System, device and method of controlling emission current of electron microscope
US-2026058091-A1 · Feb 26, 2026 · US
This page is not indexed by search engines while we improve data quality.
Sun Jongcheon patents
Sun Jongcheon is listed as an inventor on 8 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Sun Jongcheon |
| Total patents | 8 |
| First publication | May 30, 2024 |
| Latest publication | Feb 26, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Pattern inspection system and method of pattern inspection using the same
US-2026031301-A1 · Jan 29, 2026 · US
Semiconductor device inspection method
US-2026026311-A1 · Jan 22, 2026 · US
Wafer inspection method
US-2025231121-A1 · Jul 17, 2025 · US
Substrate inspection apparatus and substrate inspection method
US-12352808-B2 · Jul 8, 2025 · US
Scanning electron microscope device
US-2025218721-A1 · Jul 3, 2025 · US
Method of generating defect classification model
US-2025037486-A1 · Jan 30, 2025 · US
Substrate inspection apparatus and substrate inspection method
US-2024175915-A1 · May 30, 2024 · US
Recent patents
Latest publications not already listed above.
No data yet.
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Samsung Electronics Co Ltd | 8 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J37/28 | 3 |
| G01N2223/6462 | 2 |
| G01N2223/6116 | 2 |
| G01N2223/418 | 2 |
| G01N23/2251 | 2 |