Probe and contact inspection device

Patent metadata

Field	Value
Publication number	US-10024908-B2
Application number	US-201514945655-A
Country	US
Kind code	B2
Filing date	Nov 19, 2015
Priority date	Nov 26, 2014
Publication date	Jul 17, 2018
Grant date	Jul 17, 2018

Abstract

A probe comprises a first end that contacts and separates from a test object and a second end that contacts a circuit board to perform inspection of the test object. The second end is provided with a rotation restricted portion that restricts rotation of the probe about the axial direction thereof. An extendable portion, which is freely extendable and contractible in the axial direction of the probe and has at least one spiral slit, is provided between the first end and the second end. The second end is formed by a tubular member. Also, at least two of the extendable portions are provided between the first end and the second end, and an intermediate portion is formed between the extendable portions.

First claim

The invention claimed is:

1. A probe comprising:
a first end that contacts and separates from a test object; and
a second end that contacts a circuit board to perform inspection of the test object and is formed by a tubular member, wherein
the second end has a rotation restricted portion that restricts rotation of the probe about the axial direction thereof,
the rotation restricted portion is formed along with an outer periphery of the tubular member so as not to protrude in a radial direction of the probe from the outer periphery of the tubular member, and
the rotation restricted portion is formed by forming the second end of the tubular member into a polygonal shape.

2. The probe according to claim 1 , wherein
an extendable portion, which is freely extendable and contractible in the axial direction of the probe and having at least one spiral slit, is provided between the first end and the second end.

3. The probe according to claim 2 , wherein
at least two of the extendable portions are provided between the first end and the second end, and
an intermediate portion is formed between the extendable portions.

4. The probe according to claim 1 , wherein
at least two of the extendable portions are provided between the first end and the second end, and
an intermediate portion is formed between the extendable portions.

5. The probe according to claim 1 , wherein
the rotation restricted portion is formed as a cutaway portion formed by cutting away a part of the second end.

6. The probe according to claim 2 , wherein
the rotation restricted portion is formed as a cutaway portion formed by cutting away a part of the second end.

7. The probe according to claim 1 , further comprising:
a first contact portion that constitutes a first end of the probe; and
a second contact portion that constitutes a second end of the probe, wherein
the second contact portion makes a line contact with the circuit board.

8. The probe according to claim 2 , further comprising:
a first contact portion that constitutes a first end of the probe; and
a second contact portion that constitutes a second end of the probe, wherein
the second contact portion makes a line contact with the circuit board.

9. A contact inspection device that performs contact inspection of a test object, comprising:
plural probes each of which according to claim 1 ;
a circuit board that contacts the second end of the probe; and
a probe head through which the plural probes are inserted and which is detachably attached to the circuit board, wherein
a rotation restricting portion that engages with the rotation restricted portion of the probe is provided on the probe head on a side opposing the circuit board.

10. A contact inspection device that performs contact inspection of a test object, comprising:
plural probes each of which according to claim 2 ;
a circuit board that contacts the second end of the probe; and
a probe head through which the plural probes are inserted and which is detachably attached to the circuit board, wherein
a rotation restricting portion that engages with the rotation restricted portion of the probe is provided on the probe head on a side opposing the circuit board.

11. The probe according to claim 1 , wherein
the rotation restricted portion is formed as a cutaway portion formed by cutting away a part of the second end, and
the cutaway portion has a side surface extending in an axial direction of the probe and lower surface that faces to the circuit board and is formed along with an outer periphery of the tubular member.

12. The probe according to claim 11 , wherein the side surface is provided at a position different from the upper surface in the axial direction.

13. The probe according to claim 1 , wherein
the second end has a contact point portion that abuts the circuit board, and
the rotation restricted portion is provided axially adjacent to the contact point portion.

14. A probe comprising:
a first end that contacts and separates from a test object; and
a second end that contacts a circuit board to perform inspection of the test object and is formed by a tubular member, wherein
the second end has a rotation restricted portion that restricts rotation of the probe about the axial direction thereof,
the rotation restricted portion is formed along with an outer periphery of the tubular member so as not to protrude in a radial direction of the probe from the outer periphery of the tubular member, and
the rotation restricted portion is formed by forming the second end into a polygonal shape.

15. A probe comprising:
a first end that contacts and separates from a test object; and
a second end that contacts a circuit board to perform inspection of the test object and is formed by a tubular member, wherein
the second end has a rotation restricted portion that restricts rotation of the probe about the axial direction thereof,
the rotation restricted portion is formed along with an outer periphery of the tubular member so as not to protrude in a radial direction of the probe from the outer periphery of the tubular member,
the rotation restricted portion is formed as a cutaway portion formed by cutting away a part of the second end,
the cutaway portion has a side surface extending in an axial direction of the probe and an upper surface that faces to the circuit board and is formed along with an outer periphery of the tubular member, and
the side surface of the cutaway portion is configured to abut a side surface of a probe head through which the probe is inserted and which is detachably attached to the circuit board.

Assignees

• Nihon Micronics Kk

Inventors

• Ando Hiroyasu
• Nasu Mika

Classifications

• G01R1/06733

  Geometry aspects (G01R1/06727 takes precedence) · CPC title

• G01R1/06738

  related to tip portion · CPC title

• G01R1/073 Primary

  Multiple probes · CPC title

• G01R1/067

  Measuring probes · CPC title

• G01R1/06716

  Elastic · CPC title