Wafer distortion measurement and overlay correction
US-2020018709-A1 · Jan 16, 2020 · US
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Preil Moshe patents
Preil Moshe is listed as an inventor on 5 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Preil Moshe |
| Total patents | 5 |
| First publication | Aug 25, 2016 |
| Latest publication | Jan 16, 2020 |
Notable patents
Publications ranked by popularity score, then publication date.
System, method and computer program product for systematic and stochastic characterization of pattern defects identified from a semiconductor wafer
US-10262408-B2 · Apr 16, 2019 · US
System, method and computer program product for systematic and stochastic characterization of pattern defects identified from a semiconductor wafer
US-2018300870-A1 · Oct 18, 2018 · US
Methods for fabricating integrated circuits using directed self-assembly including a substantially periodic array of topographical features that includes etch resistant topographical features for transferability control
US-9530662-B2 · Dec 27, 2016 · US
Methods for fabricating integrated circuits using directed self-assembly including a substantially periodic array of topographical features that includes etch resistant topographical features for transferability control
US-2016247686-A1 · Aug 25, 2016 · US
Recent patents
Latest publications not already listed above.
No data yet.
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Globalfoundries Inc | 3 |
| Kla Tencor Corp | 2 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01N21/9501 | 3 |
| H10P76/20 | 2 |
| H10P50/695 | 2 |
| H01L21/3086 | 2 |
| G03F7/0002 | 2 |