Systems and methods for wafer surface feature detection and quantification
US-9702829-B1 · Jul 11, 2017 · US
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Plemmons Mark patents
Plemmons Mark is listed as an inventor on 1 patent in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Plemmons Mark |
| Total patents | 1 |
| First publication | Jul 11, 2017 |
| Latest publication | Jul 11, 2017 |
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Kla Tencor Corp | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01N21/9501 | 1 |
| G01B11/303 | 1 |
| G01N21/956 | 1 |
| G01B11/30 | 1 |
| G01B11/306 | 1 |