Method and apparatus of atomic force microscope based infrared spectroscopy with controlled probing depth
US-11215637-B2 · Jan 4, 2022 · US
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Yang Honghua patents
Yang Honghua is listed as an inventor on 5 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Yang Honghua |
| Total patents | 5 |
| First publication | Sep 25, 2018 |
| Latest publication | Jan 4, 2022 |
Notable patents
Publications ranked by popularity score, then publication date.
Method And Apparatus Of Atomic Force Microscope Based Infrared Spectroscopy With Controlled Probing Depth
US-2021011053-A1 · Jan 14, 2021 · US
Method and apparatus for infrared scanning near-field optical microscopy based on photothermal effect
US-10473693-B2 · Nov 12, 2019 · US
Method and apparatus for infrared scattering scanning near-field optical microscopy with background suppression
US-10228389-B2 · Mar 12, 2019 · US
Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy
US-10082523-B2 · Sep 25, 2018 · US
Recent patents
Latest publications not already listed above.
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Bruker Nano Inc | 5 |
| Anasys Instr | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01N21/39 | 4 |
| G01Q30/02 | 4 |
| G01N21/35 | 4 |
| G01N2201/0697 | 2 |
| G01Q60/32 | 2 |