Semiconductor device manufacturing system, semiconductor device inspection device, and semiconductor device manufacturing method
US-12051629-B2 · Jul 30, 2024 · US
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Ryu Youngsu patents
Ryu Youngsu is listed as an inventor on 4 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Ryu Youngsu |
| Total patents | 4 |
| First publication | Mar 4, 2021 |
| Latest publication | Jul 30, 2024 |
Notable patents
Publications ranked by popularity score, then publication date.
Thickness estimation method and processing control method
US-11668558-B2 · Jun 6, 2023 · US
Thickness estimation method and processing control method
US-2022065618-A1 · Mar 3, 2022 · US
Semiconductor device manufacturing system, semiconductor device inspection device, and semiconductor device manufacturing method
US-2021066140-A1 · Mar 4, 2021 · US
Recent patents
Latest publications not already listed above.
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Samsung Electronics Co Ltd | 4 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01N21/8422 | 4 |
| G01N2021/8427 | 4 |
| H10P74/203 | 4 |
| G01B11/0625 | 2 |
| G01B2210/56 | 2 |