Evaluating a gate-source leakage current in a transistor device
US-10451669-B2 · Oct 22, 2019 · US
This page is not indexed by search engines while we improve data quality.
Theil Aron patents
Theil Aron is listed as an inventor on 4 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Theil Aron |
| Total patents | 4 |
| First publication | Jan 14, 2016 |
| Latest publication | Oct 22, 2019 |
Notable patents
Publications ranked by popularity score, then publication date.
Evaluating a gate-source leakage current in a transistor device
US-2019101585-A1 · Apr 4, 2019 · US
Testing device and a circuit arrangement
US-9488674-B2 · Nov 8, 2016 · US
Testing device and a circuit arrangement
US-2016011232-A1 · Jan 14, 2016 · US
Recent patents
Latest publications not already listed above.
No data yet.
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Infineon Technologies Ag | 4 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01R31/50 | 2 |
| G01R31/2608 | 2 |
| G01R31/2621 | 2 |
| G01R31/2601 | 2 |
| G01R19/10 | 2 |