Operating method of electronic device including processor executing semiconductor layout simulation module based on machine learning
US-12597119-B2 · Apr 7, 2026 · US
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Yang Jaewon patents
Yang Jaewon is listed as an inventor on 33 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Yang Jaewon |
| Total patents | 33 |
| First publication | May 28, 2020 |
| Latest publication | Apr 7, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Lithography model generating method based on deep learning, and mask manufacturing method including the lithography model generating method
US-12572129-B2 · Mar 10, 2026 · US
Method of training semiconductor process image generator
US-12561958-B2 · Feb 24, 2026 · US
Electronic device supporting manufacture of semiconductor device and operating method of electronic device
US-12469195-B2 · Nov 11, 2025 · US
Method of correcting an error of a layout of a pattern and method of forming a pattern using the same
US-2025328072-A1 · Oct 23, 2025 · US
Detection method of weak point and verification method of mask quality
US-2025321478-A1 · Oct 16, 2025 · US
Pattern modeling system and pattern modeling method
US-2025299298-A1 · Sep 25, 2025 · US
Electronic device and method of operation thereof
US-2025244681-A1 · Jul 31, 2025 · US
Crossbar array apparatuses based on compressed-truncated singular value decomposition (c- tsvd) and analog multiply-accumulate (mac) operation methods using the same
US-2025165767-A1 · May 22, 2025 · US
Cooking apparatus
US-2025164117-A1 · May 22, 2025 · US
Recent patents
Latest publications not already listed above.
Mask layout design method and mask manufacturing method comprising the design method
US-2025165693-A1 · May 22, 2025 · US
Cooking apparatus
US-2025155130-A1 · May 15, 2025 · US
Computing device for predicting a profile using deep learning and operating method thereof
US-12299869-B2 · May 13, 2025 · US
Substrate inspection apparatus and method of inspecting a substrate using the same
US-2025147096-A1 · May 8, 2025 · US
Semiconductor substrate inspection device
US-2025123243-A1 · Apr 17, 2025 · US
Cooking apparatus
US-2025116408-A1 · Apr 10, 2025 · US
Crossbar array apparatuses based on compressed-truncated singular value decomposition (C-TSVD) and analog multiply-accumulate (MAC) operation methods using the same
US-12229660-B2 · Feb 18, 2025 · US
Pattern inspection device and pattern inspection method
US-2024413024-A1 · Dec 12, 2024 · US
Electronic device supporting manufacture of semiconductor device and operating method of electronic device
US-2024386635-A1 · Nov 21, 2024 · US
Contour probability prediction method
US-2024303824-A1 · Sep 12, 2024 · US
Method and apparatus with semiconductor pattern correction
US-2024193415-A1 · Jun 13, 2024 · US
Method, apparatus, and system with resist image estimation
US-2024168372-A1 · May 23, 2024 · US
Lithography model generating method based on deep learning, and mask manufacturing method including the lithography model generating method
US-2023418260-A1 · Dec 28, 2023 · US
Corner rounding method of opc pattern based on deep learning, and opc method and mask manufacturing method including the corner rounding method
US-2023280646-A1 · Sep 7, 2023 · US
Operating method of electronic device including processor executing semiconductor layout simulation module based on machine learning
US-2023281792-A1 · Sep 7, 2023 · US
Computing device for predicting a profile using deep learning and operating method thereof
US-2023196545-A1 · Jun 22, 2023 · US
Image-based semiconductor device patterning method using deep neural network
US-2023197460-A1 · Jun 22, 2023 · US
Method of training semiconductor process image generator
US-2023177815-A1 · Jun 8, 2023 · US
Crossbar array apparatuses based on compressed-truncated singular value decomposition (c- tsvd) and analog multiply-accumulate (mac) operation methods using the same
US-2022108159-A1 · Apr 7, 2022 · US
Reticle fabrication method and semiconductor device fabrication method including the same
US-11294290-B2 · Apr 5, 2022 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Samsung Electronics Co Ltd | 30 |
| Lg Electronics Inc | 3 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G06N3/08 | 11 |
| G03F7/705 | 11 |
| G06T2207/30148 | 11 |
| G06T2207/20081 | 10 |
| G03F1/36 | 9 |