Terahertz plasmonics for testing very large-scale integrated circuits under bias
US-12360159-B2 · Jul 15, 2025 · US
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Reed Meredith patents
Reed Meredith is listed as an inventor on 6 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Reed Meredith |
| Total patents | 6 |
| First publication | Aug 23, 2018 |
| Latest publication | Jul 15, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Terahertz Plasmonics for Testing Very Large-Scale Integrated Circuits under Bias
US-2023393195-A1 · Dec 7, 2023 · US
Terahertz plasmonics for testing very large-scale integrated circuits under bias
US-11675002-B2 · Jun 13, 2023 · US
Terahertz Plasmonics for Testing Very Large-Scale Integrated Circuits under Bias
US-2022011363-A1 · Jan 13, 2022 · US
Terahertz plasmonics for testing very large-scale integrated circuits under bias
US-10890618-B2 · Jan 12, 2021 · US
Terahertz Plasmonics for Testing Very Large-Scale Integrated Circuits under Bias
US-2018238961-A1 · Aug 23, 2018 · US
Recent patents
Latest publications not already listed above.
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Us Gov Sec Army | 6 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01R31/2815 | 6 |
| G01R31/311 | 6 |
| G01R31/318533 | 6 |
| G01R31/2656 | 6 |