first-NAND-gate first input being configured to receive the data input and the shift input;
a second NAND-gate having a second-NAND-gate first input, a second-NAND-gate second input, and a second-NAND-gate output, the second-NAND-gate output being coupled to the first-NAND-gate second input, the second-NAND-gate first input being coupled to the shift input, the second-NAND-gate second input being configured to receive the scan input; and
an OR-gate having an OR-gate first input, an OR-gate second input, and an OR-gate output, the OR-gate output being coupled to the first-NAND-gate first input, the OR-gate first input being coupled to the data input, the OR-gate second input being coupled to the shift input; and
an inverter having an inverter input and an inverter output, the inverter input being coupled to the scan input, the inverter output being coupled to the second-NAND-gate second input,
wherein the direct logical connection comprises a direct logical connection between the first latch inverter and the first transmission gate of the second latch, and wherein the second NAND-gate comprises one p-type MOS (pMOS) transistor coupled to the shift input, a set of pMOS transistors coupled to the scan input, one n-type MOS (nMOS) transistor coupled to the shift input, and a set of nMOS transistors coupled to the scan input, wherein the set of pMOS transistors coupled to the scan input is stacked in series, and the set of nMOS transistors coupled to the scan input is stacked in series, and wherein the one pMOS transistor coupled to the shift input is unstacked and the one nMOS transistor coupled to the shift input is unstacked.

2. The apparatus of claim 1 , wherein the second latch further comprises a third inverter coupled between the second node and the second latch data output.

3. A method of a flip-flop circuit, comprising:
selecting an input to a first latch, the first latch having a first latch input, the input being selected from a data input and a scan input based on a shift input, the selecting being performed by a selection component, the selection component being coupled to the first latch input, and the selection component comprising:
a first NAND-gate having a first-NAND-gate first input, a first-NAND-gate second input, and a first-NAND-gate output, the first-NAND-gate output being coupled to the first latch input, the first-NAND-gate first input being configured to receive the data input and the shift input;
a second NAND-gate having a second-NAND-gate first input, a second-NAND-gate second input, and a second-NAND-gate output, the second-NAND-gate output being coupled to the first-NAND-gate second input, the second-NAND-gate first input being coupled to the shift input, the second-NAND-gate second input being configured to receive the scan input, wherein the second NAND-gate comprises one p-type MOS (pMOS) transistor coupled to the shift input, a set of pMOS transistors coupled to the scan input, one n-type MOS (nMOS) transistor coupled to the shift input, and a set of nMOS transistors coupled to the scan input, wherein the set of pMOS transistors coupled to the scan input is stacked in series, and the set of nMOS transistors coupled to the scan input is stacked in series, and wherein the one pMOS transistor coupled to the shift input is unstacked and the one nMOS transistor coupled to the shift input is unstacked; and
an OR-gate having an OR-gate first input, an OR-gate second input, and an OR-gate output, the OR-gate output being coupled to the first-NAND-gate first input, the OR-gate first input being coupled to the data input, the OR-gate second input being coupled to the shift input;

storing the selected input in the first latch, the first latch having a first latch output, the first latch including a first latch transmission gate, a first latch inverter, and a first latch clocked inverter, the first latch transmission gate coupled directly to the first latch inverter;
inverting the scan input before logically combining the shift input and the scan input in the first NAND-gate; and
storing the first latch output in a second latch having a direct logical connection to the first latch, the second latch having a second latch input, a second latch scan output, and a second latch data output, the second latch input being coupled to the first latch output, the second latch comprises:
a first transmission gate coupled between the second latch input and a first node; a first inverter coupled between the first node and a second node;
a second inverter coupled between the second node and the second latch scan output; and
a second transmission gate coupled between the second latch scan output and the first node,

wherein the selecting comprises:
logically combining the shift input and the scan input in the first NAND-gate to generate a first intermediate signal;
logically combining the shift input and the data input in the OR-gate to generate a second intermediate signal; and
logically combining the first intermediate signal and the second intermediate signal in the second NAND-gate to generate the selected input,

wherein the direct logical connection comprises a direct logical connection between the first latch inverter and the first transmission gate of the second latch.

4. The method of claim 3 , wherein the inverting is performed by an inverter having an inverter input and an inverter output, the inverter input being coupled to the scan input, the inverter output being coupled to the second-NAND-gate second input.

5. The method of claim 3 , wherein the second latch further comprises a third inverter coupled between the second node and the second latch data output.

6. An apparatus comprising:
means for selecting an input to a first latch, the first latch having a first latch input, the input being selected from a data input and a scan input based on a shift input;
means for storing the selected input in the first latch, the first latch having a first latch output, the first latch including a first latch transmission gate, a first latch inverter, and a first latch clocked inverter, the first latch transmission gate coupled directly to the first latch inverter; and
means for storing the first latch output in a second latch having a direct logical connection to the first latch, the second latch having a second latch input, a second latch scan output, and a second latch data output, the second latch comprising:
a first transmission gate coupled between the second latch input and a first node,
a first inverter coupled between the first node and a second node,
a second inverter c

Assignees

• Qualcomm Inc

Inventors

• Ye Qi
• Datta Animesh

Classifications

• H03K3/35625

  using complementary field-effect transistors · CPC title

• H03K3/0375 Primary

  provided with means for increasing reliability; for protection; for ensuring a predetermined initial state when the supply voltage has been applied; for storing the actual state when the supply voltage fails (digital storage cells each combining volatile and non-volatile storage properties G11C14/00) · CPC title

• H03K3/037

  Bistable circuits · CPC title

• H03K3/356113 Primary

  using additional transistors in the input circuit · CPC title