Generation of synthetic fault images of semiconductor specimens
US-2026094310-A1 · Apr 2, 2026 · US
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Yacoby Ran patents
Yacoby Ran is listed as an inventor on 23 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Yacoby Ran |
| Total patents | 23 |
| First publication | Jan 19, 2023 |
| Latest publication | Apr 2, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Machine learning based generation of synthetic fault images of semiconductor specimens
US-2026087612-A1 · Mar 26, 2026 · US
Augmented chemical mechanical planarization
US-2026082866-A1 · Mar 19, 2026 · US
Image augmentation for machine learning based defect examination
US-12573024-B2 · Mar 10, 2026 · US
Method of determining aberrations of a charged particle beam, method of determining cd information, corresponding generation of computational models, and corresponding systems
US-2026051029-A1 · Feb 19, 2026 · US
Combining physical modeling and machine learning
US-12547082-B2 · Feb 10, 2026 · US
Methods and systems enabling determination of a depth profile of a semiconductor specimen
US-2026024186-A1 · Jan 22, 2026 · US
Machine learning based yield prediction
US-12469124-B2 · Nov 11, 2025 · US
Machine and deep learning methods for spectra-based metrology and process control
US-2025334887-A1 · Oct 30, 2025 · US
Machine and deep learning methods for spectra-based metrology and process control
US-12321102-B2 · Jun 3, 2025 · US
Recent patents
Latest publications not already listed above.
Machine learning based defect examination for semiconductor specimens
US-2024428396-A1 · Dec 26, 2024 · US
Machine and deep learning methods for spectra-based metrology and process control
US-2024310737-A1 · Sep 19, 2024 · US
Optimal determination of an overlay target using machine learning
US-2024289940-A1 · Aug 29, 2024 · US
Machine learning based yield prediction
US-2024281958-A1 · Aug 22, 2024 · US
Image augmentation for machine learning based defect examination
US-2024095903-A1 · Mar 21, 2024 · US
Self-supervised representation learning for interpretation of ocd data
US-2024069445-A1 · Feb 29, 2024 · US
System and method for controlling measurements of sample's parameters
US-11874606-B2 · Jan 16, 2024 · US
Machine and deep learning methods for spectra-based metrology and process control
US-11815819-B2 · Nov 14, 2023 · US
Self-supervised representation learning for interpretation of OCD data
US-11747740-B2 · Sep 5, 2023 · US
System and method for controlling measurements of sample's parameters
US-2023185203-A1 · Jun 15, 2023 · US
Machine and deep learning methods for spectra-based metrology and process control
US-2023124431-A1 · Apr 20, 2023 · US
Combining physical modeling and macine learning
US-2023023634-A1 · Jan 26, 2023 · US
Self-supervised representation learning for interpretation of ocd data
US-2023014976-A1 · Jan 19, 2023 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Nova Ltd | 12 |
| Applied Materials Israel Ltd | 10 |
| Ict Integrated Circuit Testing Ges Fuer Halbleiterprueftechnik Mbh | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G03F7/70508 | 12 |
| G01N21/956 | 12 |
| G01N21/9501 | 10 |
| G06T2207/30148 | 10 |
| H10P74/23 | 10 |