Sample preparation method and apparatus
US-12529629-B2 · Jan 20, 2026 · US
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Statham Peter patents
Statham Peter is listed as an inventor on 13 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Statham Peter |
| Total patents | 13 |
| First publication | Jul 10, 2018 |
| Latest publication | Jan 20, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Method of obtaining a modified image of a specimen
US-2025314603-A1 · Oct 9, 2025 · US
Electron Filter
US-2025087449-A1 · Mar 13, 2025 · US
Improved navigation for electron microscopy
US-2024339293-A1 · Oct 10, 2024 · US
Sample preparation method and apparatus
US-2023273136-A1 · Aug 31, 2023 · US
Material analysis with multiple detectors
US-2023258587-A1 · Aug 17, 2023 · US
Navigation for electron microscopy
US-11688582-B2 · Jun 27, 2023 · US
Improved camera for electron diffraction pattern analysis
US-2023175991-A1 · Jun 8, 2023 · US
System for electron diffraction analysis
US-11195692-B2 · Dec 7, 2021 · US
Navigation for electron microscopy
US-2021151287-A1 · May 20, 2021 · US
Recent patents
Latest publications not already listed above.
Improved system for electron diffraction analysis
US-2020273663-A1 · Aug 27, 2020 · US
Method for measuring the mass thickness of a target sample for electron microscopy
US-10054557-B2 · Aug 21, 2018 · US
Method of processing a particle spectrum
US-10018737-B2 · Jul 10, 2018 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Oxford Instruments Nanotechnology Tools Ltd | 13 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J37/244 | 8 |
| H01J37/28 | 6 |
| H01J2237/24495 | 5 |
| G01N23/2252 | 5 |
| H01J37/222 | 4 |