System and method for optical wafer characterization with image up-sampling
US-12524867-B2 · Jan 13, 2026 · US
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Virk Kuljit patents
Virk Kuljit is listed as an inventor on 5 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Virk Kuljit |
| Total patents | 5 |
| First publication | Nov 29, 2018 |
| Latest publication | Jan 13, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
System and method for optical wafer characterization with image up-sampling
US-2022383470-A1 · Dec 1, 2022 · US
Defect inspection and review using transmissive current image of charged particle beam system
US-11410830-B1 · Aug 9, 2022 · US
Apparatus and methods for measuring phase and amplitude of light through a layer
US-11131629-B2 · Sep 28, 2021 · US
Apparatus and methods for measuring phase and amplitude of light through a layer
US-2018340886-A1 · Nov 29, 2018 · US
Recent patents
Latest publications not already listed above.
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Kla Corp | 3 |
| Kla Tencor Corp | 3 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10P74/203 | 5 |
| G06T2207/30148 | 2 |
| G06T7/001 | 2 |
| G06T2207/20056 | 2 |
| G06T2207/20182 | 2 |