Low resistance vertical cavity light source with PNPN blocking

US10033156B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10033156-B2
Application numberUS-201715648260-A
CountryUS
Kind codeB2
Filing dateJul 12, 2017
Priority dateJul 13, 2016
Publication dateJul 24, 2018
Grant dateJul 24, 2018

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A semiconductor vertical light source includes an upper mirror and a lower mirror. An active region is between the upper and lower mirror. The light source includes an inner mode confinement region and outer current blocking region. The outer current blocking region includes a common epitaxial layer that includes an epitaxially regrown interface which is between the active region and upper mirror, and a conducting channel including acceptors is in the inner mode confinement region. The current blocking region includes a first impurity doped region with donors between the epitaxially regrown interface and active region, and a second impurity doped region with acceptors is between the first doped region and lower mirror. The outer current blocking region provides a PNPN current blocking region that includes the upper mirror or a p-type layer, first doped region, second doped region, and lower mirror or an n-type layer.

First claim

Opening claim text (preview).

The invention claimed is: 1. A semiconductor vertical resonant cavity light source, comprising: an upper p-type mirror and a lower n-type mirror; an active region for light generation between said upper mirror and said lower mirror; said light source including an inner mode confinement region and an outer current blocking region; said outer current blocking region comprising a common epitaxial layer that includes an epitaxially regrown interface extending over said inner mode confinement region and over said outer current blocking region which is between said active region and said upper mirror, a conducting channel comprising acceptor impurities in said inner mode confinement region; wherein said outer current blocking region provides a PNPN current blocking region comprising said upper mirror, a first impurity doped region comprising donor impurities between said epitaxially regrown interface and said active region, a second impurity doped region comprising acceptor impurities between said first impurity doped region and said lower mirror, and said lower mirror. 2. The light source of claim 1 , further comprising at least one cavity spacer layer between said upper mirror and said active region. 3. The light source of claim 2 , wherein said conducting channel electrically contacts said cavity spacer layer. 4. The light source of claim 2 , wherein said conducting channel extends into said cavity spacer layer. 5. The light source of claim 1 , wherein said conducting channel extends into said active region. 6. The light source of claim 1 , wherein said common epitaxial layer comprises a distributed Bragg reflector (DBR) layer. 7. The light source of claim 1 , wherein said lower mirror includes an acceptor doped region. 8. The vertical cavity light source of claim 1 , wherein said light source comprises a vertical-cavity surface-emitting laser (VCSEL). 9. The light source of claim 1 , wherein said second impurity region is included in at least part of said active region. 10. A semiconductor vertical resonant cavity light source, comprising: an upper mirror and a lower mirror; an active region for light generation between said upper mirror and said lower mirror; said light source including an inner mode confinement region and an outer current blocking region; said outer current blocking region comprising a common epitaxial layer that includes an epitaxially regrown interface extending over said inner mode confinement region and over said outer current blocking region which is between said active region and said upper mirror; an upper p-type layer above said epitaxially regrown interface; a lower n-type layer below said active region; a conducting channel comprising acceptor impurities in said inner mode confinement region; wherein said outer current blocking region provides a PNPN current blocking region comprising said upper p-type layer, a first impurity doped region comprising donor impurities between said epitaxially regrown interface and said active region, a second impurity doped region comprising acceptor impurities between said first impurity doped region and said lower n-type layer below said active region, and said lower n-type layer. 11. The light source of claim 10 , further comprising at least one cavity spacer layer between said upper mirror and said active region. 12. The light source of claim 11 , wherein said conducting channel electrically contacts said cavity spacer layer. 13. The light source of claim 11 , wherein said conducting channel extends into said cavity spacer layer. 14. The light source of claim 10 , wherein said conducting channel extends into said active region. 15. The light source of claim 11 , wherein said common epitaxial layer comprises a distributed Bragg reflector (DBR) layer. 16. The light source of claim 11 , wherein said lower mirror includes an acceptor doped region. 17. The light source of claim 10 , wherein said light source comprises a vertical-cavity surface-emitting laser (VCSEL). 18. The light source of claim 10 , wherein said second impurity region is included in at least part of said active region. 19. The light source of claim 1 , further comprising a substrate comprising GaAs, GaN or InP that said light source is formed on. 20. The light source of claim 10 , further comprising a substrate comprising GaAs, GaN or InP that said light source is formed on.

Assignees

Inventors

Classifications

  • containing spacer layers to adjust the phase of the light wave in the cavity · CPC title

  • Single transverse or lateral mode · CPC title

  • AIIIBV compounds · CPC title

  • having a special structure for lateral current or light confinement · CPC title

  • characterised by the doping materials used in the laser structure · CPC title

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What does patent US10033156B2 cover?
A semiconductor vertical light source includes an upper mirror and a lower mirror. An active region is between the upper and lower mirror. The light source includes an inner mode confinement region and outer current blocking region. The outer current blocking region includes a common epitaxial layer that includes an epitaxially regrown interface which is between the active region and upper mirr…
Who is the assignee on this patent?
Univ Central Florida Res Found Inc, Sdphotonics Llc
What technology area does this patent fall under?
Primary CPC classification H01S5/18308. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Jul 24 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).