Semiconductor device and electronic apparatus
US-2018331230-A1 · Nov 15, 2018 · US
for measuring evenness
for measuring evenness · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01B11/306 |
| Official title | {for measuring evenness} |
| Display label | for measuring evenness |
| Total patents | 266 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is declining.
| Year | Patents |
|---|---|
| 2015 | 18 |
| 2016 | 17 |
| 2017 | 23 |
| 2018 | 33 |
| 2019 | 25 |
| 2020 | 33 |
| 2021 | 26 |
| 2022 | 22 |
| 2023 | 21 |
| 2024 | 19 |
| 2025 | 20 |
| 2026 | 9 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Method and apparatus to determine slider-level flatness as provided on a full carrier
US-9995571-B1 · Jun 12, 2018 · US
Method and apparatus to monitor and control sheet characteristics on a creping process
US-9851199-B2 · Dec 26, 2017 · US
Edge registration for interferometry
US-2017363414-A1 · Dec 21, 2017 · US
Inspecting surfaces
US-2017352599-A1 · Dec 7, 2017 · US
Deformation detection tool and method for detecting deformation
US-9816806-B2 · Nov 14, 2017 · US
Automatic Analysis Device and Separation and Washing Method
US-2017312756-A1 · Nov 2, 2017 · US
Communication device
US-2017317825-A1 · Nov 2, 2017 · US
Evaluation method of road surface property, and evaluation device of road surface property
US-2017307369-A1 · Oct 26, 2017 · US
Coordinate measuring system
US-2017292827-A1 · Oct 12, 2017 · US
Pattern accuracy detecting apparatus and processing system
US-2017271214-A1 · Sep 21, 2017 · US
Dynamic Digital Fringe Projection Techniques For Measuring Warpage
US-2017254642-A1 · Sep 7, 2017 · US
Surface texture measuring apparatus and method
US-2017248416-A1 · Aug 31, 2017 · US
Backlight source flatness detection system and backlight source flatness detection method
US-2017234680-A1 · Aug 17, 2017 · US
Systems and methods for wafer surface feature detection and quantification
US-9702829-B1 · Jul 11, 2017 · US
Device for measuring undulation of brake disc in railway wheel with brake discs
US-9691642-B2 · Jun 27, 2017 · US
Determining the characteristics of a road surface by means of a 3D camera
US-9679204-B2 · Jun 13, 2017 · US
Device and method for checking windshield wiper blades
US-2017138865-A1 · May 18, 2017 · US
Method and device for detecting flatness of a fluorescent wheel in a laser light source
US-2017131205-A1 · May 11, 2017 · US
Digital Imaging For Determining Mix Ratio Of A Coating
US-2017132799-A1 · May 11, 2017 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01B11/306?
- CPC G01B11/306 is the Cooperative Patent Classification code for “for measuring evenness.”
- How many patents are filed under CPC G01B11/306 (for measuring evenness)?
- Our database includes 266 publications tagged with this CPC code.
- Is patent activity under CPC G01B11/306 growing?
- Publication counts under this code: 19 in 2024 vs 20 in 2025 (latest complete years).