Polythioaminals and Uses Thereof
US-2017049902-A1 · Feb 23, 2017 · US
US10006936B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10006936-B2 |
| Application number | US-201715601504-A |
| Country | US |
| Kind code | B2 |
| Filing date | May 22, 2017 |
| Priority date | Nov 30, 2015 |
| Publication date | Jun 26, 2018 |
| Grant date | Jun 26, 2018 |
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Methods and materials for patterning a substrate are disclosed herein. A poly(thioaminal) material may be utilized as a thermal resist material for patterning substrates in a thermal scanning probe lithography process. The poly(thioaminal) material may be functionalized with an electron withdrawing group and various monomers may be volatilized upon exposure to a thermal scanning probe.
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What is claimed is: 1. A method of patterning a substrate, comprising: forming a poly(thioaminal) material by either (a) ring opening of a hexahydrotriazine with a thiol, or (b) reacting a stabilized imine intermediate with a thiol; disposing the poly(thioaminal) material on a substrate; and patterning the poly(thioaminal) material with a thermal scanning probe. 2. The method of claim 1 , wherein the poly(thioaminal) material is disposed on the substrate by a spin coating process. 3. The method of claim 1 , wherein the thermal scanning probe contacts the poly(thioaminal) material during the patterning. 4. The method of claim 3 , wherein the thermal scanning probe is maintained at a temperature of greater than about 225° C. during the patterning. 5. The method of claim 4 , wherein monomers of the poly(thioaminal) material are volatilized upon contact with the thermal scanning probe. 6. The method of claim 5 , wherein the monomers are one or more of a dithiol, an electron deficient amine, or combinations and mixtures thereof. 7. The method of claim 1 , wherein a temperature difference between a bulk of the poly(thioaminal) material and the thermal scanning probe is greater than about 200° C. 8. The method of claim 1 , wherein the stabilized imine intermediate is synthesized from an electron deficient amine. 9. The method of claim 1 , further comprising: etching deprotected regions of the substrate after performing the patterning. 10. A method of patterning a substrate, comprising: forming a poly(thioaminal) material by either (a) ring opening of a hexahydrotriazine with a thiol, or (b) reacting a stabilized imine intermediate with a thiol, the poly(thioaminal) material having a CH 2 —N(R′)—CH 2 —S—R—S repeating group, wherein: each instance of R is selected from the group consisting of alkyl, aryl, and oligomer, and each instance of R′ is an electron withdrawing group selected from the group consisting of CnF n+1 , CnF n−1 , C 6 H 4 X, and heterocyclyl thereof, and wherein X is selected from the group consisting of Br, Cl, NO 2 CF 3 , F, CO 2 Me CO 2 H, CN, and combinations thereof; disposing the poly(thioaminal) material on a substrate; and patterning the poly(thioaminal) material with a thermal scanning probe. 11. The method of claim 10 , wherein each instance of R is an oligomer selected from the group consisting of ether, siloxane, styrene, carbonate, lactide, methacrylate, acrylate, polyolefin, polyester, polyamide, polyamino, and combinations thereof. 12. The method of claim 10 , wherein the thermal scanning probe is maintained at a temperature of greater than about 225° C. during the patterning. 13. The method of claim 12 , wherein a temperature difference between a bulk of the poly(thioaminal) material and the thermal scanning probe is greater than about 200° C. 14. The method of claim 10 , wherein dithiol monomers, electron deficient amines, and combinations thereof are volatilized from the poly(thioaminal) material during the patterning. 15. The method of claim 10 , further comprising: etching deprotected regions of the substrate after performing the patterning. 16. The method of claim 10 , wherein each instance of R is selected to tune a glass transition temperature of the poly(thioaminal) material. 17. The method of claim 10 , wherein each instance of R includes aromatic substituents, hydroxyl substituents, or combinations thereof. 18. The method of claim 10 , wherein each instance of R is wherein each W is independently hydrogen or an electron withdrawing group, and Z is selected from the group consisting of CH 2 and C(CF 3 ) 2 . 19. A method of patterning a substrate, comprising: forming a poly(thioaminal) material by either (a) ring opening of a hexahydrotriazine with a thiol, or (b) reacting a stabilized imine intermediate with a thiol, the poly(thioaminal) material having a S—CH 2 —NH—R—NH—CH 2 repeating group, wherein each instance of R is selected from the group consisting of alkyl, aryl, and oligomer; disposing the poly(thioaminal) material on a substrate; and patterning the poly(thioaminal) material with a thermal scanning probe. 20. The method of claim 19 , wherein each instance of R is selected from the group consisting of siloxane, styrene, carbonate, lactide, methacrylate, acrylate, polyamide, polyamino, and combinations thereof, wherein each W is independently hydrogen or an electron withdrawing group, and Z is selected from the group consisting of CH 2 and C(CF 3 ) 2 .
Applications, other than SPM, of scanning-probe techniques (manufacture or treatment of nanostructures B82B3/00; recording or reproducing information using near-field interaction G11B9/12, G11B11/24, G11B13/08) · CPC title
Polyamines containing sulfur in the main chain · CPC title
Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping · CPC title
Macromolecular compounds obtained by reactions forming a linkage containing sulfur with or without nitrogen, oxygen, or carbon in the main chain of the macromolecule · CPC title
of aldehydes · CPC title
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