Integrated circuit defect detection and repair
US-9922725-B2 · Mar 20, 2018 · US
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Wan Ifar patents
Wan Ifar is listed as an inventor on 5 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Wan Ifar |
| Total patents | 5 |
| First publication | Jul 2, 2015 |
| Latest publication | Mar 20, 2018 |
Notable patents
Publications ranked by popularity score, then publication date.
Integrated circuit defect detection and repair
US-2017084351-A1 · Mar 23, 2017 · US
Integrated circuit defect detection and repair
US-9564245-B2 · Feb 7, 2017 · US
Integrated circuit defect detection and repair
US-9548137-B2 · Jan 17, 2017 · US
Integrated circuit defect detection and repair
US-2015187436-A1 · Jul 2, 2015 · US
Recent patents
Latest publications not already listed above.
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Intel Corp | 5 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G11C29/4401 | 5 |
| G11C29/72 | 5 |
| G11C2029/4402 | 5 |
| G06F11/263 | 5 |
| G06F11/27 | 5 |