Apparatus and process of electro-chemical plating

US10011918B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10011918-B2
Application numberUS-201414581876-A
CountryUS
Kind codeB2
Filing dateDec 23, 2014
Priority dateDec 23, 2014
Publication dateJul 3, 2018
Grant dateJul 3, 2018

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

An electro-chemical plating process begins with supplying a supercritical fluid into an electroplating solution to be deposited, and a bias is applied between a substrate and an electrode, which is located in the electroplating solution. The substrate is placed into the electroplating solution to deposit a material on the substrate.

First claim

Opening claim text (preview).

What is claimed is: 1. An electro-chemical plating (ECP) process, comprising: filtering a substance in a liquid state to remove impurities in the substance; pressurizing and heating the substance to form a supercritical fluid; supplying the supercritical fluid into an electroplating solution; applying a bias between a substrate and an electrode, wherein the electrode is located in the electroplating solution; and placing the substrate into the electroplating solution with the supercritical fluid to deposit a material on the substrate. 2. The ECP process of claim 1 , wherein the electroplating solution comprises a plurality of ions of the material. 3. The ECP process of claim 2 , wherein the bias promotes diffusion of the ions of the material towards the substrate, and the ions are reduced to form the material on the substrate. 4. The ECP process of claim 1 , wherein the substrate acts as a cathode, and the electrode acts as an anode during applying the bias between the substrate and the electrode. 5. The ECP process of claim 1 , wherein the substrate is placed into the electroplating solution substantially parallel to a surface of the electroplating solution. 6. The ECP process of claim 1 , wherein the supercritical fluid is a substance at a temperature and pressure above a critical point of the substance. 7. The ECP process of claim 6 , wherein the substance is selected from the group consisting of carbon dioxide, xenon, argon, helium, krypton, nitrogen, methane, ethane, propane, pentane, ethylene, methanol, ethanol, isopropanol, isobutanol, cyclohexanol, ammonia, nitrous oxide, oxygen, silicon hexafluoride, methyl fluoride, chlorotrifluoromethane, and water. 8. The ECP process of claim 1 , wherein the pressurizing and heating the substance to form the supercritical fluid comprises: heating the substance to a temperature above a critical temperature of the substance; and pressurizing the substance to a pressure above a critical pressure of the substance to transform the substance from the liquid state into a supercritical fluid state to form the supercritical fluid. 9. An electro-chemical plating (ECP) process, comprising: providing a substance in a liquid state filtering impurities in the substance; after filtering the impurities in the substance, transforming the substance to a supercritical fluid; mixing the supercritical fluid and an electroplating solution to form a mixture; submerging a substrate into the mixture; and electroplating the substrate to deposit a material on a surface of the substrate. 10. The ECP process of claim 9 , wherein the mixture comprises a plurality of ions of the material. 11. The ECP process of claim 9 , wherein the surface of the substrate is substantially parallel to an upper surface of the mixture when submerging the substrate into the mixture. 12. The ECP process of claim 9 , wherein the supercritical fluid is a substance at a temperature and a pressure above a critical point of the substance. 13. The ECP process of claim 12 , wherein the substance is selected from the group consisting of carbon dioxide, xenon, argon, helium, krypton, nitrogen, methane, ethane, propane, pentane, ethylene, methanol, ethanol, isopropanol, isobutanol, cyclohexanol, ammonia, nitrous oxide, oxygen, silicon hexafluoride, methyl fluoride, chlorotrifluoromethane, and water. 14. The ECP process of claim 9 , wherein the impurities are filtered with a filter, and the filter comprises activated carbon or aluminium oxide. 15. The ECP process of claim 9 , wherein transforming the substance to the supercritical fluid comprises: heating the substance to a temperature above a critical temperature of the substance; and pressurizing the substance to a pressure above a critical pressure of the substance to transform the substance from the liquid state into a supercritical fluid state to form the supercritical fluid. 16. The ECP process of claim 9 , wherein electroplating the substrate comprises: providing an electrode in the mixture; and providing a bias between the substrate and the electrode with a power supply electrically connected with the electrode and the substrate to form the material. 17. An electro-chemical plating (ECP) process, comprising: when a substance is in a liquid state, filtering impurities in the substance; after filtering the impurities, heating and pressurizing the substance to form a supercritical fluid; supplying the supercritical fluid into an electroplating solution to form a mixture; and electroplating a substrate using the mixture.

Assignees

Inventors

Classifications

  • Electroplating using gases, e.g. pressure influence · CPC title

  • Heating or cooling · CPC title

  • C25D21/06Primary

    Filtering {particles other than ions (filtering ions C25D21/22)} · CPC title

  • of electrolytes (C25D21/22 takes precedence) · CPC title

  • from solutions (C25D5/34 - C25D5/46 take precedence) · CPC title

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What does patent US10011918B2 cover?
An electro-chemical plating process begins with supplying a supercritical fluid into an electroplating solution to be deposited, and a bias is applied between a substrate and an electrode, which is located in the electroplating solution. The substrate is placed into the electroplating solution to deposit a material on the substrate.
Who is the assignee on this patent?
Taiwan Semiconductor Mfg Co Ltd
What technology area does this patent fall under?
Primary CPC classification C25D21/06. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Tue Jul 03 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).