Defect inspection device and defect inspection method
US-10228332-B2 · Mar 12, 2019 · US
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Ueno Taketo patents
Ueno Taketo is listed as an inventor on 11 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Ueno Taketo |
| Total patents | 11 |
| First publication | Mar 3, 2015 |
| Latest publication | Mar 12, 2019 |
Notable patents
Publications ranked by popularity score, then publication date.
Method and device for detecting defects and method and device for observing defects
US-9683946-B2 · Jun 20, 2017 · US
Defect Inspection Device and Defect Inspection Method
US-2017146463-A1 · May 25, 2017 · US
Defect inspection apparatus and defect inspection method
US-9588055-B2 · Mar 7, 2017 · US
Method and apparatus for inspecting defect
US-9535013-B2 · Jan 3, 2017 · US
Defect inspection method and device thereof
US-9255793-B2 · Feb 9, 2016 · US
Optical filtering device, defect inspection method and apparatus therefor
US-9182592-B2 · Nov 10, 2015 · US
Method and device for detecting defects and method and device for observing defects
US-2015276622-A1 · Oct 1, 2015 · US
Defect inspection device and defect inspection method
US-9019492-B2 · Apr 28, 2015 · US
Defect inspection apparatus and defect inspection method
US-2015062581-A1 · Mar 5, 2015 · US
Recent patents
Latest publications not already listed above.
Defect inspecting apparatus and defect inspecting method
US-8970836-B2 · Mar 3, 2015 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Hitachi High Tech Corp | 10 |
| Ueno Taketo | 5 |
| Taniguchi Atsushi | 5 |
| Shibata Yukihiro | 3 |
| Honda Toshifumi | 3 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01N21/9501 | 10 |
| G01N21/956 | 8 |
| G01N2021/8848 | 4 |
| G01N21/21 | 3 |
| G01B11/303 | 2 |