Removable test and diagnostics circuit
US-2017185123-A1 · Jun 29, 2017 · US
US10025508B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10025508-B2 |
| Application number | US-201514957180-A |
| Country | US |
| Kind code | B2 |
| Filing date | Dec 2, 2015 |
| Priority date | Dec 2, 2015 |
| Publication date | Jul 17, 2018 |
| Grant date | Jul 17, 2018 |
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An endurance parameter value of a non-volatile memory included in a non-volatile dual in-line memory module (NVDIMM) can be monitored and compared against a warning threshold value. In response to the endurance parameter exceeding the warning threshold value, a system alert can be generated, within a host system of the NVDIMM, to inform a system user that the NVDIMM is approaching its end-of-life. If the endurance parameter exceeds a replacement threshold value greater than the warning threshold value, an upgrade process can be initiated. The upgrade process can include copying data from the first non-volatile memory to a volatile memory of the NVDIMM and copying, in response to the first non-volatile memory being replaced with a second non-volatile memory, the data from the volatile memory to the second non-volatile memory.
Opening claim text (preview).
What is claimed is: 1. A non-volatile dual in-line memory module (NVDIMM), the NVDIMM comprising: a volatile memory card including: a first connector on a first edge; a first socket on a second edge located opposite to the first edge; a light-emitting diode (LED); at least one volatile memory chip; and a memory controller chip configured to: monitor a count of program-erase (P/E) cycles applied to an at least one non-volatile memory chip; illuminate, in response to the count of P/E cycles being less than a warning threshold, the LED to a green color; illuminate, in response to the count of P/E cycles exceeding the warning threshold, the LED to a yellow color; and initiate, in response to the count of P/E cycles exceeding a replacement threshold greater than the warning threshold, a non-volatile memory card upgrade process that includes illuminating the LED to a red color; and a non-volatile memory card including: a second connector on a third edge; and the at least one non-volatile memory chip; wherein the second connector of the non-volatile memory card is configured to plug into the first socket of the volatile memory card and the first connector of the volatile memory card is configured to plug into a second socket mounted on a printed circuit board (PCB). 2. The NVDIMM of claim 1 , wherein the non-volatile memory card upgrade process further includes: copying data from the non-volatile memory card to the at least one volatile memory chip; and copying, in response to the non-volatile memory card being replaced with a secondary non-volatile memory card, data from the at least one volatile memory chip to the secondary non-volatile memory card. 3. The NVDIMM of claim 1 , wherein the endurance parameter value is a failure indicator of the at least one non-volatile memory chip. 4. The NVDIMM of claim 1 , wherein the warning threshold and the replacement threshold can be modified by a host system containing the NVDIMM. 5. The NVDIMM of claim 1 , wherein the host system includes a light pipe configured to transmit light from the LED to an exterior surface of the host system, the exterior surface being visible to a service technician.
Vertical data movement, i.e. input-output transfer; data movement between one or more hosts and one or more storage devices · CPC title
Improving I/O performance · CPC title
Arrangements for evaluating degradation, retention or wearout, e.g. by counting erase cycles · CPC title
Supports for storage elements {, e.g. memory modules}; Mounting or fixing of storage elements on such supports · CPC title
Non-volatile semiconductor memory arrays · CPC title
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